首页 | 本学科首页   官方微博 | 高级检索  
文章检索
  按 检索   检索词:      
出版年份:   被引次数:   他引次数: 提示:输入*表示无穷大
  收费全文   6022篇
  免费   264篇
  国内免费   32篇
化学   4177篇
晶体学   19篇
力学   209篇
数学   1032篇
物理学   881篇
  2022年   33篇
  2021年   60篇
  2020年   65篇
  2019年   80篇
  2018年   88篇
  2017年   79篇
  2016年   155篇
  2015年   141篇
  2014年   172篇
  2013年   257篇
  2012年   330篇
  2011年   371篇
  2010年   235篇
  2009年   232篇
  2008年   331篇
  2007年   327篇
  2006年   334篇
  2005年   308篇
  2004年   266篇
  2003年   241篇
  2002年   286篇
  2001年   106篇
  2000年   102篇
  1999年   56篇
  1998年   58篇
  1997年   65篇
  1996年   76篇
  1995年   55篇
  1994年   67篇
  1993年   55篇
  1992年   54篇
  1991年   58篇
  1990年   49篇
  1989年   45篇
  1988年   41篇
  1987年   45篇
  1986年   40篇
  1985年   85篇
  1984年   83篇
  1983年   51篇
  1982年   86篇
  1981年   56篇
  1980年   78篇
  1979年   57篇
  1978年   77篇
  1977年   57篇
  1976年   56篇
  1975年   42篇
  1974年   44篇
  1973年   33篇
排序方式: 共有6318条查询结果,搜索用时 15 毫秒
31.
In typical stochastic simulations, randomness is produced by generating a sequence of independent uniform variates (usually real-valued between 0 and 1, or integer-valued in some interval) and transforming them in an appropriate way. In this paper, we examine practical ways of generating (deterministic approximations to) such uniform variates on a computer. We compare them in terms of ease of implementation, efficiency, theoretical support, and statistical robustness. We look in particular at several classes of generators, such as linear congruential, multiple recursive, digital multistep, Tausworthe, lagged-Fibonacci, generalized feedback shift register, matrix, linear congruential over fields of formal series, and combined generators, and show how all of them can be analyzed in terms of their lattice structure. We also mention other classes of generators, like non-linear generators, discuss other kinds of theoretical and empirical statistical tests, and give a bibliographic survey of recent papers on the subject.  相似文献   
32.
This paper introduces a definition of reliability based on a process range. Thus, process failure is defined when the range of a process first reaches a given and unacceptable level. The Mean Time To Failure (MTTF) which is denned as the mean of the first time for a range to attain a given amplitude is then calculated for an asymmetric random walk process. The probability distribution of the range is then given and the process reliability over long periods of system operations are then calculated. Applications such as the control of wings movements, stock price and exchange rates volatility (defined in terms of reliability) are also used to motivate the usefulness of range processes in reliability studies. Finally, we point out that there is necessarily a relationship between the range reliability and the propensity of a series to become chaotic.  相似文献   
33.
Summary A microwave coherent backscattering experiment has been carried out on Mirabelle, a weakly ionised plasma device, with the objective of measuring the electron density fluctuation level. The experiment is a preliminary step in order to prepare the detection system for a microwave stimulated backscattering experiment. The incident electromagnetic wave is focused in front of a plane grid which excites ion acoustic or electron Bernstein waves inducing fluctuations in the plasma. The backscattering signal is collected by the launching circuit and detected by homodyne mixing. The typical ratio of the scattered power to the incident power is about 10−12 and the relative density fluctuations are of the order of δn e/n e=10−3 against a background electron density ofn e=1–5·109 cm−3. The backscattering measurement is compared with Langmuir probe measurements. The spectral width of the backscattered signal has also been studied, by taking into account effects due to the incident wave focusing and plasma wave damping. The authors of this paper have agreed to not receive the proofs for correction  相似文献   
34.
The encapsulation of the nanocrystalline manganese‐doped zinc sulfide (ZnS:Mn) in poly(styrene‐b‐2vinylpyridine) (PS‐PVP) diblock copolymers is reported. Below the critical micelle concentration in the absence of nanocrystals (NCs), inverse micelles of PS‐PVP were induced by adding ZnS:Mn NCs, the presence of which was confirmed by scanning force microscope and dynamic light scattering. In toluene, a PS‐selective solvent, the less‐soluble PVP blocks preferentially surround the ligand‐coated ZnS:Mn NCs. For PS‐PVP encapsulated ZnS:Mn NCs, the ratio of blue emission to orange emission of ZnS:Mn NCs is dependent on both the concentration of PS‐PVP and the solvent quality. The pyridine of PVP blocks form complexes with the Zn atoms via the nitrogen lone pair and thus the sulfur vacancies are passivated. As a result, the defect‐related blue emission is selectively quenched even when the micelles are not formed. As the concentration of PS‐PVP encapsulating the ZnS:Mn NCs increases, the intensity of blue emission decreases. © 2006 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 44: 3227–3233, 2006  相似文献   
35.
We define nontempered (exponential growth) function spaces on the Lie group ax+b which are stable under some left-invariant (convergent) star product. The techniques used to achieved the latter come from symmetric spaces geometry and star representation theory.  相似文献   
36.
37.
38.
Photoirradiated in presence of acetophenone, benzo[b]selenophene and its 3-methyl derivative add to dimethyl acetylenedicarboxylate. In each ease, the primary reaction product is unstable and has not been isolated. Photoexeited in its triplet state (the energy of which is in the neighbourhood of 69 kcalmole) benzo[b]selenophene and its 2- and 3-methyl, 2,3 dimethyl, 3 acetoxy and 2-methyl-3-acetoxy derivatives add to 1,2 dichloroethylene leading to cyclobutanes. Neither cyclo-addition occurs in absence of photosensitiser. Single-crystal X-ray analysis gave the structures of the two adducts of 3-acetoxybenzo[b]selenophene with trans-1,2-dichloroethylene. In both compounds the chlorine atoms are trans.  相似文献   
39.
40.
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号