首页 | 本学科首页   官方微博 | 高级检索  
文章检索
  按 检索   检索词:      
出版年份:   被引次数:   他引次数: 提示:输入*表示无穷大
  收费全文   12104篇
  免费   495篇
  国内免费   82篇
化学   8518篇
晶体学   121篇
力学   363篇
数学   994篇
物理学   2685篇
  2023年   75篇
  2022年   245篇
  2021年   287篇
  2020年   225篇
  2019年   243篇
  2018年   206篇
  2017年   186篇
  2016年   397篇
  2015年   358篇
  2014年   466篇
  2013年   781篇
  2012年   1028篇
  2011年   1120篇
  2010年   642篇
  2009年   532篇
  2008年   827篇
  2007年   746篇
  2006年   667篇
  2005年   611篇
  2004年   515篇
  2003年   428篇
  2002年   440篇
  2001年   253篇
  2000年   206篇
  1999年   145篇
  1998年   78篇
  1997年   93篇
  1996年   104篇
  1995年   91篇
  1994年   84篇
  1993年   68篇
  1992年   64篇
  1991年   55篇
  1990年   57篇
  1989年   41篇
  1988年   30篇
  1987年   17篇
  1986年   15篇
  1985年   31篇
  1984年   22篇
  1983年   20篇
  1982年   21篇
  1981年   19篇
  1980年   12篇
  1979年   14篇
  1978年   16篇
  1977年   10篇
  1976年   14篇
  1975年   10篇
  1972年   9篇
排序方式: 共有10000条查询结果,搜索用时 9 毫秒
81.
We present a novel approach to generating radially and azimuthally polarized vector beams that utilize an interferometer constructed from two identical diffractive optical elements. The measured polarization properties of four vector beam states and their phase relationships are in good agreement with theoretical expectations. This interferometer is passively phase stable and robust, making it suitable for linear and nonlinear optical (superresolution) microscopy.  相似文献   
82.
We have investigated the optical properties of InAs self-assembled quantum dots (SAQDs) with the Si-doped GaAs barrier layer. Two types of samples are fabricated according to the position of the Si-doped GaAs layer. For type A samples the Si-doped GaAs layer is grown below the QDs, whereas for type B samples the Si-doped GaAs layer is grown above the QDs. For both types of samples the excited-state emissions caused by state filling are observed in photoluminescence (PL) spectra at high excitation power densities. The bandgap renormalization of QDs can be found from the shift of the PL peak energy. Particularly, for type A samples the Si atoms act as nucleation centers during the growth of InAs QDs on the Si-doped GaAs layer and affect the density and the size of the QDs. The Si-doped GaAs layer in type A samples has more effects on the properties of QDs, such as state filling and bandgap renormalization than those of type B samples.  相似文献   
83.
We investigate the effects of a thin AlAs layer with different position and thickness on the optical properties of InAs quantum dots (QDs) by using transmission electron microscopy and photoluminescence (PL). The energy level shift of InAs QD samples is observed by introducing the thin AlAs layer without any significant loss of the QD qualities. The emission peak from InAs QDs directly grown on the 4 monolayer (ML) AlAs layer is blueshifted from that of reference sample by 219 meV with a little increase in FWHM from 42–47 meV for ground state. In contrast, InAs QDs grown under the 4 ML AlAs layer have PL peak a little redshifted to lower energy by 17 meV. This result is related to the interdiffusion of Al atom at the InAs QDs caused by the annealing effect during growing of InAs QDs on AlAs layer.  相似文献   
84.
85.
86.
87.
88.
89.
90.
Laser welding is one of the most precise welding processes in joining sheet metals. In laser welding, performing real time evaluation of the welding quality is very important to enhance the efficiency of the welding process. In this study, the plasma and spatter, which are generated during laser welding, are measured using UV and IR photodiodes. The factors that influence weld quality are classified into five categories; optimal heat input, slightly low heat input, low heat input, partial joining due to gap mismatch, and nozzle deviation. The data number deviated from reference signals and their standard deviations were also considered to evaluate the qualities. A system was also formulated to perform real time evaluations of the weld quality using a fuzzy multi-feature pattern recognition with the measured signals.  相似文献   
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号