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701.
Techniques are described which combine the use of nuclear reactions and of backscattering to obtain analytical results which would be difficult or impossible to reach using one of these methods only. The principles of stoichiometry determination by plateau height analysis are developed both for backscattering and for narrow resonances of nuclear reactions. Examples of applications are given to the determination of the composition of various thin films of aluminium and silicon oxides, silicon nitrides and calcium fluorides. The analysis of samples smaller than the beam, using backscattered particle monitoring, is presented. Work supported by the C.N.R.S. (RCP No 157), the D.R.M.E. and the D.G.R.S.T.  相似文献   
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The accuracies of the approximation of the temperature integral of the Arrhenius law proposed by Coats and Redfern(CR), Doyle(D), Gyulai and Greenhow(GG), and MacCallum and Tanner(McT) have been tested. It has been demonstrated that these methods (only with the exception of the MacCallum and Tanner procedure) generally lead to accurate enough values of the activation energy of solid state reactions. The accuracy of these methods increases in the sequence: CC > D ? GG ? McT.  相似文献   
706.
707.

Competitive autonomous systems in have the remarkable property of verifying an analogue of the Poincaré-Bendixon theorem for planar equations. This fact allows us to prove the existence of orbitally stable closed orbits for those systems under easily checkable hypothesis. Our aim is to introduce, by changing the ordering in , a new class of autonomous systems for which the preceding results directly extend. As a consequence we shall reinterpret some of the results of R. A. Smith in terms of the theory of monotone systems.

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708.
Formation of defect states on semiconductor surfaces, at its interfaces with thin films and in semiconductor volumes is usually predetermined by such parameters as semiconductor growth process, surface treatment procedures, passivation, thin film growth kinetics, etc. This paper presents relation between processes leading to formation of defect states and their passivation in Si and GaAs related semiconductors and structures. Special focus is on oxidation kinetics of yttrium stabilized zirconium/SiO2/Si and Sm/GaAs structures. Plasma anodic oxidation of yttrium stabilized zirconium based structures reduced size of polycrystalline silicon blocks localised at thin film/Si interface. Samarium deposited before oxidation on GaAs surface led to elimination of EL2 and/or ELO defects in MOS structures. Consequently, results of successful passivation of deep traps of interface region by CN atomic group using HCN solutions on oxynitride/Si and double oxide layer/Si structures are presented and discussed. By our knowledge, we are presenting for the first time the utilization of X-ray reflectivity method for determination of both density of SiO2 based multilayer structure and corresponding roughnesses (interfaces and surfaces), respectively.  相似文献   
709.
Ab initio density-functional theory calculations, photoemission spectroscopy (PES), scanning tunneling microscopy, and spectroscopy (STM, STS) have been used to solve the 2sqrt[3]×2sqrt[3]R30 surface reconstruction observed previously by LEED on 0.5 ML K/Si:B. A large K-induced vertical lattice relaxation occurring only for 3/4 of Si adatoms is shown to quantitatively explain both the chemical shift of 1.14 eV and the ratio 1/3 measured on the two distinct B 1s core levels. A gap is observed between valence and conduction surface bands by ARPES and STS which is shown to have mainly a Si-B character. Finally, the calculated STM images agree with our experimental results. This work solves the controversy about the origin of the insulating ground state of alkali-metal/Si(111):B semiconducting interfaces which were believed previously to be related to many-body effects.  相似文献   
710.
β-aminoenones react with cyanamide, molar ratio 1:2, to yield 2-aminopyrimidines in nearly quantitative yields.  相似文献   
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