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21.
Gaponenko N. V. Sudnik L. V. Vityaz P. A. Luchаnok A. R. Stepikhova M. V. Yablonskiy A. N. Lashkovskaya E. I. Shustsikava K. V. Radyush Yu. V. Zhivulko V. D. Mudryi А. V. Kazuchits N. M. Rusetsky M. S. 《Journal of Applied Spectroscopy》2022,89(2):238-243
Journal of Applied Spectroscopy - Photo- and cathodoluminescence in the visible range from erbium-doped barium titanate xerogels obtained in the form of a powder and a target pressed from it by... 相似文献
22.
A. V. Mudryi A. I. Patuk V. M. Trukhan I. A. Shakin S. F. Marenkin 《Journal of Applied Spectroscopy》1998,65(1):155-159
An investigation is made of the low-temperature (4.2–78 K) photoluminescence of single crystals of cadmium diarsenide grown
from the gas phase and by the Bridgman method. Radiation near the fundamental absorption edge is detected, which is attributed
to annihilation of free excitons with simultaneous emission of phonons (the lines 1.0029 and 0.9840 eV at 4.2 K). The optical
width of the forbidden band is estimated at 4.2 K.
Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 65, No. 1, pp. 149–152, January–February, 1998. 相似文献
23.
F. P. Korshunov T. P. Larionova A. V. Mudryi A. I. Patuk I. A. Shakin 《Journal of Applied Spectroscopy》1999,66(3):410-414
Using low-temperature (4.2–78 K) photoluminescence, we study the processes of defect formation in silicon films on sapphire
irradiated with high-energy particles (electrons, γ-quanta of60Co). It is established that carbon atoms, as a residual process impurity, participate in the formation of luminescence centers
stable up to annealing temperatures of about 550 K. For carbon-containing centers we reveal a shift in the spectral lines
relative to their position in spectra of single-crystal silicon. It is proposed that this spectral shift is associated with
the presence of internal stresses of about 5·108 N/m2 in the silicon films.
Institute of Solid-State Physics and Semiconductors, National Academy of Sciences of Belarus, 17, P. Brovka Str., Minsk, 220072,
Belarus. Translated from Zhurnal Prikladnoi Spektroskefii, Vol. 66, No. 3, pp. 383–386, May–June, 1999. 相似文献
24.
25.
G. A. Gusakov N. M. Lapchuk A. V. Mudryi G. G. Fedoruk 《Journal of Applied Spectroscopy》2003,70(3):440-444
Optical and paramagnetic properties of synthetic diamond single crystals grown by the temperature gradient method in the Fe-Co-C and Fe-Co-Al-C systems using split-sphere high-pressure apparatus have been investigated. For crystals with a high (>5·1017 cm–3) nitrogen concentration a good agreement of the concentrations of single substitution nitrogen atoms obtained from EPR, IR, and UV measurements was observed. For crystals with a low ((0.5–5.0)·1017 cm–3) nitrogen concentration, there was no correlation between the results of substituting nitrogen concentrations obtained by the methods mentioned. It is shown that this behavior is attributable to the transition of the substituting nitrogen atoms from the paramagnetic neutral to nonparamagnetic positive charge state due to compensation by the boron impurity. 相似文献
26.
Sulimov M. A. Yakushev M. V. Forbes I. Prieto J. M. Mudryi A. V. Krustok Ju. Edwards P. R. Martin R. W. 《Physics of the Solid State》2019,61(5):908-917
Physics of the Solid State - Cu2ZnSnSe4 (CZTSe) is amongst leading candidates for the absorber layer in sustainable solar cells. We examine CZTSe thin films with [Cu]/[Zn + Sn] of 0.99 and... 相似文献
27.
28.
N. V. Gaponenko G. K. Malyarevich A. V. Mudryi O. B. Gusev M. V. Stepikhova M. Yu. Tsvetkov S. M. Kleshcheva M. I. Samoilovich A. P. Stupak 《Journal of Applied Spectroscopy》2007,74(5):687-691
We have studied the luminescence and luminescence excitation spectra of erbium in the 1.54 μm region in titanium oxide and
silicon oxide xerogels, formed in the mesoscopic pores of three-dimensional synthetic opals and two-dimensional porous aluminum
oxide structures. For erbium-doped titanium oxide films formed in opal, in contrast to analogous films on porous aluminum
oxide, in the luminescence excitation spectra we observe an intense broad band with a maximum in the ∼360 nm region. We discuss
the possible nature of this band.
__________
Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 74, No. 5, pp. 622–626, September–October, 2007. 相似文献
29.
30.
F. F. Komarov O. V. Mil’chanin L. A. Vlasukova W. Wesch A. F. Komarov A. V. Mudryi 《Bulletin of the Russian Academy of Sciences: Physics》2010,74(2):252-255
The formation of nanodimensional InAs crystallites on Si wafers was studied by the method of high-fluence implantation of
As and In ions with subsequent high-temperature treatment. It was found that the size and depth distributions of the crystallites
depend on both the implantation temperature and the annealing conditions. A broad band in an energy range of 0.75–1.1 eV was
recorded in the photoluminescence spectra of the samples. 相似文献