Slow cyclotron instability in a high-power backward-wave oscillator

The linear dispersion relation of a backward-wave oscillator (BWO), derived earlier by the authors, is modified to include effects of RF surface current at the beam-vacuum interface. This modified dispersion relation results in an unstable interaction between the slow cyclotron mode (SCM) and the structure mode in addition to the conventional Cherenkov instability caused by the slow space charge mode. Numerical analysis is then carried out using parameters of a BWO experiment at University of Maryland. Fine structure of the SCM instability is elucidated. The analysis indicates that BWO radiation would not be suppressed near cyclotron absorption in an infinitely long system.     

Diffuse x-ray scattering study of the formation of microdefects in heat-treated dislocation-free large-diameter silicon wafers

Diffuse x-ray scattering (DXS) is used to study the formation of microdefects (MDs) in heat-treated dislocation-free large-diameter silicon wafers with vacancies. The DXS method is shown to be efficient for investigating MDs in silicon single crystals. Specific defects, such as impurity clouds, are found to form in the silicon wafers during low-temperature annealing at 450°C. These defects are oxygen-rich regions in the solid solution with diffuse coherent interfaces. In the following stages of decomposition of the supersaturated solid solution, oxide precipitates form inside these regions and the impurity clouds disappear. As a result of the decomposition of the supersaturated solid solution of oxygen, interstitial MDs form in the silicon wafers during multistep heat treatment. These MDs lie in the {110} planes and have nonspherical displacement fields. The volume density and size of MDs forming in the silicon wafers at various stages of the decomposition are determined.     

Fano direct products as rationally connected fibrations

Combining the connectedness principle of Shokurov and Kollár, we develop a new technique of studying birational maps of natural Fano fiber spaces. We prove that the only structures of a rationally connected fibration on direct products of typical Fano varieties are projections onto the factors. In particular, the groups of biregular and birational self-maps of Fano direct products coincide. __________ Translated from Fundamentalnaya i Prikladnaya Matematika, Vol. 10, No. 4, pp. 183–206, 2004.     

Calculation of the bond ionicity in complex oxides

A technique for calculating the bond ionicity of crystalline materials using electronegativities of elements and taking into account the structure of polyhedra of the complex-oxide structure is proposed.     

The effect of technological microdefects of structure on service life of polymer materials

Within the framework of the kinetic theory of strength, relations for estimation of durability of thermoplastic materials under stationary and non-stationary thermomechanical impacts are obtained It is shown that durability decreases linearly with increase in the natural (Napierian) logarithm of the mean size of microcracks formed during manufacturing of polymer products. __________ Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 7, pp. 3–6, July, 2007.