X-Ray Study of the Deformation Density in Tetrafluoroterephthalodinitrile: Weak Bonding Density in the C,F-Bond

A careful deformation density study of tetrafluoroterephthalodinitrile at 98K has been made from X-ray diffraction measurements. Prominent ‘bonding density’ peaks are found at or near the mid-points of the C, C- and C, N-bonds but not for the C, F-bonds, which show only weak density. Similarly weak bonding densities for C, F-bonds are also found for 1, 1, 4, 4-tetrafluorocyclohexane. The possible significance of these results in terms of bonding theory is briefly discussed.     

The Equilibrium Structure of Methyl Fluoride

The equilibrium structure of CH₃F has been determined using new sets of accurate rotational constants that have been determined by taking into account all the interactions between the excited vibrational states. This experimental structure is in excellent agreement with the equilibrium geometry calculated at the CCSD(T) level of theory with the cc-pV(5, Q)Z basis set (including corrections for the core correlation and for the effect of diffuse functions on fluorine). Finally, the experimental and ab initio structures have been combined by a least-squares analysis. The results are , and L _e(HCH) = 110.2 (1)°, where the uncertainties shown in parentheses correspond to three standard deviations.     

A simulation of thermal characteristic parameters with an inverse “S” type curve

A synthetical equation is proposed to characterize the essential features of the inverse “S” type curve on the basis of summing-up simulation approach of “S” type curve. The two physical variables in the model obtained are discussed and the detailed method used to determine the parameters is given. The model is then presented to describe the crystallization of poly(caryleher ether ketone) (PEEK) and thermal decomposition of poly(amide-imide) (PAI) respectively. It is found that some thermal characteristic parameters can be well estimated from the model simu-lated in computer.     

An alternative method for the certification of the sulfur mass fraction in coal Standard Reference Materials

The S mass fractions of coal SRMs 2682b, 2684b, and 2685b are certified by direct comparison with coal SRMs 2682a, 2684a, and 2685a, respectively, using high-temperature combustion analysis with infrared (IR) absorption detection. The S mass fractions of the "a" materials used for calibration were previously determined by means of isotope-dilution thermal-ionization mass spectrometry (ID-TIMS). Therefore, the comparisons performed with the combustion-IR absorption method establish direct traceability links to accurate and precise ID-TIMS measurements. The expanded uncertainties associated with the certified S mass fractions are of approximately the same magnitude as would be expected for the ID-TIMS methodology. An important aspect of these certifications is that each "b" material is essentially identical with the corresponding "a" material, because both were produced from the same bulk, homogenized coal. As a test of the efficacy of the new certification approach when calibrant and unknown are not identical, the S mass fraction of coal SRM 2683b has been determined by direct comparison to coal SRM 2683a. These two coals, which have both previously been analyzed with ID-TIMS, are different in terms of S content and other properties. Whereas the S mass fraction for SRM 2683b determined with the new methodology agrees statistically with the ID-TIMS value, there is reason for caution in such cases. In addition to the usefulness of the alternative approach for certification activities within NIST, this approach might also be an excellent way of establishing NIST traceability during the value assignment process for reference materials not issued by NIST. Further research is needed, however, to understand better the scope of applicability.     

1,3,3a,5-四苯基-3a,4,5,11-四氢-3H,6H-1,2,4-三唑并[4,3-d][1,5]苯并二氮杂(艹卓)的合成及晶体结构

通过2,4-二苯基-2,3-二氢-1H-1,5-苯并二氮杂(艹卓)与苯甲酰氯苯腙的[2+3]环加成反应制备了标题化合物,用X射线单晶衍射仪测定了其晶体结构.晶体属正交晶系,空间群为Fdd2.晶胞参数:a=1.762 8(4)nm,b=5.751 2(12)nm,c=1.022 7 nm,V=10.368(5)nm3,Z=16,Dc=1.262 g·cm-3,μ=0.075 mm-1,F(000)=4 160,1 139个可观测衍射点,R-0.046 1,Rw=0.056 0.     

Probing the local structure and mechanical response of nanostructures using force modulation and nanofabrication

Nanostructures of self-assembled monolayers (SAMs) are designed and produced using coadsorption and nanografting techniques. Because the structures of these artificially engineered domains are predesigned and well-characterized, a systematic investigation is possible to study the mechanical responses to force modulation under atomic force microscope tips. Force modulation imaging reveals characteristic contrast sensitivity to changes in molecular-level packing, molecule chain lengths, domain boundaries, and surface chemical functionalities in SAMs. By means of actively tuning the driving frequency, the resonances at the tip-surface contact are selectively activated. Therefore, specific surface features, such as the edges of the domains and nanostructures or desired chemical functionalities, can be selectively enhanced in the amplitude images. These observations provide a new and active approach in materials characterization and the study of nanotribology using atomic force microscopy.