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11.
Chi‐Jen Liu Chang‐Hai Wang Cheng‐Liang Wang Y. Hwu Chien‐Yi Lin G. Margaritondo 《Journal of synchrotron radiation》2009,16(3):395-397
Dose measurements based on methylene blue (MB) bleaching, widely used for ultraviolet light, can also be applied to X‐rays including very high flux levels. This method has been tested by using both MB bleaching and Fricke dosimetry for a conventional monochromatic X‐ray source and then for `white‐beam' synchrotron radiation. The results show that MB bleaching dosimetry can easily measure X‐ray doses up to at least 105 Gy s?1, as long as the MB concentration is sufficiently high. This condition can be verified from the deviations from linearity of the bleaching versus exposure time. 相似文献
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Chien CC Cheng CC Chen HH Hwu Y Chu YS Petibois C Chen A Ching YT Margaritondo G 《Analytical and bioanalytical chemistry》2012,404(5):1287-1296
We demonstrate that, with appropriate staining, high-resolution X-ray microscopy can image complicated tissue structures--cerebellum and liver--and resolve large or small amounts of Au nanoparticles in these tissues. Specifically, images of tumor tissue reveal high concentrations of accumulated Au nanoparticles. PEG (poly(ethylene glycol)) coating is quite effective in enhancing this accumulation and significantly modifies the mechanism of uptake by reticuloendothelial system (RES) organs. 相似文献
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Y. Hwu W. L. Tsai B. Lai J. H. Je G. H. Fecher M. Bertolo G. Margaritondo 《Surface science》2001,480(3):188-195
We present several successful test cases of using photoelectron emission microscopy (PEEM) for photon energy up to 25 keV. First, the full extended X-ray absorption fine structure analysis was implemented in areas as small as 100 μm2 for transition-metal K edge absorption spectra and, therefore, demonstrated the feasibility of combining structural and chemical analysis with hard-X-ray absorption spectroscopy with high lateral resolution. We also show that PEEM can be used in a transmission (radiography) mode as an imaging detector for hard-X-ray. This approach again leads to the unprecedented 0.3 μm lateral resolution, particularly critical for the use of coherence-based phase contrast techniques in real time X-ray radiology. 相似文献
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M. Grioni I. Vobornik F. Zwick G. Margaritondo 《Journal of Electron Spectroscopy and Related Phenomena》1999,100(1-3):313-329
We review some recent spectroscopic results on low-dimensional systems, including high-Tc superconductors, and charge density wave compounds. We briefly discuss the reasons for the present interest in these materials, and the relevance of band mapping experiments by angle-resolved photoemission spectroscopy. The main focus of the paper is on high-energy resolution, which can be exploited to probe the quasiparticle excitations, and to study the characteristic instabilities of the Fermi surface. Gap spectroscopy in the ordered phases is a prominent part of this research, namely in the cuprates. The normal state properties, however, are often as interesting. This is particularly true in 1D, where the photoemission results indicate strong deviations from a Fermi liquid scenario. 相似文献
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Pei‐Cheng Hsu Yu‐Sheng Chen Yeukuang Hwu J. H. Je G. Margaritondo Eng Soon Tok 《Journal of synchrotron radiation》2015,22(6):1524-1527
X‐ray irradiation is shown to trigger the deposition of Cu from solution, at room temperature, on a wide variety of insulating substrates: glass, passivated Si, TiN/Ti/SiO2/Si and photoresists like PMMA and SU‐8. The process is suitable for patterning and the products can be used as seeds for electroplating of thicker overlayers. 相似文献
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D. Vobornik G. Margaritondo J. S. Sanghera P. Thielen I. D. Aggarwal B. Ivanov J. K. Miller R. Haglund N. H. Tolk A. Congiu-Castellano M. A. Rizzo D. W. Piston F. Somma G. Baldacchini F. Bonfigli T. Marolo F. Flora R. M. Montereali A. Faenov T. Pikuz G. Longo V. Mussi R. Generosi M. Luce P. Perfetti A. Cricenti 《Infrared Physics & Technology》2004,45(5-6):409-416
Scanning near-field optical microscopy (SNOM) makes it routinely possible to overcome the fundamental diffraction limit of standard (far-field) microscopy. Recently, aperture-based infrared SNOM performed in the spectroscopic mode, using the Vanderbilt University free electron laser, started delivering spatially-resolved information on the distribution of chemical species and on other laterally-fluctuating properties. The practical examples presented here show the great potential of this new technique both in materials science and in life sciences. 相似文献