Die Bestimmung des Harzes in Seifen und Fetten

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Besprechungen

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Zur Bestimmung der Molybd?ns?ure

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A fast method to measure the thickness of removed layer from etching of SSNTD based on EDXRF

Solid state nuclear track detectors are commonly used for measurements of concentrations of radon gas and/or radon progeny. All these measurements depend critically on the thickness of the removed layer during etching. However, the thickness of removed layer calculated using the etching period does not necessarily provide a sufficiently accurate measure of the thickness. For example, the bulk etch rate depends on the strength of stirring during etching for the LR 115 detector. We propose here to measure the thickness of the removed layer by using energy-dispersive X-ray fluorescence spectrometry. In the present work, a reference silver nitrate pellet is placed beneath the LR 115 detector, and the fluorescence X-ray intensity for silver is then measured. We have found a linear relationship between the X-ray intensity and the thickness of the removed layer for LR 115 detector. This provides a fast method to measure the thickness of removed layer from etching of LR 115 detector. However, this method was found to be inapplicable for the CR-39 detector. Therefore, alternative methods have yet to be explored for the CR-39 detector.     

Attractors for 2D-Navier-Stokes models with delays

The existence of an attractor for a 2D-Navier-Stokes system with delay is proved. The theory of pullback attractors is successfully applied to obtain the results since the abstract functional framework considered turns out to be nonautonomous. However, on some occasions, the attractors may attract not only in the pullback sense but in the forward one as well. Also, this formulation allows to treat, in a unified way, terms containing various classes of delay features (constant, variable, distributed delays, etc.). As a consequence, some results for the autonomous model are deduced as particular cases of our general formulation.