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用自旋-晶格弛豫时间(T1)研究了溶胀的交联聚丙烯酰胺-丙烯酸网络和线型聚苯乙烯溶液中质子的弛豫行为。交联网络中,随着交联度增大,T1CH/T1CH2的值由1.17逐渐趋近于1;而线型聚苯乙烯溶液中,T1CH/T1CH2的值由最稀浓度下的1.7过渡到1。说明在交联网络中,交联度很低时,链段的运动已经相当受约束;但交联度很大时,充分溶胀的交联网络中链段运动仍有一定自由度。而在线型高分子浓溶液中,链段的运动严重受阻,导致自旋扩散效应非常完全,彻底平均掉了各质子间T1时间的差异。 相似文献
996.
功能色素材料——苯重氮氨基偶氮苯类光度显色剂的研究罗小民周伟良孙培培吴斌才(华东师范大学化学系上海200062)关键词光度显色剂离解电子光谱HMO法中图分类号621.13功能色素材料包括光致变色、电致变色、热致变色和压敏变色材料以及光度显色剂等。这些... 相似文献
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Hae‐Jeong Lee Christopher L. Soles Da‐Wei Liu Barry J. Bauer Wen‐Li Wu 《Journal of Polymer Science.Polymer Physics》2002,40(19):2170-2177
X‐ray reflectivity has been used to determine the mass uptake of probe molecules in porous thin films supported on thick silicon wafers. The adsorption occurs by capillary condensation when the films are exposed to probe vapor at controlled partial vapor pressures. The probe solvent partial pressure was varied by mixing saturated air and dry air at constant temperature or by changing sample temperature at a constant vapor concentration. Pore size distribution in the films can be calculated from the probe uptake with typical porosimetric approaches such as the application of the Kelvin equation to convert partial pressure into pore size. For illustration, the pore size distribution of three different nanoporous thin films, the primary candidate of ultra‐low‐k interlevel dielectrics in the next generation of integrated circuit chips, was determined with this technique. These samples represent different generations of low‐k dielectrics developed by industry. © 2002 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 40: 2170–2177, 2002 相似文献
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The thermal decomposition characteristics of1,7-diazido-2,4,6-trinitrazaheptane (DATH) and multi-component systems containing
DATH were studied by using DSC, TG and DTG techniques. Three –NO2 groups in the DATH molecule break away first from the main chain when DATH is heated up to 200°C. Following this process,
the azido groups and the residual molecule decompose rapidly to release a great deal of heat within a short time. In the multi-component
systems, DATH undergoes a strong interaction with the binder of the double-base propellant and a weak interaction with RDX.
The burning rates of the two propellants were determined by using a Crawford bomb. The results showed that the burning rate
rises by about 19–66% when 23.5%DATH is substituted for RDX in a minimum smoke propellant. Meanwhile, the N2 level in the combustion gases is enhanced, which is valuable for a reduction of the signal level of the solid propellant.
This revised version was published online in July 2006 with corrections to the Cover Date. 相似文献
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Fourier transform infrared-attenuated total reflection (FTIR-ATR) spectra have been recorded of 11-layer Langmuir-Blodgett (LB) films of stearic acid deposited at various surface pressures (0.1, 15, and 35 mN/m), and the molecular orientation angles were evaluated quantitatively, which supplied insight into the molecular order with the alkyl chains tightly packed like crystal in the LB films deposited at the zero and higher surface pressures. These experimental results indicate that, in the Langmuir film as the precursor of LB films, stearic acid molecules self-aggregate to form two-dimensional crystalline domains already even at the zero surface pressure, which results in the inhomogeneity of monolayer. The analysis of dependence of nu(C=O) intensity on the surface pressure, surface density, and subphase temperature leads to the conclusion that the defects in LB films originate from the Langmuir film and be conserved upon deposition. Annealing below 50 degrees C and cooling could improve the monolayer homogeneity, and thus a defect-free or low-defect LB films can be deposited. Furthermore, ion exchange conducted in the LB films, on the other hand, confirms the existence of structure defects in LB films of stearic acid. The polar plane microstructure, lateral transport along the polar planes and the coordination types of stearic acid/cation system may be the rate-limiting process. The results have implication on the possible uses of stearic acid LB films as ion-exchange materials or sensors. Copyright 2001 Academic Press. 相似文献
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