Quantum-networks: master equation and local measurements

Based on the SU(n)-algebra the Markoff master equation in discrete product space is reformulated to explicitly deal with composite systems. The resulting local (single node) and nonlocal (multi-node) state parameters allow a systematic approach to non-classical features of the state, like variance and covariance tensors. For local optical driving forces, inter-node interactions, and local damping channels the solution of the master equation is unraveled into stochastic quantum trajectories. Sampling leads to a joint distribution function in terms of those state parameters. Its linear moments define the ensemble-density matrix. The average variance and covariance are in terms of non-linear moments, which should be distinguished from their entirely statistical counterpairs. Non-classicality of the network dynamics is shown to reflect itself in the luminescence-photonstatistics.     

Frequency domain measurements on Na2B4O7−V2O5 semiconducting glass

Summary Dielectric measurements on Na₂B₄O₇(99.5%)−V₂O₅(0.5%) glass system, in the frequency range 10⁻³ to 10⁴ Hz and temperature range 300 to 500 K, have been carried out. The normalized plots of complex capacitance have shown a single mechanism responsible for conduction for both volume and surface measurements with their close values of activation energies (0.67±0.03) eV and (0.64±0.03) eV, respectively. The low-frequency dispersion (LFD) behaviour has been observed to be perturbed by the presence of more than one competing process. The impedance plots have shown a parallel combination of a capacitor (C) and a resistor (R), with some contribution of a dispersive element due to charge accumulation in the vicinity of the electrodes. The values ofR andC were found to be of the same order of magnitude, for both surface and volume measurements. The observedR has shown a decrease with an increase in temperature due to an increase in mobility of Na⁺ ions, whereasC remains practicaly constant. The complex capacitance surface behaviour is dominated by volume, due to hygroscopy of this glass system.     

Inhibitors of prostaglandin biosynthesis from Dalbergia odorifera.

The root heartwood of Dalbergia odorifera T. Chen (Leguminosae) is a Chinese medicinal drug (Japanese name koshinko) used for a stagnant blood syndrome (stagnation of disordered blood; Japanese, oketsu). In addition to 10 known compounds, five new phenolic compounds, isomucronustyrene and hydroxyobtustyrene (cinnamylphenols), (+)-isoduartin (isoflavan), odoriflavene (isoflav-3-ene) and (-)-odoricarpan (pterocarpan) were isolated and their structures were elucidated on the basis of chemical and spectroscopic methods. Of the fifteen compounds isolated, cinnamylphenols, isoflavans, isoflavene and benzoic acid derivative significantly inhibited prostaglandin biosynthesis as well as platelet aggregation induced by arachidonic acid.     

New AlDy(Ni,Co) glasses - the influence of pre-aging on decomposition and modelling of the crystallisation

The decomposition of AlDy₆Ni₁₀ and AlDy₈Ni₆Co₂ glasses prepared by melt spinning after different pre-aging regimes was investigated. The modelling of the transformation at the glass transition and the crystallisation was tested by a more general Johnson-Mehl-Avrami-Kolmogorov model and by the determination of the local kinetic parameter. The relaxation was tested with an lnt kinetic model after Gibbs.     

Determination of mepiquatchloride in animal and plant matrices by ion chromatography with conductivity detection

Summary A new residue method, based on ion chromatography, for the determination of trace amounts of the ionic plant growth regulator mepiquatchloride is described. The method is adapted to plant and animal matrices and does not require any derivatization steps. This new technique provides higher recoveries of the analyte, better reproducibility and increased speed than the previous method. The limit of determination is 0.05 mg/kg.     

Realisation and metrological characterisation of thickness standards below 100 nm

High-accuracy film thickness measurements in the range below 100 nm can be made by various complex methods like spectral ellipsometry (SE), scanning force microscopy (SFM), grazing incidence X-ray reflectometry (GIXR), or X-ray fluorescence analysis (XRF). The measurement results achieved with these methods are based on different interactions between the film and the probe. A key question in nanotechnology is how to achieve consistent results on a level of uncertainty below one nanometre with different techniques.Two different types of thickness standards are realised. Metal film standards for X-ray techniques in the thickness range 10 to 50 nm are calibrated by GIXR with monochromatised synchrotron radiation of 8048 eV. The results obtained at four different facilities show excellent agreement. SiO₂ on Si standards for SE and SFM in the thickness range 6 to 1000 nm are calibrated by GIXR with monochromatised synchrotron radiation of 1841 eV and with a metrological SFM. Consistent results within the combined uncertainties are obtained with the two methods. Surfaces and interfaces of both types of standards are additionally investigated by transmission electron microscopy (TEM). PACS 61.10.Kw; 68.55.Jk; 06.20.Fn; 06.60.Mr; 07.79.Lh