Cylindrical spike model for the formation of diamondlike thin films by ion deposition

T /n_S of n_T rearrangements and n_S atoms in the spike volume as the crucial parameter characterizing the ability of a given ion–target combination to achieve complete rearrangement of the spike volume. n_T/n_S>1 is the optimum condition for diamondlike film growth. For aC films the ion energy dependence of n_T/n_S agrees well with the measured sp³ bond fraction. For Ar⁺-ion-assisted deposition of aC we find n_T/n_S>1 above 50 eV with no pronounced ion energy dependence. Furthermore, our model predicts optimum conditions for the formation of cubic boron nitride between 50 eV and 3 keV. Accepted: 14 October 1997     

Simulation of attenuation of millimeter radio waves in dry snowfalls

Attenuation of millimeter waves in dry snowfalls is numerically simulated with allowance for the actual shape of snowflakes. It is shown that for moderate-intensity snowfalls the values of attenuation cross-sections averaged over the snowflake orientations are well approximated by power-law function depending on the equivalent diameter of the snowflakes. This allows us to obtain an analytical expression for the attenuation coefficient of a plane electromagnetic wave by snowfall for size distributions of particles of the gamma-distribution type and its modifications. Radiophysical Research Institute, Nizhny Novgorod, Russia. Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Radiofizika, Vol. 41, No. 4, pp. 446–455, April, 1998.     

Recent trends and open issues in reverse engineering

This paper discusses recent trends in the field of reverse engineering, particularly those highlighted at the Second Working Conference on Reverse Engineering, held in July 1995. The trends observed include increased orientation toward tasks, grounding in complex real-world applications, guidance from empirical study, analysis of non-code sources, and increased formalization. The paper also summarizes open research issues and provides pointers to future events and sources of information in this area.     

Critical thickness and stress relaxation in YBaCuO (123) strained epitaxial layers and YBaCuO based strained superlattices

An energy model has been used to calculate the critical thickness h _c of YBaCuO thin films and YBaCuO based superlattices within an isotropic or anisotropic approximation. The critical thickness of single layers calculated from the anisotropic model (16 nm) is in good agreement with the previously published experimental values which are spread out from 4 to 20 nm. In the case of superlattices, relaxation appears to be governed by the critical thickness of the elementary sub-layers and is then better evaluated through the calculation performed for YBaCuO single layers. XRD measurements on YBa₂Cu₃O₇/PrBa₂Cu_3?xGa_xO₇ superlattices grown on {100{ SrTiO₃ have evidenced a tetragonal stress in the YBaCuO ab plane which remains expanded when the YBaCuO elementary layer thickness is lower than 4.8 nm (4 YBaCuO cells). However the critical temperature of the shortest period superlattices is only slightly affected by this expanded stress in contrast to the effect of an elastic stress externally applied along the ab plane of YBaCuO thin films.     

Surface characterization of fluorinated polymers (PTFE, PVDF, PFA) for use in ultratrace analysis

Surface characterization of new unused PTFE, PFA and PVDF labware has been carried out by light microscopy, scanning electron microscopy, profilometry and atomic force microscopy. It has been found that in spite of higher micro-roughness, PFA exhibits the lowest nano-roughness and hence seems best suited as vessel material for relatively mild pressureless chemical operations for sample preparation of ultrapure substances, as container material for storage of ultrapure liquids, and for transport of such liquids, e.g., from the producer in the chemical to the end user in the microelectronics industry. This suitability refers only to the surface quality of the investigated materials. PTFE-surfaces, due to the sintering process of production, exhibit the most unfavourable surface quality of the investigated fluorinated polymers.