Slow cyclotron instability in a high-power backward-wave oscillator

The linear dispersion relation of a backward-wave oscillator (BWO), derived earlier by the authors, is modified to include effects of RF surface current at the beam-vacuum interface. This modified dispersion relation results in an unstable interaction between the slow cyclotron mode (SCM) and the structure mode in addition to the conventional Cherenkov instability caused by the slow space charge mode. Numerical analysis is then carried out using parameters of a BWO experiment at University of Maryland. Fine structure of the SCM instability is elucidated. The analysis indicates that BWO radiation would not be suppressed near cyclotron absorption in an infinitely long system.     

Diffuse x-ray scattering study of the formation of microdefects in heat-treated dislocation-free large-diameter silicon wafers

Diffuse x-ray scattering (DXS) is used to study the formation of microdefects (MDs) in heat-treated dislocation-free large-diameter silicon wafers with vacancies. The DXS method is shown to be efficient for investigating MDs in silicon single crystals. Specific defects, such as impurity clouds, are found to form in the silicon wafers during low-temperature annealing at 450°C. These defects are oxygen-rich regions in the solid solution with diffuse coherent interfaces. In the following stages of decomposition of the supersaturated solid solution, oxide precipitates form inside these regions and the impurity clouds disappear. As a result of the decomposition of the supersaturated solid solution of oxygen, interstitial MDs form in the silicon wafers during multistep heat treatment. These MDs lie in the {110} planes and have nonspherical displacement fields. The volume density and size of MDs forming in the silicon wafers at various stages of the decomposition are determined.     

Two observations about free graded hopf algebras

This paper records two results about graded Hopf algebras that do not appear to be stated explicitly in the literature. Let B be a graded set, graded by the positive integers. Let V be the graded vector space with basis B over a field K of characteristic zero and V^'=K⊕V, where K is in grading zero. Let L ne the free graded Lie algebra on B over K and let T be the free graded tensor algebra on B. The first result is the "graded Witt formula" giving the dimension of the subspace of L in each grading. The second result is the observation that any graded coassociative, co-commutative comultiplication Δ:V^'→V^'⊗V^', with co-unit the projection V¹→K. extends to a graded Hopf algebra structure on T that is in fact isomorphic to the natural graded Hopf algebra structure on T. In the ungraded case the statement analogous to the second result is false.     

Graphitic nanofillers in PMMA nanocomposites—An investigation of particle size and dispersion and their influence on nanocomposite properties

Mechanical, thermal, and electrical properties of graphite/PMMA composites have been evaluated as functions of particle size and dispersion of the graphitic nanofiller components via the use of three different graphitic nanofillers: “as received graphite” (ARG), “expanded graphite,” (EG) and “graphite nanoplatelets” (GNPs) EG, a graphitic materials with much lower density than ARG, was prepared from ARG flakes via an acid intercalation and thermal expansion. Subsequent sonication of EG in a liquid yielded GNPs as thin stacks of graphitic platelets with thicknesses of ～10 nm. Solution‐based processing was used to prepare PMMA composites with these three fillers. Dynamic mechanical analysis, thermal analysis, and electrical impedance measurements were carried out on the resulting composites, demonstrating that reduced particle size, high surface area, and increased surface roughness can significantly alter the graphite/polymer interface and enhance the mechanical, thermal, and electrical properties of the polymer matrix. © 2007 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 45: 2097–2112, 2007     

Recycling in telomerization of butadiene with D‐xylose: Pd(TPPTS)n‐KF/Al2O3 as an active catalyst

A palladium‐TPPTS catalyst heterogenized on KF/alumina has been shown to be effective and recyclable for the selective formation of monooctadienylxylopyranosides via the telomerization of butadiene with D ‐xylose. Copyright © 2007 John Wiley & Sons, Ltd.     

Non-destructive analysis of archeological samples by energy-dispersive X-ray fluorescence

Summary A non-destructive method is described for the determination of major and minor constituents in archeological specimens by energy-dispersive X-ray fluorescence. Homogeneity tests are made by measuring at various sites of the specimen. In the same way, mean values are obtained for inhomogeneous specimen without taking samples. For calibration, powder standards are used. In case of the determination of elements with numbers up to 14 (Si) a vacuum chamber is used and the dimensions of the specimens are limited by the dimensions of that vacuum chamber, whereas for the determination of elements from K up to U specimens of any size, form or weight are suitable.

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Zerstörungsfreie Analyse von archäologischen Proben mit Hilfe der Energie-dispersiven Röntgenfluorescenzanalyse

Zusammenfassung Eine zerstörungsfreie Methode für die Bestimmung von Haupt- und Nebenbestandteilen in archäologischen Proben mit Hilfe der Energie-dispersiven Röntgenfluorescenzanalyse wird beschrieben. Für Homogenitätstests wird an mehreren Stellen der Probe gemessen. In der gleichen Weise werden für inhomogene Proben Mittelwerte erhalten ohne Probenahme. Für die Eichung werden Pulverstandards verwendet. Im Falle der Bestimmung von Elementen mit Ordnungszahlen bis 14 (Si) wird eine Vakuumkammer eingesetzt, und die Dimensionen der Proben sind durch die Dimensionen dieser Vakuumkammer begrenzt, während für die Bestimmung der Elemente K bis U Proben jeder Größe, jeder Form oder jeden Gewichts verwendbar sind.