排序方式: 共有48条查询结果,搜索用时 15 毫秒
31.
Organic phosphonic acid system abrasive free slurry for copper polishing is developed in our earlier work. Since material removal rate is too high to be applied as precision polishing slurry for copper, inhibitors are needed. Experiment results also show us that the most commonly used inhibitor benzotriazole is unsuitable for this abrasive free slurry, and then another kind of compound inhibitors for this organic phosphonic acid system abrasive free slurry are developed. The compound inhibitors, consisting of ascorbic acid and ethylene thiourea, can control the material removal rate and also reduce surface roughness. XPS results show that, in the compound inhibitors, ascorbic acid participates in the surface chemical reaction, forms passivating layer on copper surface and helps to control the material removal rate. Corrosion current calculated from polarization curve is consistent with material removal rate. Ethylene thiourea contributes to the reduction of surface roughness, which can be indicated by the peak shape change of S2p in XPS results. 相似文献
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Pingxue Li Guoshun Zhong Zhi Liu Junjie Chi Xuexia Zhang Chun Yang Ziqiang Zhao Yao Li Xiongfei Wang Hong Zhao Dongsheng Jiang 《Optics & Laser Technology》2012,44(7):2202-2205
In this paper, we report on a large-mode-area double-clad 980 nm Yb-doped photonic crystal fiber (PCF) amplifier. In the experiment, an output power of 1.21 W at 980 nm with 2.5 nm bandwidth has been yielded when the PCF length was 40 cm. Through frequency doubling the 980 nm amplified laser with a BIBO crystal, an output power of 51 mW at 490 nm has been generated. 相似文献
33.
对新型氧渗透材料Ba0 .5 Sr0 .5 Co0 .8Fe0 .2 O3 -δ(BSCF)进行了O2 TPD表征、非化学计量 (δ)测定、电导率 (σ)测量和氧渗透性能测试的研究 .结果表明 ,经纯氧气氛处理后的BSCF ,其O2 TPD谱存在三个失氧峰 :低温峰对应于晶格中V O 位置上的吸附氧 ,高温区两个峰对应于晶格中两种不同位置的晶格氧 ;σ对温度的实验表明 ,不论在升温还是降温过程中 ,σ在 470℃左右均出现极大值 ,可能与BSCF体系的δ值随温度变化相关 ;氧渗透实验表明 ,850℃以上 ,BSCF的氧渗透率JO2 较大 ,达到 1μmol/cm2 s ,活化能较低 ,Ea =63 .1kJ/mol ,而低于 850℃时 ,存在相分解 相似文献
34.
The structural and mechanical properties of TiN coatings prepared by ion beam assisted deposition (IBAD) were studied. The coatings have a polycrystal structure with grain size of ≈10nm or less. The hardness of the coatings increases with increasing grain size of TiN crystallites. The coating with grain size of 10.3 nm even has a superhardness of 44.7 GPa. The relationship between the hardness and the grain size in the nano-crystalline coatings was discussed on the basis of grain-boundary triple junctions.
相似文献35.
36.
安息香肟碳糊修饰电极快速线性扫描伏安法测定铜 总被引:5,自引:0,他引:5
本文报道了一种用络合剂安息香肟制备的化学修饰电极。由于安息香肟对Cu(Ⅲ)的络合有特殊的选择性,电极可以选择性富集溶液中的Cu(Ⅲ)。经过电位还原,并可采用快速线性扫描伏安法进行定量分析。检测限可达10~(-9)mol/L浓度。采用本文法对成分复杂的阳极泥等样品进行直接测定,得到了令人满意的结果。 相似文献
37.
Wenhu XuXinchun Lu Guoshun PanYuanzhong Lei Jianbin Luo 《Applied Surface Science》2011,257(7):2905-2911
In this paper, the technique of ultrasonic flexural vibration assisted chemical mechanical polishing (UFV-CMP) was used for sapphire substrate CMP. The functions of the polishing pad, the silica abrasive particles, and the chemical additives of the slurry such as pH value regulator and dispersant during the sapphire's UFV-CMP were investigated. The results showed that the actions of the ultrasonic and silica abrasive particles were the main factors in the sapphire material removal rate (MMR) and the chemical additives were helpful to decrease the roughness of sapphire. Then the effects of the flexural vibration on the interaction between the silica abrasive particles, pad and sapphire substrate from the kinematics and dynamics were investigated to explain why the MRR of UFV-CMP was bigger than that of the traditional CMP. It indicated that such functions improved the sapphire's MRR: the increasing of the contact silica particles’ motion path lengths on the sapphire's surface, the enhancement of the contact force between the contact silica particles and the sapphire's surface, and the impaction of the suspending silica particles to the sapphire's surface. 相似文献
38.
铅在二苯乙醇酮肟修饰电极上的络合富集和电化学行为 总被引:1,自引:0,他引:1
本文报道了一种对Pb(Ⅱ)具有高灵敏度和选择性的碳糊化学修饰电极。该电极由碳粉中加入修饰剂二苯乙醇酮肟制备而成。通过开路富集,Pb(Ⅱ)和二苯乙醇酮肟形成络合物浓集于电极表面,然后经介质支换、电位还原再进行阳极扫描测定,检测限为8.0×10~(-9)mol/L(1.6ppb)Pb(Ⅱ)。在浓度为10~(-7)~10~(-8)mol/LPb(Ⅱ)范围内,峰电流与浓度具有线性关系。此修饰电极可直接从试液中选择性地富集和测定Pb(Ⅱ),大多数金属离子对测定均无干扰。 相似文献
39.
报道了锂皂石修饰碳糊电极测定痕量铜,在含0.001mol/L KCl Cu^+2的试液中,开路富集后介质交换到0.05mol/L KCl中,用微分脉冲伏安法测定,检测限为7.0ng/mL。常见阳离子基本不干扰,可不经预先分离直接测定精金矿中铜的含量,结果良好。还探讨了Cu^+2在锂皂石修饰碳糊电极上的反应机理。 相似文献
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