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171.
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The Raman spectra of bulk As40?xS60Ix glasses with 0?x?20 have been studied. The obtained spectra can be successfully explained assuming the structure of these glasses to be composed of As2S3.45 polymer network matrix with dissolved AsBr3 and S8 molecules.  相似文献   
174.
The influence of chemisorption of CO and H2 has been studied on small iron carbide particles by Mössbauer spectroscopy. The line with is increased by 2–3 times upon evacuation and also the values of isomer shift and magnetic hyperfine field were increased in vacuum. The effect is attributed to the chemisorption induced uniformization of the magnetic exchange interaction among the particles.  相似文献   
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Cross sections for the reactions27Al(n, p)27Mg and28Si(n,p)28Al were measured by activation method between 13.40 and 14.83 MeV neutron energy. An accuracy of about 4% was achieved using the27Al(n, α)24Na reaction as a reference at 14.1 MeV where the relative excitation function has also been measured. Results obtained were compared to a recent compilation and that calculated by the Hauser-Feshbach model. Using the back-shifted level density formula and taking into account the contribution of the separated levels, the calculations were extended to the energy range from the threshold to 18 MeV. A structure was observed in the27Al(n, α)24Na reaction cross section curve around 14 MeV neutron energy.  相似文献   
177.
We show that the Boolean power of an orthomodular latticeL is atomic if and only if bothL and the underlying Boolean algebraB are atomic. We describe the set of all atoms in the Boolean power.  相似文献   
178.
A study of the gas-phase parameters involved in ArF laser induced chemical vapour deposition of silicon-oxide thin films is presented. A complete set of experiments has been performed showing the influence of the concentration of the precursor gases, N2O and SiH4, and their influence on total and partial pressures on film growth and properties. In this paper we demonstrate the ability of this LCVD method to deposit silicon oxide films of different compositions and densities by appropriate control of gas composition and total pressure. Moreover, a material specific calibration plot comprising data obtained using different preparation techniques is presented, allowing determination of the stoichiometry of SiO x films by using FTIR spectroscopy independently of the deposition method. For the range of processing conditions examined, the experimental results suggest that chemical processes governing deposition take place mainly in the gas phase.  相似文献   
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X-ray photoelectron and Auger spectroscopies were used to examine surface bonding and overlayer growth during palladium and copper deposition onto films of fullerene, C60 The results were consistent with metal cluster formation on C60. The observed positive core electron binding energy shifts in small metallic clusters supported on C60 were shown to originate in metal-fullerene interaction accompanied by charge transfer. Palladium-fullerene intermixing at temperatures as low as ss 50°C was observed for small Pd coverages.  相似文献   
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