Reply to Comments of Bassi,Ghirardi, and Tumulka on the Free Will Theorem

We respond to criticisms of our paper “The Free Will Theorem”, and produce a new form of the theorem based on weaker assumptions.     

Decoupling Problem for Systems of Quasi-Linear pde’s

The necessary and sufficient conditions for the decoupling of a quasi-linear system of partial differential equations into k non-interacting subsystems are derived. Several necessary conditions for the decoupling are found and applied to the Benney system.     

Compatibility and Marginality

We present a way of introducing joint distibution function and its marginal distribution functions for non-compatible observables. Each such marginal distribution function has the property of commutativity. Models based on this approach can be used to better explain some classical phenomena in stochastic processes.     

Growth of single-crystal magnetite nanowires from Fe3O4 nanoparticles in a surfactant-free hydrothermal process

Single-crystal magnetite nanowires with average diameter of ca. 20 nm and length of up to several micrometers were prepared by a simple alkaline surfactant-free hydrothermal process. The crystallinity, purity, morphology, and structural features of the as-prepared magnetite nanowires were investigated by powder X-ray diffraction, transmission electron microscopy (TEM) and selected area electron diffraction. The composition and length of nanowires depends on the pH, with higher pH favoring longer nanowires composed entirely of Fe₃O₄. A mechanism for nanowire growth is proposed.     

测定透镜厚度新法及其误差探讨

本文介绍利用景深短、高倍率、大口径的物镜，采用光学方法，对被测透镜上下表面调焦，从而测定其中心厚度的一种新方法，并对测量误差进行了探讨。     

Flicker noise in degenerately doped Si single crystals near the metal-insulator transition

In this paper we report some of the important results of experimental investigations of the flicker noise near the metal-insulator (MI) transition in doped silicon single crystals. This is the first comprehensive work to study low-frequency noise in heavily doped Si over an extensive temperature range (2 K<T<500 K). The measurements of conductance fluctuations (flicker noise) were carried out in the frequency range 10⁻²<f<4 × 10¹ Hz in single crystalline Si across the MI transition by doping with phosphorous and boron. The magnitude of noise in heavily doped Si is much larger than that seen in lightly doped Si over the whole temperature range. The extensive temperature range covered allowed us to detect two distinct noise mechanisms. At low temperatures (T<100 K) universal conductance fluctuations (UCF) dominate and the spectral dependence of the noise is determined by dephasing the electron from defects with two-levels (TLS). At higher temperatures (T>200 K) the noise arises from activated defect dynamics. As the MI transition is approached, the 1/f spectral power, typical of the metallic regime, gets modified by the presence of discrete Lorentzians which arise from generation-recombination process which is the characteristic of a semiconductor.     

卡尔曼滤波紫外光度法同时测定酱油、食醋中的山梨酸和苯甲酸

在酸性条件下，采用乙酸乙酯萃取、Na2HPO4溶液反萃取分离酱汪、食醋中的山梨酸、苯甲酸，卡尔曼滤波法计算结果，并与比值导数波谱法进行比较。结果表明，卡尔曼滤波法较地数波谱法有较高准确度和精密度，并能监测干扰物质存在与否。用于实际样品分析有更高的可靠性。     

Equitable Total Coloring of Graphs with Maximum Degree 3

 The equitable total chromatic number χr d q u o; _e (G) of a graph G is the smallest integer k for which G has a total k-coloring such that the number of vertices and edges in any two color classes differ by at most one. We prove in this paper that χr d q u o; _e (G)≤5 if G is a multigraph with maximum degree at most 3. Received: February 24, 2000 Final version received: February 2, 2001 Acknowledgments. The author would like to thank the referee for valuable suggestions to improve this work.     

An optimal repeat inspection plan with several classifications

Multicharacteristic critical components exist in many systems. Such components could be a part of an aircraft, space shuttle or a gas ignition system. A component is critical if it causes disaster or a very high cost upon failure. In this paper, a new inspection plan for critical multicharacteristic components is presented. A mathematical model that depicts the plan is developed. An algorithm is proposed for finding the optimal number of repeat inspections and the sequence of characteristics for inspection that minimizes expected total cost per accepted component. The expected cost consists of the cost of inspection and the cost of misclassifications. The inspection plan and the model developed generalize existing models in the literature and provide a more realistic formulation. An example is given to demonstrate the plan and the model.