Nanoscale Broadband Viscoelastic Spectroscopy of Soft Materials Using Iterative Control

A novel approach to nanoscale broadband viscoelastic spectroscopy is presented. The proposed approach utilizes the recently developed modeling-free inversion-based iterative control (MIIC) technique to achieve accurate measurement of the material response to the applied excitation force over a broad frequency band. Scanning probe microscope (SPM) and nanoindenter have become enabling tools to quantitatively measure the mechanical properties of a wide variety of materials at nanoscale. Current nanomechanical measurement, however, is limited by the slow measurement speed: the nanomechanical measurement is slow and narrow-banded and thus not capable of measuring rate-dependent phenomena of materials. As a result, large measurement (temporal) errors are generated when material is undergoing dynamic evolution during the measurement. The low-speed operation of SPM is due to the inability of current approaches to (1) rapidly excite the broadband nanomechanical behavior of materials, and (2) compensate for the convolution of the hardware adverse effects with the material response during high-speed measurements. These adverse effects include the hysteresis of the piezo actuator (used to position the probe relative to the sample); the vibrational dynamics of the piezo actuator and the cantilever along with the related mechanical mounting; and the dynamics uncertainties caused by the probe variation and the operation condition. In the proposed approach, an input force signal with frequency characteristics of band-limited white-noise is utilized to rapidly excite the nanomechanical response of materials over a broad frequency range. The MIIC technique is used to compensate for the hardware adverse effects, thereby allowing the precise application of such an excitation force and measurement of the material response (to the applied force). The proposed approach is illustrated by implementing it to measure the frequency-dependent plane-strain modulus of poly(dimethylsiloxane) (PDMS) over a broad frequency range extending over 3 orders of magnitude (~1 Hz to 4.5 kHz).     

北京自由电子激光最近进展──实现饱和振荡

北京自由电子激光(BFEL)装置于1993年底在10.68μm处实现了饱和振荡.输出激光能量为3mJ,饱和平顶宽度2μs.对应饱和振荡平均功率为210kW(宏脉冲),峰值功率约为20MW,比自发辐射高8个量级,单程小讯号净增益为24%,转换效率为0.45%,与理论预期结果相符.光束质量接近衍射极限.目前装置可工作于9-11μm.     

利用不完全自锁模激光研究C60的反饱和吸收效应

本文报道首次采用色心晶体的不完全自锁模激光（１０６４ｎｍ）对Ｃ６０分子反饱和吸收效应的研究，实验结果与采用平均过程的研究方法是一致的，文中还讨论了Ｃ６０分子反饱和吸收效应产生的原因。     

石油醚在流体静高压下的超声声速、衰减、密度和绝热压缩系数

 专门设计了用脉冲-回波-重合法在不同静水压下测量液体声速的装置，并对石油醚在0.1~650 MPa流体静压力范围内测量了其超声声速和衰减系数。还通过测量体积压缩量和质量得到石油醚密度ρ随流体静压力的变化。最后，给出了石油醚的绝热压缩系数β与流体静压力的关系。     

锯齿型与扶手椅型碳化硅纳米管光电性质第一性原理研究

本文基于密度泛函理论计算分析了手性参数为(17,0)、(20,0)、(26,0) (10,10)、(12,12)、(15,15)的碳化硅纳米管的能带图,态密度及主要光学性质。结果表明：锯齿型与扶手椅型碳化硅纳米管均具有明显的半导体性质;在相近直径下,扶手椅型碳化硅纳米管带隙宽度要大于锯齿型碳化硅纳米管的带隙宽度;碳化硅纳米管的光吸收峰在100nm~200nm之间,可用于制作紫外线探测器件。     

金属和非金属原子间协同效应调控气体小分子的吸附特性研究

采用基于密度泛函理论方法系统地研究了单个NO和CO小分子在非金属(B和N)与金属Ni原子共掺杂石墨烯(Bx-Ny-gra-Ni,x+y=0,1,2,3)表面的吸附特性,分析了吸附气体小分子的几何结构,吸附能,电荷转移量以及引起体系磁性变化等情况.研究结果表明：NO和CO倾向于吸附在Ni原子的顶位,B和N掺杂原子的数量和比例能够有效地调制小分子的吸附强度;与吸附的CO分子相比,Bx-Ny-gra-Ni表面吸附的NO分子能获得较多的电荷,进而表现出高的稳定性.此外,利用吸附的气体小分子与衬底间相互作用强度和灵敏性的差异、以及引起反应衬底的磁性变化将为设计石墨烯基气敏、催化和电子器件提供重要参考.     

Total Valuation Rings of Ore Extensions

We consider extensions of a total valuation ring V of a skew field K to the Ore extension K(X;σ, δ) for an endomorphism σ of K and a σ-derivation δ. It is shown that there exists an extension R of V with X ∈ R, such that ${\overline X}$ is transcendental over V/J(V) if and only if (σ,δ) is compatible with V, where ${\overline X} = X + J(R^(1))$ . In the case V is invariant, it is established that there is an invariant extension R of V in K(X;σ,δ) such that ${\overline X}$ is transcendental if and only if σ(a)V = aV and δ(a) ∈ aV for all a ∈ K.     

The solvability conditions for inverse eigenproblem of symmetric and anti‐persymmetric matrices and its approximation

The problem of generating a matrix A with specified eigen‐pair, where A is a symmetric and anti‐persymmetric matrix, is presented. An existence theorem is given and proved. A general expression of such a matrix is provided. We denote the set of such matrices by ??????_Eⁿ. The optimal approximation problem associated with ??????_Eⁿ is discussed, that is: to find the nearest matrix to a given matrix A* by A∈??????_Eⁿ. The existence and uniqueness of the optimal approximation problem is proved and the expression is provided for this nearest matrix. Copyright © 2002 John Wiley & Sons, Ltd.