Polymers such as benzocyclobutene are commonly used as embedding materials for semiconductor nanostructures. During the curing process of the polymer up to 250 °C, a significant impact of strain can be induced on the embedded semiconductor material due to different thermal expansion coefficients. This strain has been revealed by X‐ray diffraction in free‐standing GaAs nanowires grown on a silicon substrate, embedded in a polymer matrix. It will be shown that this strain is released during the X‐ray irradiation if additionally an external static electric field is applied.
We redevelop a theoretical model that, in conjunction with atomic force microscopy (AFM), can be used as a noninvasive method for determination of the elastic modulus of a polymer nanodroplet residing on a flat, rigid substrate. The model is a continuum theory that combines surface and elasticity theories for prediction of the droplet's elastic modulus, given experimental measurement of its adsorbed height. Utilization of AFM-measured heights for relevant droplets reported in the literature and from our own experiments illustrated the following: the significance of both surface and elasticity effects in determining a polymer droplet's spreading behavior; the extent of a continuum theory's validity as one approaches the nanoscale; and a droplet size effect on the elastic modulus. 相似文献
