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351.
The effect of the electron transverse and longitudinal velocity spread at the entrance to the interaction space on wide-band chaotic oscillations in intense multiple-velocity beams is studied theoretically and numerically under the conditions of formation of a virtual cathode. It is found that an increase in the electron velocity spread causes chaotization of virtual cathode oscillations. An insight into physical processes taking place in a virtual-cathode multiple-velocity beam is gained by numerical simulation. The chaotization of the oscillations is shown to be associated with additional electron structures, which were separated out by constructing charged particle distribution functions.  相似文献   
352.
Collective spontaneous radiation of a system of two three-level V-type atoms interacting with two modes of a quantum electromagnetic field in a resonator with finite Q-factor is investigated based on the control kinetic equation for the density matrix. Time dependences of the average number of photons and radiation intensity of each mode are derived for the case in which atoms at the initial moment of time are in different excited states. __________ Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 2, pp. 78–83, February, 2006.  相似文献   
353.
The mechanism of X-ray waveguide-resonance propagation or the radiation superstream model, which can become the ground of X-ray nanophotonics, is discussed briefly. Some attention is devoted to features consideration of the simplest devices characterized by the waveguide-resonance transportation of X-ray beams. The experimental data showing the user possibilities of a simplest waveguide-resonators application for diffractometry are presented. We discuss the main reasons to improve the metrological characteristics for total reflection X-ray fluorescence (TXRF) analytical method in case when the target exciting beam is formed by a waveguide-resonator. Some problems appearing during the waveguide-resonator application are formulated.  相似文献   
354.
Transparent zinc oxide (ZnO) thin films with a thickness from 10 to 200 nm were prepared by the PLD technique onto silicon and Corning glass substrates at 350 °C, using an Excimer Laser XeCl (308 nm). Surface investigations carried out by atomic force microscopy (AFM) and X-ray diffraction (XRD) revealed a strong influence of thickness on film surface topography. Film roughness (RMS), grain shape and dimensions correlate with film thickness. For the 200 nm thick film, the RMS shows a maximum (13.9 nm) due to the presence of hexagonal shaped nanorods on the surface. XRD measurements proved that the films grown by PLD are c-axis textured. It was demonstrated that the gas sensing characteristics of ZnO films are strongly influenced and may be enhanced significantly by the control of film deposition parameters and surface characteristics, i.e. thickness and RMS, grain shape and dimension.  相似文献   
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We introduce the notions of δ-t-sets, δβ-t-sets, δ-B-continuity and δβ -B-continuity and obtain decompositions of continuity and complete continuity.  相似文献   
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