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151.
U. Weisbrod R. Gutschke J. Knoth H. Schwenke 《Fresenius' Journal of Analytical Chemistry》1991,341(1-2):83-86
Summary Single layers and layer systems on diverse substrates were measured by Total Reflection X-Ray Fluorescence (TXRF) spectrometry. The angular dependence of the fluorescence intensities at grazing incidence allows the elemental composition, density and thickness of the layers to be evaluated using model calculations. 相似文献
152.
H. Glatzel R. Schneider T. Fauster V. Dose 《Zeitschrift für Physik B Condensed Matter》1992,88(1):53-61
Inverse photoemission spectra were taken for thin epitaxial iron films on Cu(100). For a film thickness of eight monolayers the observed electronic states are characteristic for a fcc(100) surface. Thed-bands of iron show a ferromagnetic exchange splitting of 1.1 eV, considerably smaller than the bulk value of 1.8 eV, which we observe for film thicknesses above 18 monolayers. 相似文献
153.
D. J. Hartfiel 《Linear and Multilinear Algebra》1994,36(4):293-304
In this paper we consider the nonnegative matrix system ciA+uiB=ci+1 where the nonnegative matrix A is allowed to vary, within bounds. The cone control problem is to find a nonnegative matrix B such that if Ci is a nonnegative vector in a specified cone, then there is a nonnegative vector ui such that ci+1 is in that cone. We extend this problem to input control by finding a B such that the cone, generated by the rows of B, is as small as possible. Thus, the percent distribution of ∣uiB∣ through the states of the sustem by uiB is either constant or varies little. 相似文献
154.
155.
156.
V. D. Levchenko A. I. Morozov A. S. Sigov 《Journal of Experimental and Theoretical Physics》2002,94(5):985-991
Multilayer ferromagnet-layered antiferromagnet (Fe/Cr) structures frustrated because of roughness of interlayer boundaries were studied by mathematical modeling methods. The phase diagram of a three-layer system (plotted as film thickness versus the degree of roughness of the interfaces) was obtained, and the order parameter distributions in each phase were determined. The character of phase transitions in this system was studied. The applicability range of the Slonczewski magnetic proximity model was determined. 相似文献
157.
158.
A technique is proposed for improving the accuracy of the heat of fusion of semicrystalline polymers by DSC. The results of three commercially available instruments are compared. 相似文献
159.
Summary X-ray reflectivity may be used to determine the internal structure of thin polymer films. An electron density difference of 10% for polystyrene and polyisoprene is sufficient to distinguish between a random distribution of lamellae, complete orientation parallel to the substrate surface and a surface induced formation of lamellae. The disappearance of the lamellar Bragg-peaks, with heating of the film, shows the transition into the disordered state. 相似文献
160.