The Design of Single Mode Large Cross-section Glass-based Waveguides for Photonic Integrated Circuits

This paper presents our recent simulation results and novel designs of single mode large cross-section glass-based waveguides for photonic integrated circuits (PICs). Simulations were performed using an in-house Finite Difference (FD) based mode solver and the FD Beam propagation Method (FD-BPM). Our simulation results show that this innovative technology could provide a simplified means to couple optical energy efficiently between optical components in a single chip. This would provide the base for the future large-scale integration of optical components in PICs. The novel idea of using single mode large cross-section glass-based waveguides as an optical integration platform is an evolutionary innovative solution for the monolithic integration of optical components, in which the glass-based structures act both as waveguides and as an optical bench for integration. This allows easy and efficient optical coupling between optical components and optical fibres, removing costly and tedious alignment problems and considerably reducing optical coupling losses in PICs. We expect that the glass-based waveguide PICs technology will enable the emergence of a new generation of compact, reliable, high speed, and multifunctional devices.     

X-ray photoelectron spectroscopy characterization of oxidated Si particles formed by pulsed ion-beam ablation

X-ray photoelectron spectroscopy (XPS) is used to probe oxidation states of Si species in particles deposited using a pulsed ion-beam evaporation method. The effects of He ambient gas, ion beam intensity and post-treatments on the oxides composition and oxygen content have been studied. It is found that presence of He ambient gas led to a profound oxidation of Si species as compared to that prepared in vacuum at the same ion-beam ablation energy, i.e. both increase of SiO₂ component and oxygen concentration in the oxides coverage. The deposition in He also resulted in an increase of oxygen concentration even under lower ablation intensity, but a higher Si suboxides concentration. It is revealed that the reaction between Si and O was controlled by the ion beam intensity (temperature of Si plasma) and the gas ambient (collision probability of Si and O species). The difference in structure of oxide layers for samples obtained under various conditions is discussed based on the results of XPS analyses.     

On existence of solutions for some hyperbolic-parabolic-type chemotaxis systems

In this paper, we discuss the local and global existence ofweak solutions for some hyperbolic–parabolic systems modellingchemotaxis.     

High power single-frequency continuous-wave Nd:YVO4 master-oscillator power amplifier

We report a highly-efficient, high-power, single-frequency Nd:YVO₄ master-oscillator power-amplifier with near-diffraction-limited output beam quality. A diode-pumped Nd:YVO₄ ring laser incorporating a passive method for suppressing axial-mode-hopping was employed as the master-oscillator, and was amplified by a three-stage diode-end-pumped Nd:YVO₄ amplifier, yielding 79 W of output with an extraction efficiency of 29%. The overall power gain was 15 dB for an input power from the master-oscillator of 2.4 W, and the M² parameter was less than 1.5 at the maximum power. The prospects for a further increase of power and brightness via this approach are considered. PACS 42.55.Xi; 42.60.Da; 42.60.Jf     

Synthesis and magnetic properties of multilayer Ni/Cu and NiFe/Cu nanowires

Highly ordered composite nanowires with multilayer Ni/Cu and NiFe/Cu have been fabricated by pulsed electrodeposition into nanoporous alumina membrane. The diameter of wires can be easily varied by pore size of alumina, ranging from 30 to 100 nm. The applied potential and the duration of each potential square pulse determine the thickness of the metal layers. The nanowires have been characterized by transmission electron microscopy (TEM), magnetic force microscopy (MFM), and vibrating sample magnetometer (VSM) measurements. The MFM images indicate that every ferromagnetic layer separated by Cu layer was present as single isolated domain-like magnet. This technique has potential use in the measurement and application of magnetic nanodevices.     

Particle size analysis by sedimentation field flow fractionation. Performance and application

Recently commercial equipment using sedimentation field flow fractionation (SFFF) has become available for analysis of particulate materials in the sub-micron range. This paper describes the DuPont instrument and discusses its performance. A particular study is described on the comparison of the SFFF technique with that of quasi-elastic light scattering (QELS). The paper concludes that the instrument is capable of measuring particle size distributions with high resolution and precision, provided that no particles above the upper size limit — about 1 μm — are present.