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Hau-Riege SP Chapman HN Krzywinski J Sobierajski R Bajt S London RA Bergh M Caleman C Nietubyc R Juha L Kuba J Spiller E Baker S Bionta R Sokolowski Tinten K Stojanovic N Kjornrattanawanich B Gullikson E Plönjes E Toleikis S Tschentscher T 《Physical review letters》2007,98(14):145502
At the recently built FLASH x-ray free-electron laser, we studied the reflectivity of Si/C multilayers with fluxes up to 3 x 10(14) W/cm2. Even though the nanostructures were ultimately completely destroyed, we found that they maintained their integrity and reflectance characteristics during the 25-fs-long pulse, with no evidence for any structural changes over lengths greater than 3 A. This experiment demonstrates that with intense ultrafast pulses, structural damage does not occur during the pulse, giving credence to the concept of diffraction imaging of single macromolecules. 相似文献