磁控反应溅射法制备渐变折射率薄膜的模型分析

阐述了磁控反应溅射法制备渐变折射率薄膜的机理;探讨了磁控反应溅射法制备渐变折射率薄膜的理论模型,给出了渐变折射率薄膜的折射率与反应气体分压的关系,在一定的沉积参数下,由要得到的膜层折射率随膜层几何厚度的变化规律可推导出反应气体分压比随时间的变化规律;最后以制备折射率线性变化的薄膜为例说明了如何推导得到反应气体分压比随时间的变化规律. 关键词： 渐变折射率 磁控反应溅射 模型     

Wideband Antireflection Film Fabricated by Glancing Angle Deposition

Graded-index ZrO2 films has been fabricated on K9 glass by glancing angle deposition. Because the index mismatch at the interface has been reduced, the film results in wideband high-transmission antireflection. From 400nm to 1200nm, the film reflection is lower than 0.8% and the lowest value is 0.2% at 432nm.     

Antireflective characteristics of triangular shaped gratings

It is well known that conventional multi-layers are oftenused for antireflective coatings[1,2]. There are, however,only a handful of optical materials available, thus limit-ing the performance that could ideally be achieved. Onthe other hand, sub-wavelength structure surfaces, whichare surface-relief gratings with periods smaller than theincident wavelength, have been researched and foundto have antireflective properties[3,8]. Compared withstandard optical thin-film coating technologies, the h…     

Optical properties and structures of silver thin films deposited by magnetron sputtering with different thicknesses

A series of thin Ag films with different thicknesses grown under identical conditions are analyzed by means of spectrophotometer. From these measurements the values of refractive index and extinction coefficient are calculated. The films are deposited onto BK7 glass substrates by direct current (DC) magnetron sputtering. It is found that the optical properties of the Ag films can be affected by films thickness. Below critical thickness of 17 nm, which is the thickness at which Ag films form continuous films, the optical properties and constants vary significantly with thickness increasing and then tend to a stable value up to about 40 nm. At the same time, X-ray diffraction measurement is carried out to examine the microstructure evolution of Ag films as a function of films thickness. The relation between optical properties and microstructure is discussed.     

二极管伏安特性曲线测试电路的改进

指出了文献中所给出的伏安法测二级管特性曲线电路存在的问题，并给出了改进电路。     

H^＋注入锗酸铋晶体表面层的性质

Ｈ＾＋注入锗酸铋（Ｂｉ４Ｇｅ３Ｏ１２或ＢＧＯ）晶体引起某些效应，如辐射损伤，光学吸收和近表层区域的晶体分解。经Ｈ＾＋注入后，ＢＧＯ晶体的颜色变成棕色，但实验中证实不了该变化是由色心的产生所引起。此外，实验中也示观察到Ｈ＾＋注入ＢＧＯ晶体中有离子束诱发的光学活性变化。可见在注入过程中，未发生从Ｂｉ４Ｇｅ３Ｏ１２转变到Ｂｉ１２ＧｅＯ２０的结构相变，由此预见，注入过程中可能发生离子束引起的晶体分解。Ｈ＾     

任意二次型双曲面扁薄壳的基本解

本文对任意二次型双曲面扁薄壳的八阶偏微分方程采用平面波分解和小参数法导出了它的基本解。 在基本解的基础上,本文还得出边界为无限大时薄壳在集中荷载作用下的格林函数,适用于以边界积分方程法来分析具有任意边界条件的这类薄壳结构在任意荷载作用下的位移与内力,与一般有限单元法相比,它能较大的地节省计算机的内存和缩短分析时间。     

电子产品的模糊随机统计

电子产品,如电视机、收音机、录音机等,都是由成千上万个元器件组成的每一种元器件都有好或坏的问题.为了保证最终产品的质量,工厂从设计、生产到销售的各个环节,都有严格的质量管理制度,从而也日复一日、年复一年地进行着大量的统计.传统的统计方法和理论是建立在事件的随机性上的,但客观事物往往还有“模糊性”的一面. 一、模糊概率的概念 传统的概率论只研究事件的随机性.如某生产流水线的合格品率是99%,即任意抽取一件产品,有99%的可能抽到合格品.这里,“事件”是确定的。抽到合格品,但事件的出现与否是不确定的:有99%的可能出现,也有1%…     

NORMAL COORDINATE TREATMENT OF COMPLEXES OF LANTHANIDE NITRATES WITH CROWN ETHER

In this paper, by using point mass model, the normal coordinate lanalysis calculations of La(15-C-5) (NO_3~-)_3 and La (18-C-6) (NO_3~-)_3 are performed to give theoretical results in agreement with frequencies and intensities of infrared and Raman bands. In the calculations, the same force constants with respect to the two molecules are adopted and some internal coordinates which are less important are neglected. Furthermore, the properties of coordination bonds, approximation calculation method and other related problems are discussed.     

稀土复合氧化物催化剂中镧、钙、锰的测定

稀土复合氧化物催化剂中镧、钙、锰的含量分析,目前,已有人做过工作。方法之一,控制pH分离镧、锰后,用EDTA络合滴定钙的含量,再在磷酸介质中用硫酸亚铁法分析锰量,差减法计算镧的含量;方法之二,利用离子交换法分离镧、钙、锰,再采用络合滴定分别测镧、钙、锰含量。两种方法共同存在的问题是手续冗长,费时。其中方法