Ge薄层异质结构的同步辐射X射线反射法研究

用X射线反射方法研究了分子束外延技术生长的Si中Ge薄层异质结构的Ge原子分布特性．根据X射线反射理论及Parratt数值计算方法对实验反射曲线的模拟,得到不同厚度的Ge薄层异质结构样品中Ge原子的深度分布为非对称指数形式：在靠近样品表面一侧的衰减长度为8埃,而在靠近样品衬底一侧的衰减长度为3埃,且分布形式与Ge原子层的厚度无关。讨论了不同结构参数(Ge原子薄层的深度、Ce原子分布范围、样品表面粗糙度、样品表面氧化层厚度等)对样品低角反射曲线的影响．     

Ge薄层异质结构的同步辐射X射线反射法研究

用X射线反射方法研究了分子束外延技术生长的Si中Ge薄层异质结构的Ge原子分布特性.根据X射线反射理论及Parratt数值计算方法对实验反射曲线的模拟,得到不同厚度的Ge薄层异质结构样品中Ge原子的深度分布为非对称指数形式:在靠近样品表面一侧的衰减长度为8埃,而在靠近样品衬底一侧的衰减长度为3埃,且分布形式与Ge原子层的厚度无关.讨论了不同结构参数(Ge原子薄层的深度、Ge原子分布范围、样品表面粗糙度、样品表面氧化层厚度等)对样品低角反射曲线的影响.     

硅基底生长FeS2薄膜的同步辐射表面X射线实验研究

通过对硅与玻璃衬底生长二硫化铁薄膜的常规X射线衍射和同步辐射表面X射线衍射研究比较, 结果发现, 硅衬底上生长二硫化铁薄膜时, 图谱中56°,附近出现的衍射强峰并不是由于二硫化铁与硅有良好的晶格匹配导致的, 而是由于硅衬底(311)晶面的衍射造成的. 结合实验与计算论证了该结论.     

Microstructural stability of NiO-containing spin valves annealed at room temperatur

Microstructure of NiO-containing Co/Cu/Co spin valves （CCC-SV） annealed at room temperature for nearly four years has been studied by synchrotron radiation X-ray diffraction. With the annealing time expanding, the thickness of each sub-layer remains nearly unchanged while the interface roughness varies obviously compared with that of samples without annealing. The roughness at the interface of NiO/Co decreases with the annealing time increasing for both of the samples with NiO layer on the top （TSV） and under the bottom （BSV） of CCC-SV. On the other hand, the roughness at Co/Cu interface increases with the annealing time expanding for BSV while it decreases for TSV. These results indicate that the structure of TSV is more stable than that of BSV.     

High resolution X-ray diffraction investigation of epitaxially grown SrTiO3 thin films by laser-MBE

SrTiO3 thin films are epitaxially grown on DyScO3, LaAlO3 substrates with/without buffer layers of DyScO3 and SrRuO3 using laser-MBE. X-ray diffraction methods, such as high resolution X-ray diffraction, grazing incident X-ray diffraction, and reciprocal space mapping are used to investigate the lattice structure, dislocation density, in-plane lattice strain distribution along film thickness. From the measurement results, the effects of substrate on film lattice quality and microstructure are discussed.     

全反射X射线荧光分析在生物医学中的应用

介绍了利用北京同步辐射实验室的全反射X射线荧光谱仪测量生物细胞样品的可行性.并用此谱仪测量了正常的和受辐照的小白鼠小肠细胞的痕量元素含量,发现K、Ca、Fe等元素含量有明显的提高,Cu元素含量明显降低,Mn元素含量变化不大,Zn元素含量基本稳定,并讨论了其在临床医学上的重要价值.     

Cr-Doped InAs Self-Organized Diluted Magnetic Quantum Dots with Room-Temperature Ferromagnetism

Cr-doped InAs self-organized diluted magnetic quantum dots （QDs） are grown by low-temperature molecularbeam epitaxy. Magnetic measurements reveal that the Curie temperature of all the InAs：Cr QDs layers with Cr/In flux ratio changing from 0.026 to 0.18 is beyond 400 K. High-resolution cross sectional transmission electron microscopy images indicate that InAs：Cr QDs are of the zincblende structure. Possible origins responsible for the high Curie temperature are discussed.     

液氮冷却劳厄晶体单色器的热力耦合研究

针对高能同步辐射光源工程材料线站研制的劳厄晶体单色器上受光压弯晶体光学元件,利用有限元方法模拟计算了具有各向异性和低温材料非线性的硅晶体的压弯面形和热变形,计算结果显示硅晶体精确三维点云体载荷的最高温低于面吸收并且体吸收的热变形呈现出非对称性,同时精确给出了压弯和热变形导致晶体变形数据,为束线后续衍射动力学追迹模拟评估对光斑性能的影响提供更加真实可靠的保证。