排序方式： 共有118条查询结果，搜索用时 15 毫秒
81.
详细给出了软Ｘ光多层膜位相型矩形光栅的实验，分析测试结果以及在北京国家同步辐射实验室测得的光学衍射特性，并进行了分析。 相似文献
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同步辐射光源中的高次谐波会使透射光栅衍射效率标定精度变差。为了校正光源中的高次谐波对透射光栅衍射效率标定的影响,提出了一种光源存在弱谐波情况下的透射光栅衍射效率标定方法,通过使用谐波X射线的衍射效率修正基波衍射效率标定中谐波的影响,从而得到更为准确的透射光栅衍射效率。使用该标定方法在北京同步辐射光源上开展了透射光栅相对衍射效率标定工作。实验结果表明:在100~800eV存在高次谐波能段,修正后透射光栅一级与零级的相对衍射效率与理论模拟结果吻合较好,修正后光栅二级与一级的相对衍射效率更接近理论模拟结果,但与理论模拟结果仍有较大偏差,该偏差主要来源光栅较弱的二级衍射。 相似文献
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用国产BWS-5kII型皮秒扫描相机测量了北京正负电子对撞机(BEPC)上极端相对论性运动正负电子束团产生的同步辐射光脉冲的时间结构、光脉冲长度与电子束流强度以及射频源电压的关系.当负电子束流强度由2mA增加到30mA时,光脉冲长度由220ps增加到670ps;在20mA电子束流强度条件下,射频源电压由250kV增加到500kV时,光脉冲长度在500ps到700ps范围内变化.测量系统的时间分辨率为30ps;时间刻度误差±15%,触发晃动小于±200ps. 相似文献
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Four factors (the interface roughness, the monotonous thickness drift, the interdiffusion between two layers and the change of extinction coefficients) which may affect the multilayer mirror reflectivity in soft X-ray region are investigated. Some conclusions are obtained by our theoretical analysis. In long wavelength region (λ> 12nm), the change of extinction coefficients is the main cause reducing the multilayer mirror reflectivity and others (excluding the interface roughness) only shift the peak position. In short wavelength region (λ<10nm), all the four factors affect the reflectivity. In addition, the two factors, monotonous thickness drift and interdiffusion between two layers, shift the peak position. To check these conclusions, the measurement of a Nb/Si multilayer mirror fabricated by our magnet sputtering system is performed on an X-ray generator and a reflectometer installed on the Beijing Synchrotron Radiation Facility. The experimental results are in good agreement with our calculations, and the reflectivity up to 32 % of the Nb/Si multilayer mirror (with 41 layers and at wavelength 17.59nm) is attained. 相似文献
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在北京同步辐射装置3WlB光束线上,对天文观测用超软X射线(0.2keV-3．5keV)正比计数管探测器进行了系统地标定．得到了正比计数管的死时间、计数率坪曲线、能量线性、能量分辨、窗材料透过比曲线;借助于已标定过的光电二极管探测器,测量了正比管探到器的能量响应效率,标定不确定度在10％一18％之间．另外,还对正比管系统在卫星上的六道记录和在实验室里的多道记录进行了对比,两种记录方式符合得很好． 相似文献
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The photo-absorption cross section of aluminum was obtained from the ratio of transmission of aluminum thin-films with different area densities from 50 to 250eV with synchrotron radiation monochromatic beam. Two samples with different area densities were used to minimize the uncertainty caused by the sample surface oxidation and systematic factors of the X-ray source, beamline, and detector. The experimental results are in good agreement with the published data and FEFF program calculations in general. 相似文献
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