Erratum to“Fabrication of Tl2Ba2CaCu2O8 superconducting films without thallium pellets

The rocking curve of Tl-2212 thin films in Fig.2 of our original paper[1]should be replaced with the following new one.Accordingly,in the fifth paragraph of Section 3 of the original paper,the statement“The full width at half maximum(FWHM)of the(0012)peak of the Tl-2212 phase is about 0.24°”should be“The full width at half maximum(FWHM)of the(0012)peak of the Tl-2212 phase is about 0.42°”.     

蓝宝石基片上制备双面Tl_2Ba_2CaCu_2O_8超导薄膜

在蓝宝石基片上,以CeO2为缓冲层制备了高质量的双面Tl2Ba2CaCu2O8(Tl-2212)超导薄膜。以金属铈靶作为溅射源生长了c轴取向的CeO2缓冲薄膜,并对CeO2薄膜进行了高温处理,有效改善了其结晶质量和表面形貌。采用两步法制备了双面的Tl-2212超导薄膜。XRD测试显示,薄膜为纯的Tl-2212相,且其晶格c轴垂直于衬底表面。超导薄膜的Tc为106K,Jc(77K,0T)为3.5MA/cm2,微波表面电阻Rs(77K,10GHz)为390μΩ。     

热处理对MgO基片的表面形貌以及对CeO_2和Tl-2212薄膜生长的影响

研究了MgO基片在高温退火时表面形貌和表面结构的变化,以及它对CeO2缓冲层和Tl-2212超导薄膜生长的影响。原子力显微镜(AFM)研究表明,在流动氧环境中1100℃温度下退火,MgO的表面首先由未退火时的皱褶形貌,演化为光滑表面,随着退火时间的延长,表面形貌最终演化为具有光滑基底的独立生长峰结构。XRD测试表明,通过高温热处理可以大幅度提高MgO基片表面结晶的完整性。在1100℃温度下热处理8小时的MgO基片上可以生长出具有高度c轴取向的CeO2(001)缓冲层。然后在此缓冲层上制备了厚度为500nm的外延Tl-2212超导薄膜,其临界转变温度(Tc)达到108.6K,液氮温度下临界电流密度(Jc)为2.8mA/cm2,微波表面电阻Rs(77K,10GHz)约为360.9μΩ。     

高温超导薄膜生长机理初探

在3×10×0.5mm3的LaAlO3(001)基片上,利用直流磁控溅射生长一层厚度约为700nm的非晶态Tl2Ba2CaCu2Ox先驱薄膜.将先驱薄膜与热处理过的Tl2Ba2Ca2Cu3Oy块材(作为Tl源)一起在720～860℃温度下退火.为了研究薄膜的初期成核情况,退火时间一般为5分钟.利用XRD和完全抗磁性测试方法对样品的成相情况进行研究,结果显示,在薄膜生长的初期,较高的退火温度可以获得较大尺寸的初期生长核,但是退火温度达到860℃时,初期成核的晶粒尺寸变小.     

在RABiTS基带上制备Tl-2212超导薄膜

我们研究了Tl-2212超导薄膜在带有YSZ/CeO2缓冲层和带有CeO2/YSZ/CeO2缓冲层的Ni金属RABiTS基带上的生长情况.基带上的缓冲层是采用PLD方法制备的,Tl-2212薄膜的制备采用了磁控溅射和后热处理两步方法.XRD 实验结果表明,Tl-2212薄膜都具有很好的c轴垂直于膜面的织构,并具有双向外延生长特性.在CeO2/YSZ/CeO2/Ni基带上制作的Tl-2212薄膜的Tc达到102.8 K,Jc(77K,0T)达到2.6 MA/cm2;在YSZ/CeO2/Ni基带上薄膜的Tc可达97.7K,Jc (77K,0T)也可以达到0.45MA/cm2.     

Energy gap suppression and excess current in Tl_2Ba_2CaCu_2O_8 intrinsic Josephson junctions

Intrinsic Josephson junctions in misaligned Tl2Ba2CaCu2O8 thin film were fabricated on LaAlO3 substrate. The temperature dependence of the critical current is investigated around liquid nitrogen temperature. In the current voltage characteristic, large voltage jump and lack of resistive branch are observed, which shows good consistency with the intrinsic Josephson junctions. By analyzing the large gap voltage in the curve, great suppression of the energy gap is found. Through discussing the temperature dependence of the gap voltage in liquid nitrogen temperature, it is shown that this phenomenon can be caused by the non-equilibrium quasiparticle injection. The temperature influence on the excess current also confirms the non-equilibrium effect.     

Tl2Ba2CaCu2O8薄膜高温超导滤波器研制

开发了一种基于模型的高温超导滤波器仿真设计方法和一种紧凑的组群式G型谐振器结构,研制出了用于WCDMA系统上的带宽为20MHz中心频率为1950MHz的8阶高温超导滤波器.该滤波器由Tl2Ba2CaCu2O8薄膜制作而成,制作在LaAlO_3衬底上,尺寸大小仅为26mm×18mm.实测结果显示滤波器的最小插入损耗为0.25dB,带外抑制大于70dB,回波损耗好于-16dB,实测的滤波器带宽、中心频率以及边带陡峭度也与仿真设计结果吻合很好,验证了设计方法和制作工艺的准确性.     

Fabrication of Tl_2Ba_2CaCu_2O_8 superconducting films without thallium pellets

A new improved two-step method in fabricating Tl_2Ba_2 CaCu_2O_8(Tl-2212) thin films is presented in this paper. In the first process of dc magnetron sputtering, the thallium content in the precursor film is largely increased by adjusting the ratio of thallium in the sputtering targets. After the second annealing process in the absence of additional thallium pellets or powder source, high-quality Tl-2212 thin films can be obtained. The proper content of thallium in the precursor film provides a relatively stable atmosphere to guarantee the growth of Tl-2212 film. This method avoids the repeated production of the thallium pellets in the post-annealing process, the repeatability and controllability of the experiment are greatly improved. X-ray diffraction(XRD) scans show that all of the sharp peaks of the sample films can be assigned to the(00 l) peaks of Tl-2212 phase. The highest superconducting critical temperature(Tc) of the films is 105 K and the critical current density(Jc) can achieve 1.93 MA/cm2 in zero magnetic field at 77 K for a 600 nm film.     

Inductance of Long Intrinsic Josephson Junction Arrays Composed of Misaligned Tl2Ba2CaCu2O8 Thin Films

We observe and measure the inductance of long intrinsic Josephson junction arrays composed of misaligned Tl2Ba2CaCu2O8 thin films grown on LaAlO3 substrates. The array consists of about 9.1 × 10^3 intrinsic Josephson junctions, where 90° phase shift between ac voltage across the array and ac current flowing through has been measured. Furthermore, the voltage is proportional to the frequency of the current. The measured inductance values of the intrinsic Josephson junction arrays are basically consistent with the theoretically calculated results, confirming that the inductance is mainly due to the Josephson effect. The dependence of the array inductance on its critical current is also discussed.     

高温退火对蓝宝石基片的表面形貌和对CeO2缓冲层以及Tl-2212超导薄膜生长的影响

研究了蓝宝石(1102)基片在不同温度和时间下退火时表面形貌和表面相结构的变化,以及它对CeO₂缓冲层和Tl-2212超导薄膜生长的影响.原子力显微镜(AFM)研究表明,在流动氧环境中1000℃温度下退火,蓝宝石(1102)的表面首先局部区域形成台阶结构,然后表面形成叠层台阶结构,随着退火时间的延长,表面发生了台阶合并现象,表面形貌最终演化为稳定的具有光滑平台的宽台阶结构.XRD测试表明,通过高温热处理可以大幅度提高蓝宝石基片表面结构的完整性.在1000℃温度下热处理20 h的蓝宝石 关键词： Tl-2212超导薄膜 蓝宝石 缓冲层