金纳米粒子/石墨烯量子点复合修饰电极检测NO_(2)^(-)北大核心CSCD

采用微波加热石墨烯量子点还原HAuCl_(4)的方法,制备金纳米粒子/石墨烯量子点(AuNPs/GQDs)复合物,并将其应用于构建具有高灵敏度的NO_(2)^(-)电化学传感器。由于GQDs大的比表面积和AuNPs良好的导电能力,合成的AuNPs/GQDs复合材料显著提高了NO_(2)^(-)的电化学响应。利用循环伏安法研究NO_(2)^(-)在AuNPs/GQDs修饰电极上的电化学性质,发现在电位1.22 V处出现一个明显的氧化特征峰,其氧化峰电流与NO_(2)^(-)浓度成线性关系,线性范围为1.0×10^(-7)~1.0×10^(-5) mol/L,检测限(S/N=3)为5.0×10^(-8) mol/L。将该方法应用于土壤中NO_(2)^(-)的检测,具有较好的准确度。     

核酸适配体传感器在黄曲霉毒素B1检测中应用研究进展北大核心CSCD

核酸适配体作为一种新型识别分子,具有亲和力高、稳定性强、制备成本低、特异性强等优点,但其自身不具有信号转换功能,它与靶标分子特异性结合过程,不可产生被检测的物理化学信号。因此,需将核酸适配体与靶标分子特异性识别结合过程转为易于被检测的物理化学信号变化的过程。根据信号转换方式的不同,可将适配体生物传感器分为荧光适配体传感器、比色适配体传感器、电化学适配体传感器和表面拉曼散射适配体传感器。本文对基于以上4种检测信号的核酸适配体生物传感器在黄曲霉毒素(AFB1)检测方面的应用进行综述,并概述该类传感器应用前景和当前面临的挑战。     

高效液相色谱-二极管阵列检测法测定小麦粉及面粉改良剂中福美双

福美双是重要的二硫代氨基甲酸酯(DTC)杀菌剂,在小麦中使用限量以1 mg/kg二硫化碳(CS₂)计。目前我国相关检测方法是针对二硫代氨基甲酸酯一类的化合物,二硫代氨基甲酸酯通过与酸反应生成CS₂,采用光谱法或色谱法测定CS₂,间接实现二硫代氨基甲酸酯测定。该方法无法特异性实现对福美双的检测,因此开展小麦粉中福美双检测方法的研究具有重要意义。研究建立了高效液相色谱-二极管阵列检测(HPLC-DAD)测定小麦粉及面粉改良剂中福美双的分析方法。小麦粉及面粉改良剂样品用乙腈溶剂提取后,经涡旋、振荡、冰水浴超声和静置后取上清液过滤,供高效液相色谱测定。采用ZORBAX plus-C18色谱柱(150 mm×4.6 mm, 5 μm)分离,以水-乙腈为流动相洗脱分析,在波长280 nm下检测。实验优化了提取溶剂及其体积、振荡超声条件、色谱柱、检测波长、流动相等条件。该方法采用保留时间和紫外光谱图定性,外标法定量。该方法在线性范围内(0.30~30.0 μg/mL)线性关系良好,相关系数(r²)为0.99999。对小麦粉及面粉改良剂进行1.5、3.0、15 mg/kg 3个水平的加标回收试验,福美双的回收率为89.6%~98.3%,相对标准偏差为1.6%~3.9%(n=6)。方法的检出限和定量限分别为0.5 mg/kg和1.5 mg/kg。该方法采用溶剂提取,操作简单,分析时间短,特异性好,具有精密度高、重复性好、检出限低等特点,适用于小麦粉及面粉改良剂中福美双快速、准确的定量检测。     

分光计调整方法的改进及白光色散研究

普通物理实验中使用分光计观察白光散射,测量三棱镜顶角,最小偏向角等。但在测量前需借助三棱镜调整分光计,有人通过理论分析发现传统的调节方法存在误调和误差,并提出了改进的实验调整方法。本文我们通过实验来验证该方法是否可行,并在实验中发现了其它的问题。     

对硝基苯酚分子印迹聚合物最佳功能单体的筛选及其水样固相萃取中的应用

以对硝基苯酚(4-NP)为对象,采用非印迹聚合物(NIP)库筛选法选出乙烯基咪唑为最佳功能单体,通过实验选出乙腈为最合适的聚合溶剂、三甲氧基丙基三甲基丙烯酸酯(TRIM)为交联剂制备分子印迹聚合物。对固相萃取进行了优化,用pH=2.5的磷酸盐缓冲溶液上样、体积比为45∶55的乙腈和磷酸盐缓冲溶液淋洗、甲醇洗脱条件下,聚合物具有最佳印迹效果。4-NP分子印迹聚合物的表观吸附量达到5.8 mg/g。该印迹聚合物对4-NP及其结构类似物苯酚和对氯苯酚的萃取回收率分别为96.0%、78.8%和77.8%,表明具有较高的选择性,还成功地用于自来水样品中4-NP的固相萃取,回收率达到93.1%。由此可得该方法快速、有效,可用于分子印迹聚合物优化制备。     

Characteristics of Sn-Doped Ge2Sb2Te5 Films Used for Phase-Change Memory

Sn-doped Ge2Sb2Te5 thin films deposited on Si（100）/SiO2 substrates by rf magnetron sputtering are investigated by a differential scanning calorimeter, x-ray diffraction and sheet resistance measurement. The crystallization temperatures of the 3.58 at.%, 6.92 at.% and 10.04 at.% Sn-doped Ge2Sb2Te5 thin films have decreases of 5.3, 6.1 and 0.9℃, respectively, which is beneficial to reduce the switching current for the amorphous-to-crystalline phase transition. Due to Sn-doping, the sheet resistance of crystalline Ge2Sb2Te5 thin films increases about 2-10 times, which may be useful to reduce the switching current for the amorphous-to-crystalline phase change. In addition, an obvious decreasing dispersibility for the sheet resistance of Sn-doped Ge2Sb2Te5 thin films in the crystalline state has been observed, which can play an important role in minimizing resistance difference for the phase-change memory cell element arrays.     

Single Cell Element of Chalcogenide Randoul Access Memory Fabricated with the Focused Ion Beam Method

A singie cell element of chalcogenide random access memory was fabricated by using the focused ion beam method.The contact size between the Ge2Sb2Te5 Phase change film and the top electrode film is about 600nm (diameter) and the contact area is caiculated to be 0.28μm^2.The thickness of the phase change film is 83nm.The current-voltage characteristics of the cell element are studied using the home-made current-voltage tester in our laboratory.The minimum threshold current of about 0.6mA is obtained.     

工业X射线机的射束均匀性检验

在与法国某公司的合作项目中,对射线机的性能做了充分的评估,针对工业X射线机射束均匀性的检验给出了实验内容、过程和结果分析。实验所用射线机分别为ISOVOLT320/13与XYD-225/10,两台设备的实验结果均符合该公司质控文件规定,满足黑度差不超过0.3的要求。定期对射线机进行射束均匀性检验,将有利于监测射线机的工作状态,以保证检测工作的准确性和一致性。     

A Simple Model for Measuring Refractive Index of a Liquid Based upon Fresnel Equations

Due to many experimental data required and a lot of calculations involved, it is very complex and cumbersome to model prism-based liquid-refractive-index-measuring methods. We develop a new method of mathematical modelling for measuring refractive index of a liquid based upon the Fresnel formula and prism internal reflection at an incident angle less than the critical angle. With this method, only two different concentrations measurements for a kind of solution can lead to the determination of computational model. Measurements are performed to examine the validity of the theoretical model. Experimental results indicate the feasibility of the theoretical model with an error of 1%. The method is also capable of measuring even smaller changes in the optical refractive index of the material on a metal surface by the surface plasma resonance sensing techniques.     

Development of the Technique for Fabricating Submicron Moire Gratings on Metal Materials Using Focused Ion Beam Milling

A focused gallium ion （Ga＋） beam is used to fabricate micro/submicron spacing gratings on the surface of porous NiTi shape memory alloy （SMA ）. The crossing type of gratings with double-frequency （25001/mm and 50001/mm） using the focused ion beam （FIB） milling are successfully produced in a combination mode or superposition mode. Based on the double-frequency gratings, high-quality scanning electron microscopy （SEM） Moird patterns are obtained to study the micro-scale deformation of porous NiTi SMA. The grating fabrication technique is discussed in detail. The experimental results verify the feasibility of fabricating high frequency grating on metal surface using FIB milling.