From holes to sponge at irradiated Ge surfaces with increasing ion energy—an effect of defect kinetics?

We show that hole patterns and sponge-like layers at irradiated Ge surfaces originate from the same driving force, namely the kinetics of ion beam induced defects in the amorphous Ge surface layer. Ge hole patterns reported earlier for irradiation with low energy (5 keV) Ga⁺ ions were reproduced for low energy Bi⁺ but also for Ge⁺ self-irradiation, which proves that the dominating driving force for morphology evolution cannot originate from the implanted impurities. At higher ion energies the well-known formation of sponge-like Ge surface layers after heavy ion irradiation was found for Bi⁺ irradiation and Ge⁺ self-irradiation, also. The transition from smooth surfaces via hole patterns to sponge-like morphologies with increasing ion energies was studied in detail. A model based on the kinetics of ion beam induced defects was developed and implemented in 3D kinetic Monte Carlo simulations, which reproduce the transition from hole patterns to sponge-like layers with increasing ion energy.     

The Formation of Pd Nanocrystals from Pd2(dba)3 Microcrystals

As‐grown platelets formed from tris‐(dibenzylideneacetone) dipalladium(0) [Pd₂(dba)₃] precursor in the presence of Pd17 RNA are investigated before and after thermal annealing. Results show that as‐grown platelets are disordered crystals of Pd₂(dba)₃ containing 1?2 nm Pd clusters and platelets grown in the absence of RNA are morphologically and structurally similar to those formed with RNA. The initially formed crystals are so sensitive to environmental variables that the degree of crystallinity can not be determined accurately by electron diffraction. X‐ray crystallography on as‐grown platelets gives a crystal structure consistent with Pd₂(dba)₃, but reveals a composition of ≈Pd_1.07(dba)₃, indicating one Pd atom in Pd₂(dba)₃ is lost from the structure. Both electron beam and thermally induced decomposition of as‐grown Pd₂(dba)₃ platelets having a hexagonal habit on the micrometer scale produces elemental Pd platelets having a hexagonal habit on the nanometer scale. These hexagonal platelets are composed of a partially sparse form of Pd₂(dba)₃ that is initially crystalline but rapidly degrades due to the loss of Pd atoms from organic ligand cages. Once released, Pd atoms aggregate to form Pd clusters, which grow and transform into well‐formed Pd nanocrystals under electron‐beam irradiation or through thermal annealing.     

Advanced Genetic Programming Based Machine Learning

A Genetic Programming based approach for solving classification problems is presented in this paper. Classification is understood as the act of placing an object into a set of categories, based on the object’s properties; classification algorithms are designed to learn a function which maps a vector of object features into one of several classes. This is done by analyzing a set of input-output examples (“training samples”) of the function. Here we present a method based on the theory of Genetic Algorithms and Genetic Programming that interprets classification problems as optimization problems: Each presented instance of the classification problem is interpreted as an instance of an optimization problem, and a solution is found by a heuristic optimization algorithm. The major new aspects presented in this paper are advanced algorithmic concepts as well as suitable genetic operators for this problem class (mainly the creation of new hypotheses by merging already existing ones and their detailed evaluation). The experimental part of the paper documents the results produced using new hybrid variants of Genetic Algorithms as well as investigated parameter settings. Graphical analysis is done using a novel multiclass classifier analysis concept based on the theory of Receiver Operating Characteristic curves. The work described in this paper was done within the Translational Research Project L282 “GP-Based Techniques for the Design of Virtual Sensors” sponsored by the Austrian Science Fund (FWF).     

Comparison of 3D Surface Reconstruction Data from Certified Depth Standards Obtained by SEM and an Infinite Focus Measurement Machine (IFM)

The Scanning Electron Microscope (SEM) is an excellent tool for the characterization of surfaces. In order to evaluate the accuracy of the reconstruction of a 3D dataset, a known depth standard for tactile depth measurement devices with a step height of 92 μm was investigated by SEM. The reconstruction of surfaces using two tilted images (StereoCreator) or three different tilted images (TriCreator) is affected by the tilt angle itself, the image resolution and the working distance. We compare the results of the obtained data from different combinations of tilt angles and working distances in relation with the type of reconstruction…. To compare the accuracy and reliability of the 3D datasets from the new Infinite Focus Measurement Machine (IFM) with the datasets reconstructed from the well known SEM technique, we utilized a groove standard with six trapezoidal grooves with known width and depth certified by the PTB – Braunschweig – Germany (Physikalisch – Technische Bundesanstalt Braunschweig – calibration mark 035PTB04 – measured with a traceable stylus instrument according to DIN EN ISO 3274). The great advantage of the SEM/ESEM (Environmental Scanning Electron Microscope) and IFM technique compared to tactile-profile-measurement instruments is that it is a non-tactile and a non-destructive method. The potential and accuracy of these methods in comparison to tactile measurement systems is shown and discussed in this paper.