Proximity effect in superconductor/ferromagnet layered system: Influence of superconductivity on magnetic properties of Nb/Fe epitaxial bilayers

Magnetic and superconducting properties of Fe/Nb epitaxial bilayers have been studied. Single crystal Fe/Nb (110) bilayers with a Nb thicknessd _Nb in the range from 250 to 650 Å and with a Fe thicknessd _Fe in the range from 7 to 27 Å were prepared using molecular beam epitaxy techniques. Magnetization measurements showed the existence of a magnetically “dead” Fe-interface layer with a thicknessd _NM varying strongly with minor modifications of the growth conditions. For bilayers with a small magnetic layer thicknessd _M and a smalld _NM the FMR measurements revealed an anomalous decrease of the effective magnetization 4πM _eff of the ferromagnetic Fe layer below the superconducting transition temperatureT _c. The absolute change of 4πM _eff belowT _c depends strongly on the actual values ofd _M andd _NM: upon decreasing bothd _M andd _NM the effect increases considerably. As a possible mechanism for the anomalous temperature dependence of 4πM _eff belowT _c we discuss a spatial modulation of ferromagnetic order due to a modification of the RKKY inter-action in the superconducting state.     

Inclusive\bar K^{0*} (892) andK 0*(892) production on silicon by 200 GeVK − andπ −

The production of the neutralK ^? (892) resonances by 200 GeVK ^? andπ ^? has been studied over the kinematic range 0.0<x _f<1.0 andp _t ² <5.0 GeV². Longitudinal and transverse momentum distributions are presented. In addition the decay angular distributions inK ^? fragmentation to \(\bar K^{0*} \) have been investigated.     

High dose iron implantation into silicon and metals

High dose implantations of Fe into metals and semiconductors have been performed with beam energies up to 1 MeV at the UNILAC-injector at GSI. Unusual high concentrations of 70 atomic % for Si and 20 atomic % for Cu have been obtained, with doses of 10¹⁸ Fe/cm² in the case of Si and several 10¹⁷ Fe/cm² in the case of Cu. For Si the thickness of the layers were determined by Rutherford backscattering to be 4500 Å. These results are consistent with calculations, which show that these high concentrations are due to the reduction of the sputter yield at the relative high particle energies. Samples have been characterized using several complementary methods (Mössbauer Spectroscopy (MS), Rutherford Backscattering Spectroscopy (RBS), Auger electron Spectroscopy (AES). Scanning Electron Microscopy (SEM), X-ray diffraction (XRD)).     

Rectangular convexity of convex domains of constant width

An E R ² is r-convex if for every x, y E there exists a closed rectangle R such that x, y R and R E. Several results about r-convexity appeared in [1]. Its authors formulated a conjecture about conditions for a compact, convex set in R ² to be r-convex. We prove this conjecture in the case of convex domains of constant width.