基于薄板样条插值法的MEMS陀螺仪温度补偿模型辨识

MEMS陀螺仪以其优异的性能及廉价的成本,被广泛地应用于水下航行器中;然而传感器的温度变化严重影响测量精度,因此,对其温度补偿模型准确辨识具有重要意义。本文利用基于可持续激励准则的快速标定算法获取标定参数,然后利用薄板样条插值方法建立MEMS陀螺仪温度补偿模型,并将该方法辨识结果与多项式拟合算法的辨识结果进行对比,实验验证,利用本文所提出算法辨识得到的传感器温度补偿模型,有效改善了MEMS陀螺仪测进精度。     

三维荧光光谱结合交替惩罚三线性分解同时对水中三种酚类测定

酚类化合物对动植物机理有着严重危害,利用三维荧光光谱结合交替惩罚三线性分解（APTLD）算法,完成了不含干扰物和干扰物共存时激发-发射荧光光谱重叠严重的麝香草酚、对苯二酚和苯酚的直接快速准确定性、定量分析。研究了温度对三种酚类化合物荧光强度的影响。对扫描所得激发-发射矩阵信号（EEM）进行二次去散射和光谱校正预处理,最大程度保留了原光谱信息,避免光谱严重失真。将APTLD算法与平行因子（PARAFAC）和交替三线性分解（ATLD）算法进行对比,突显该算法的优势。实验得出,APTLD算法能够较好的解析荧光光谱数据的重叠峰,分别得到三种目标分析物的荧光光谱,实现快速定性分析;定量分析时平均回收率为（97.4±4.5）%~（103.1±3.0）%;预测均方根误差（RMSEP）低于1.664×10-2 μg·mL-1,且检测限低于国家标准;处理过程简洁快速,为水环境中酚类化合物实现现场检测和在线实时监测提供了有力依据。     

宽光谱膜厚监控系统中光谱实时测量技术研究

 在宽光谱膜厚监控系统中,利用光栅光谱仪分光,线阵CCD接收,完成光谱的一次性快速扫描来控制膜层厚度,达到实时监控的要求。而系统光谱扫描的准确性,直接影响膜厚实时监控的有效性。为了得到准确的光谱信息,首先确定CCD像素和光波波长的对应关系,基于特征谱线的离散关系,采用最小二乘拟合法建立了光谱标定函数,经实验,标定波长均方根误差为0.037 nm;对于CCD实时输出的光谱监控信号,利用小波阈值优化算法抑制信号中的随机噪声,保留了光谱信号的细节成分,峰值误差的最大值为1.0%,峰位误差的最大值为0.3%,满足了监控中光谱分辨率的要求。     

Electronic Structures of Wurtzite GaN with Ga and N Vacancies

The electronic band structures of wurtzite GaN with Ga and N vacancy defects are investigated by means of the first-principles total energy calculations in the neutral charge state. Our results show that the band structures can be significantly modified by the Ga and N vacancies in the GaN samples. Generally, the width of the valence band is reduced and the band gap is enlarged. The defect-induced bands can be introduced in the band gap of GMV due to the Ga and N vacancies. Moreover, the GaN with high density of N vacancies becomes an indirect gap semiconductor. Three defect bands due to Ga vacancy defects are created within the band gap and near the top of the valence band. In contrast, the N vacancies introduce four defect bands within the band gap. One is in the vicinity of the top of the valence band, and the others are near the bottom of the conduction band. The physical origin of the defect bands and modification of the band structures due to the Ga and N vacancies are analysed in depth.     

ICP—AES法测定铁矿中铝,钙,镁,锰,钴,铜,钠和钾

本文研究了ICP-AES法测定铁矿中铝,钙、镁、锰、钴、铜、钠和钾的方法。对仪器工作参数,共存元素的光谱干扰和基体效应干扰进行了探讨。采用向标准系列中加入铁基空白溶液建立工作曲线,试样经酸处理后即可直接测定。本方法获得了良好的回收率(95～103%)和变异系数(0.5～1.3%,n=11),同原子吸收法进行比对试验,结果一致。     

Pulse source-system model and its amplitude versus frequency characteristics

I.IntroductionForlongtime,itisoneofveryimportantquestionsinbiomcchanicscirc1estosetupady-namicsmode10fhumancardioscularsystemI'-'1.Peop1ehaveexpectedtostudythecomp1cxcardioscu1arsystemfromtheviewofthesy5temtheoryandtheinformati0ntheory.Wea1sopayattentiontothetheory0fTraditi0nalChinescMedicine(TCM)anditsc1inicalexperience.Thepulseisdrivenbytheheartandtransmittedbyb10odflowthrougharteries.ItgOesa1ongwayfarfromtheheart,andarrivesattheradia1artery.Thusitisaffectedbynoton1ythecon-ditionofthehe…     

分光光度法研究铝制品对水样溶出铝含量的影响

采用分光光度法,在pH为3-4的酸度条件下,以二甲酚橙为显色剂,快速检测水样中微量铝的含量.研究了不同情况下不同铝制品对水样溶出铝含量的影响.结果表明:水样在铝制品中放置时间越长,从铝制品中溶解出的铝越多,而且薄的铝制品中溶出的铝要比铝合金锅中溶出的多;当在水中加入一定量的食盐后,由铝制品中溶解出的铝含量明显增多.本方法简便快速,灵敏度高,对样品测定的结果令人满意.     

宽带膜厚实时监控过程中膜层折射率的确定方法

为了准确计算出镀膜过程中每层膜的折射率，介绍了实时监控过程中确定膜层折射率的2种方法：一种是由实测的透射比光谱直接反算出膜层的折射率；另一种是用最小二乘法的优化算法实时拟合折射率。试验结果表明：在线反算适合单点监控，所得折射率误差小于2%。然而在实际镀膜过程中,由于宽带内膜层参数误差较大,一般大于25%。为此，采用最小二乘法拟合，即在整个宽光谱范围内采集每个波长点的信息，所得结果误差很小，一般都在2％～5%之间,有时可达到10%,在很大程度上提高了实际镀膜时膜厚监控的精度。     

large Last Multiplier of Generalized Hamilton System

We study an application of the Jacobi last multiplier to a generalized Hamilton system. A partial differential equation on the last multiplier of the system is established. The last multiplier can be found by the equation. If the quantity of integrals of the system is sufficient, the solution of the system can be found by the last multiplier.