Aggregate error locator and error value computation in AG codes

The aggregate error locator is defined and a computation method is given. The aggregate error locator is then used in a type of Forney algorithm to compute the error values in the received words of a Ca,b algebraic geometry code.     

Polarization imaging for 3D inspection of highly reflective metallic objects

In the field of industrial vision, the 3D inspection of highly reflective metallic objects is still a delicate task. The specular reflections prevent the use of a 3D laser scanner, whereas the phase shifting-based 3D systems are more adapted to inspect surfaces with low curvature. This paper deals with a new automated 3D inspection system based on polarization analysis. Studying the state of polarization of the reflected light is very useful for obtaining information on the normals of the surface. An extension of the shape from polarization method from dielectric to metallic surfaces is demonstrated. Then, an improved relaxation algorithm is provided in order to reconstruct the shape from the normal field given by the polarization analysis. Finally, applications to shape defect detection are discussed and the efficiency of the system in discriminating defects on highly reflective metallic objects made by stamping and polishing is presented. The text was submitted by the authors in English.     

Wavelength and power monitoring of DWDM systems using scanning F–P filter calibrated with a F–P laser

A novel technique to overcome the long-term drift and hysteresis of a scanning Fabry–Perot filter was developed and applied to wavelength and power monitoring of DWDM system. By using the comb peaks generated by a temperature-stabilized, near threshold-biased Fabry–Perot diode laser as wavelength reference for the scanning Fabry–Perot filter, wavelength and power measurement accuracy of better than ±10 pm and 0.2 dB, respectively, were achieved.     

On Periodic Solutions of Degenerate Singularly Perturbed Linear Systems with Multiple Elementary Divisor

We establish sufficient conditions for the existence and uniqueness of a periodic solution of a system of linear differential equations with a small parameter and a degenerate matrix of coefficients of derivatives in the case of a multiple spectrum of a boundary matrix pencil. We construct asymptotics of this solution.     

Heuristic Solution Methods for the Multilevel Generalized Assignment Problem

The multilevel generalized assignment problem is a problem of assigning agents to tasks where the agents can perform tasks at more than one efficiency level. A profit is associated with each assignment and the objective of the problem is profit maximization. Two heuristic solution methods are presented for the problem. The heuristics are developed from solution methods for the generalized assignment problem. One method uses a regret minimization approach whilst the other method uses a repair approach on a relaxation of the problem. The heuristics are able to solve moderately large instances of the problem rapidly and effectively. Procedures for deriving an upper bound on the solution of the problem are also described. On larger and harder instances of the problem one heuristic is particularly effective.     

Structural evolution in amorphous silicon and germanium thin films.

The structural evolution in amorphous silicon and germanium thin films has been investigated by high-resolution transmission electron microscopy (HRTEM) in conjunction with autocorrelation function (ACF) analysis. The results established that the structure of as-deposited semiconductor films is of a high density of nanocrystallites embedded in the amorphous matrix. In addition, from ACF analysis, the structure of a-Ge is more ordered than that of a-Si. The density of embedded nanocrystallites in amorphous films was found to diminish with annealing temperature first, then to increase. The conclusions also corroborate well with the results of diminished medium-range order in annealed amorphous films determined previously by a variable coherence microscopy method.     

Laser diagnostics of nanoscale dielectric films on absorbing substrate by differential reflectivity and ellipsometry

The differential reflection characteristics for ultrathin inhomogeneous dielectric film on absorbing substrate are investigated in the long-wavelength approximation. The obtained first-order expressions for differential reflectivity and changes in the ellipsometric angles caused by ultrathin layer are of immediate interest to the solution of the inverse problem. The method to determine the averaged values (not the realistic profile) of refractive index for inhomogeneous nanometric films are shown. The novel possibilities for determining the dielectric constant and thickness of nanoscale homogeneous films by the differential ellipsometric and reflectivity measurements are developed, and a simple method to estimate whether the nanometric film is homogeneous or not is also discussed.     

The Millimeter Wave Tomography Application for the Subsurface Imaging

In the present paper new results of modeling and experimental investigation on millimeter wave subsurface tomography are submitted. Tomographic algorithm is employed for imaging of subsurface objects in the case when conductivity of probed medium is not equal to zero. The possibilities and restrictions of this algorithm for image processing are shown both as a result of modeling and as a result of experiments. A new tomography setup allowing obtaining images of different inhomogeneities in dielectric media is considered.