High density digital recording on 4 mm metal particle and Ba-ferrite tapes

In this study we compare the recording performance of 4 mm metal particle (MP) and Ba-ferrite (BF) tapes using helical scan digital audio tape (DAT) mechanisms and heads. At low bit densities the MP tapes have higher output signal and SNR compared with the BF tapes, but at high bit densities the reverse is true. This superior recording performance of the BF tapes, along with their immunity to environmental corrosion, recommends them as the media of choice for 4 mm data recording applications.     

Raman spectroscopy of synthetic organic pigments used in 20th century works of art

Raman microscopy allows a non‐destructive characterisation of inorganic and organic painting materials such as pigments and organic dyestuffs. The objectives of this study are the more recent organic pigments typically present in paintings and other art works from the 20th century. More than 20 organic synthetic pigments from different chemical classes could be identified by Raman spectroscopy using different excitation wavelengths (457.9, 476.5, 487.9, 514.5, 632.8, and 1064 nm). To evaluate the performance for real paint samples, varying paint mixtures of the Hansa Yellow pigment PY 3 and the binding medium Mowilith, a polyvinyl acetate (PVAC) compound, were characterised; PY 3 was determined at a 1 wt% level in the binder. In addition, commercial tube paints containing the quinacridone violet PV 19 were studied. The pigment was clearly identified in all of these more complex oil and acrylic paints. Finally, alizarin (PR 83) and a green copper phthalocyanine pigment (PG 7) could unambiguously be identified by Raman microscopy in the painting ‘Woman with mandolin in yellow and red’ of Max Beckmann dating 1950. The discovery of a red naphthol AS pigment by Raman spectroscopy in a sample from the ‘Three field workers’ by Georg Baselitz (1964/1965) demonstrated that in some cases complementary chromatographic methods are needed for a comprehensive identification of the organic pigments. Copyright © 2008 John Wiley & Sons, Ltd.     

A cross-spectrum weighting algorithm for speech enhancement and array processing: combining phase-shift information and stationary signal properties

In this paper, a gain function for noise cancellation with a two-channel microphone array is presented. This gain function combines ideas from one- and multichannel algorithms. It is developed using a minimum mean square error estimator for the amplitude of the speech signal from the cross spectrum between two microphone signals. To consider speech pauses and the absence of spectral components of the speech, an extension of this gain function is presented. The performance of the overall gain function is shown in terms of the cancellation of (diffuse) driving noise as well as the cancellation of an interfering speech signal, both recorded in a car.     

Crystalline Pr:SrAl12O19 waveguide laser in the visible spectral region

We fabricated waveguides in Pr:SrAl(12)O(19) crystals by direct femtosecond laser writing. The propagation losses were calculated to be as low as 0.16 dB/cm at a wavelength of 633 nm. Laser oscillation in a diode-pumped waveguide at a wavelength of 643.5 nm was realized. The output power of the waveguide laser was 28.1 mW at a slope efficiency of 8%.     

First production of ultracold neutrons with a solid deuterium source at the pulsed reactor TRIGA Mainz⋆

The production rates of ultracold neutrons (UCN) with a solid deuterium converter have been measured at the pulsed reactor TRIGA Mainz. Exposed to a thermal neutron fluence of n·cm^-2·pulse^-1, the number of detected very cold and ultracold neutrons ranges up to 200 000 at 7mol of solid deuterium (sD₂) in combination with a pre-moderator (mesitylene). About 50% of the measured neutrons can be assigned to UCN with energies E of where V _F(sD ₂) = 105 neV and V _F(guide) = 190 neV are the Fermi potentials of the sD₂ converter and our stainless steel neutron guides, respectively. Thermal cycling of solid deuterium, which was frozen out from the gas phase, considerably improved the UCN yield, in particular at higher amounts of sD₂.     

Characterization of Standard Reference Material 2942, Ce-ion-doped glass, spectral correction standard for UV fluorescence

Standard Reference Material (SRM) 2942 is a cuvette-shaped, Ce-ion-doped glass, recommended for use for relative spectral correction of emission from 320 to 430 nm and day-to-day performance verification of steady-state fluorescence spectrometers. Properties of this standard that influence its effective use or contribute to the uncertainty in its certified emission spectrum were explored here. These properties include its photostability, absorbance, dissolution rate in water, anisotropy and temperature coefficient of fluorescence intensity. The expanded uncertainties in the certified spectrum are about 9% around the peak maximum at 330 nm, using an excitation wavelength of 310 nm. The SRM also exhibits a strong resistance to photodegradation, with no measurable decrease in fluorescence intensity even after 25 h of irradiation with UV light>280 nm from a Xe lamp.     

Crack-free micromachining on glass substrates by visible LIBWE using liquid metallic absorbers

Laser induced backside wet etching (LIBWE) is a promising laser direct-write technique for etching transparent materials and for producing high precision and near-optical quality surfaces. In this study, visible LIBWE using gallium and eutectic indium/gallium as absorbers was used for crack-free microfabrication of sodalime and quartz. Eutectic indium/gallium (In/Ga) has a melting temperature lower than metallic gallium does and the etching rate by using In/Ga was found to be similar to that by gallium for visible LIBWE. When using the gallium absorber, the etching threshold of quartz by visible LIBWE was about one-third of that by UV LIBWE. The heat-affected zone of the quartz etching was negligible at the trench rim in the visible LIBWE process. The wettability of the metallic absorbers on the substrates affects aspect ratio and is a new important factor for LIBWE. In addition, etching rate decreased when repetition rate was increased.     

Depth profiling by means of sims: Recent progress and current problems

The present state of the art of secondary ion mass spectrometry (SIMS), applied to the in-depth analysis of impurity concentration profiles, is reviewed critically. It is shown that SIMS has reached a level of perfection which is unparalleled by other analytical techniques. There are, however, several effects which may cause deviations of the measured profile from the original dopant distribution. These detrimental effects are due to interaction of primary ions with the residual gas, adsorption and incorporation of residual gases, sputtering yield variations due to the accumulation of probe atoms in the sample, mass interference between molecular ions and the atomic species under study and, last but not least, beam-induced relocation of dopant atoms (“atomic mixing”). Methods for minimizing the respective disturbing effect are discussed.