Quantitative surface analysis performed with an imaging photoelectron spectrometer

The paper gives an outline of the basic principle of our imaging technique for XPS. The advantage of the concept is its excellent applicability to quantitative pixel information. This idea is verified by two examples which are representative for routine problems in XPS. These are quantitative surface analysis and determination of overlayer thicknesses. A lateral resolution of at least 0.2 mm is achieved and thus a pixel size of 0.2 mm × 0.2 mm can be quantified automatically by means of numerical algorithms without need of reference samples.Dedicated to Professor Günther Tölg on the occasion of his 60th birthday     

Mathematical modelling of influence functions in computer-controlled polishing: Part I

Computer-controlled polishing (CCP) is commonly used to finish high-quality surfaces, such as optical lenses. Based on magnetorheological finishing (MRF), a mathematical model to calculate the polishing tool characteristic (influence function) was developed and verified experimentally. The first part of this paper introduces the model to predict the size and shape of an influence function. The second part of this paper describes the calculation of the distribution of material removal within the size of an influence function. The model supersedes the current cumbersome procedure for determining an influence function and thus results in considerably improved and more economical manufacture. Furthermore, the model enables the quality of the final surface to be enhanced when polishing complex, for example aspherical or free-form, workpiece geometries and provides the first step in the application of time-variant influence functions.     

Synthesis of di- and tetraalkyl-3-piperazinoisoquinolines and related compounds as potential antidepressant agents

A series of di- and tetraalkyl-3-piperazinoisoquinolines and related compounds was synthesized via di- and tetraalkylated 1-indanones as intermediates.