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We consider an optimal growth (multi-sector) model with nonconvex technology. Using the Clarke results on generalized gradients, we prove that the value function has left and right derivatives with respect to the initial capital stock, without requiring supermodularity assumptions. 相似文献
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We present a pole expansion for the propagators in the framework of normalized quantum electrodynamics and compare it with the more canonical results from S-matrix theory. 相似文献
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This paper proposes a model for the parametric representation of linguistic hedges in Zadeh’s fuzzy logic. In this model each linguistic truth-value, which is generated from a primary term of the linguistic truth variable, is identified by a real number r depending on the primary term. It is shown that the model yields a method of efficiently computing linguistic truth expressions accompanied with a rich algebraic structure of the linguistic truth domain, namely De Morgan algebra. Also, a fuzzy logic based on the parametric representation of linguistic truth-values is introduced. 相似文献
27.
Characterizations of the containment of a convex set either in an arbitrary convex set or in the complement of a finite union
of convex sets (i.e., the set, described by reverse-convex inequalities) are given. These characterizations provide ways of
verifying the containments either by comparing their corresponding dual cones or by checking the consistency of suitable associated
systems. The convex sets considered in this paper are the solution sets of an arbitrary number of convex inequalities, which
can be either weak or strict inequalities. Particular cases of dual characterizations of set containments have played key
roles in solving large scale knowledge-based data classification problems where they are used to describe the containments
as inequality constraints in optimization problems. The idea of evenly convex set (intersection of open half spaces), which
was introduced by W. Fenchel in 1952, is used to derive the dual conditions, characterizing the set containments. 相似文献
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29.
Velislava A Ignatova Sven Van Den Berghe Steven Van Dyck Vladimir N Popok 《Microscopy and microanalysis》2006,12(5):432-437
The oxide scales of AISI 304 formed in boric acid solutions at 300 degrees C and pH = 4.5 have been studied using X-ray photoelectron spectroscopy (XPS) depth profiling. The present focus is depth profile quantification both in depth and chemical composition on a molecular level. The roughness of the samples is studied by atomic force microscopy before and after sputtering, and the erosion rate is determined by measuring the crater depth with a surface profilometer and vertical scanning interferometry. The resulting roughness (20-30 nm), being an order of magnitude lower than the crater depth (0.2-0.5 microm), allows layer-by-layer profiling, although the ion-induced effects result in an uncertainty of the depth calibration of a factor of 2. The XPS spectrum deconvolution and data evaluation applying target factor analysis allows chemical speciation on a molecular level. The elemental distribution as a function of the sputtering time is obtained, and the formation of two layers is observed-one hydroxide (mainly iron-nickel based) on top and a second one deeper, mainly consisting of iron-chromium oxides. 相似文献
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Summary High-purity indium was analysed by spark source mass spectrometry, using electrical and photoplate detection. For the calibration of the differences in elemental sensitivity, a standard sample was prepared in which 10 impurities were determined by graphite furnace atomic absorption spectrometry. In this way accuracies of less than 40% were obtained for relatively homogeneous elements at ppm and sub-ppm level. About 40 elements could be determined with detection limits of 10 to 30 ppb. Two pattern recognition methods, principal component analysis and clustering analysis, were applied to obtain information on trace element distribution, which indicated that a number of elements were strongly spatially correlated in the analysed sample.
On leave from: Department of Chemistry, Nanjing Normal University, Nanjing, People's Republic of China 相似文献
Chemische Analyse und Verteilungsbestimmung von Spurenelementen in Indium-Matrix durch Funkenquellen-Massenspektrometrie
On leave from: Department of Chemistry, Nanjing Normal University, Nanjing, People's Republic of China 相似文献