三层同轴液柱内的热毛细对流的近似解析解

1引言在微重力下用浮区法生长高质量、大体积单晶体是一种很有应用前景的方法，但热毛细对流所引起的诸如宏观不均匀性、生长条纹等缺陷严重限制了这一方法的应用。目前，人们试着用液封方法抑制热毛细对流。文献［1～3］分别对两层流体系统内的热毛细对流所作的研究表明：通过液封，被封层内的热毛细对流可以得到显著抑制。本文对圆柱三层流体系统内的热毛细对流进行研究，为热毛细对流规律的揭示以及进一步总结出其控制方法提供了理论数值依据。2控制方程和边界条件考虑长为L的互不溶混的三层轴对称同轴液柱，如图1所示，两端壁保持定温T…     

Quantum Key Distribution Using High-Dimensional Quantum Error-Avoiding Code

Using high-dimensional quantum error-avoiding code, we present two new quantum key distribution protocols over a collective noisy channel, i.e. six-photon and five-photon quantum error-avoiding codes. Compared with the previous protocols using four-photon and three-photon quantum error-avoiding code, the qubit efficiencies of the new protocols have increases of 16.67% and 5% respectively. In addition, the security of these protocols is analysed with a conclusion that the new protocols are much more secure than the four-photon and three-photon ones.     

Mean Value on the Difference Between a Quadratic Residue and Its Inverse Modulo p

The main purpose of this paper is to use the generalized Bernoulli numbers, Gauss sums and the mean value theorems of Dirichlet L-functions between a quadratic residue and its inverse modulo p value formula. to study the asymptotic property of the difference （a prime）, and to give an interesting hybrid mean     

Measurement of small-signal and large-signal responses of packaged laser modules at high temperature

In this paper, the pulsed injection method is extended to measure the chip temperature of various packaged laser modules, such as the DFB laser modules, the FP laser modules, and the EML laser modules. An optimal injection condition is obtained by investigating the dependence of the lasing wavelength on the width and period of the injection pulse in a relatively wide temperature range. The small-signal frequency responses and large-signal performances of packaged laser modules at different chip temperature are measured. The adiabatic small-signal modulation characteristics of packaged LD are first extracted. In the large-signal measurement, the effects of chip temperature, bias current and driving signal on the performances of the laser modules are discussed. It has been found that the large-signal performances of the EML modules depend on the different red-shift speeds of the DFB and EAM sections as chip temperature varying, and the optimal characteristics may be achieved at higher temperature.     

40,48Ca+90,96Zr融合反应的动力学模型研究

应用改进的量子分子动力学模型,在严格挑选初始核考虑弹靶结构效应的基础上,研究了近垒和垒上融合反应^40,48Ca+^90,96Zr. 研究表明: 4个反应的理论计算截面与实验值很好符合; 丰中子反应⁴⁰Ca+⁹⁶Zr的垒下融合截面比其他3个反应有明显增强的现象.为了理解丰中子反应⁴⁰Ca+⁹⁶Zr与⁴⁰Ca+⁹⁰Zr相比垒下融合截面增强,而Ca+⁹⁶Zr垒下融合截面没有明显增强的原因, 进一步分析了484个反应的融合位垒,中子转移与融合位垒的关系、中子转移与Q值的关系,结果表明: 正反应Q值会引起核子(特别是中子)转移的增强,从而导致动力学融合位垒的下降和垒下融合截面增强.     

Effect of a low magnetic field on crystallinity and magnetic susceptibility of molecular magnet {NBu4[FeCr(ox)3]}x (NBu4=tetra( n-butyl) ammonium ion; ox=oxalate ion)

Molecular magnet {NBu₄[Fe Cr(ox)₃]}_x (NBu₄⁺=tetra(n-buty1) ammonium ion; ox²⁻=oxalate ion) was synthesized under an applied low magnetic field of 0.3 T in comparison to that synthesized without a field. Their crystallinities, morphologies and magnetic properties were characterized by using the X-ray diffractionmeter, the transmission electron microscope, and a superconducting quantum interference device. It is found that the average size of particles synthesized under the applied field appears larger than that synthesized without a field. Moreover, its crystallinity, morphology and magnetic susceptibility have also been improved. However, its chemical structure and ferromagnetic phase transition temperature T_c do not change. Possible reasons to explain this effect are also discussed.     

具有HfN/HfO2栅结构的p型MOSFET中的负偏置-温度不稳定性研究

研究了HfN/HfO₂高K栅结构p型金属-氧化物-半导体(MOS)晶体管(MOSFET)中，负 偏置-温度应力引起的阈值电压不稳定性(NBTI)特征.HfN/HfO₂高K栅结构的等效 氧化层厚度(EOT)为1.3nm，内含原生缺陷密度较低.研究表明，由于所制备的HfN/HfO₂ 高K栅结构具有低的原生缺陷密度，因此在p-MOSFET器件中观察到的NBTI属HfN/HfO2高K栅结构的本征特征，而非工艺缺陷引起的；进一步研究表明，该HfN/HfO₂高K栅结构中观察到的NBTI与传统的SiO₂基栅介质p-MOSFET器件中观察 到的NBTI具有类似的特征，可以被所谓的反应-扩散(R-D)模型表征： HfN/HfO₂ 栅结构p-MOSFET器件的NBTI效应的起源可以归为衬底注入空穴诱导的界面反应机理，即在负 偏置和温度应力作用下，从Si衬底注入的空穴诱导了Si衬底界面Si-H键断裂这一化学反应的 发生，并由此产生了Si^＋陷阱在Si衬底界面的积累和H原子在介质层内部的扩散 ，这种Si^＋陷阱的界面积累和H原子的扩散导致了器件NBTI效应的发生. 关键词： 高K栅介质 负偏置-温度不稳定性(NBTI) 反应-扩散(R-D)模型