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The common methods for calculating the mass transfer across liquid-liquid interfaces in technical applications take into account the mass transfer resistances within the bulk phases. The transfer resistance of the interface and a possible coupling between the momentum and the mass transport is not taken into account. In the present paper a survey is given of theoretical approaches which can describe this coupling and the additional mass transfer resistance. A theory is proposed by Hampe which can be used to explain the coupling between momentum and mass transport employing thermodynamics of irreversible processes. On the basis of this work, the influence of the dilatation of a flat interface on the mass transfer is deduced. It is also concluded from this theory that the diffusion coefficients within the bulk phases are coupled near the thermodynamic equilibrium.  相似文献   
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Brandau  C.  Bartsch  T.  Böhm  S.  Böhme  C.  Hoffknecht  A.  Kieslich  S.  Knopp  H.  Schippers  S.  Shi  W.  Müller  A.  Grün  N.  Scheid  W.  Steih  T.  Bosch  F.  Franzke  B.  Kozhuharov  C.  Krämer  A.  Mokler  P. H.  Nolden  F.  Steck  M.  Stöhlker  T.  Stachura  Z. 《Hyperfine Interactions》2003,146(1-4):41-45
Hyperfine Interactions - An overview of measurements of dielectronic recombination (DR) with the heaviest lithiumlike ions is presented. The experiments have been carried out at the heavy ion...  相似文献   
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High-accuracy film thickness measurements in the range below 100 nm can be made by various complex methods like spectral ellipsometry (SE), scanning force microscopy (SFM), grazing incidence X-ray reflectometry (GIXR), or X-ray fluorescence analysis (XRF). The measurement results achieved with these methods are based on different interactions between the film and the probe. A key question in nanotechnology is how to achieve consistent results on a level of uncertainty below one nanometre with different techniques.Two different types of thickness standards are realised. Metal film standards for X-ray techniques in the thickness range 10 to 50 nm are calibrated by GIXR with monochromatised synchrotron radiation of 8048 eV. The results obtained at four different facilities show excellent agreement. SiO2 on Si standards for SE and SFM in the thickness range 6 to 1000 nm are calibrated by GIXR with monochromatised synchrotron radiation of 1841 eV and with a metrological SFM. Consistent results within the combined uncertainties are obtained with the two methods. Surfaces and interfaces of both types of standards are additionally investigated by transmission electron microscopy (TEM). PACS 61.10.Kw; 68.55.Jk; 06.20.Fn; 06.60.Mr; 07.79.Lh  相似文献   
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We prove global existence of solutions to the continuous nonhomogeneous Smoluchowski equation for coagulation rates satisfying a more general structure condition than the Galkin–Tupchiev monotony hypothesis considered in (Ph. Laurençot, S. Mischler, Arch. Rational Mech. Anal. 162 (1) (2002) 45–99). The Smoluchowski coagulation rate fulfils this condition as well as some rates which vanish on the diagonal. Under the condition of positivity of the coagulation rate outside of the diagonal we prove that solutions tend to 0 in the large time asymptotic. These results depend on a new estimate from below for the dissipation rate of the Lp-norm, p>1. To cite this article: S. Mischler, M. Rodriguez Ricard, C. R. Acad. Sci. Paris, Ser. I 336 (2003).  相似文献   
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We use a newly introduced concept of neocompactness to study problems from metric fixed point theory. In particular, we give a sufficient condition for a superreflexive Banach space X to have the fixed point property and obtain shorter proofs of some well-known results in that theory.  相似文献   
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We examine the effect of dissipation on coherent quantum tunnelling between the two lowest levels of a double-well system using an adjoint equation approach developed previously in the treatment of quantum-optical problems. Dissipation is modelled by a linear coupling to a bath of harmonic oscillators. The high frequency portion of the bath is adiabatically eliminated using a cumulant expansion technique, which generates frequency renormalisation terms. Making a low temperature assumption, an approximate two-level model is developed in the form of three coupled stochastic differential equations. With a decorrelation approximation, the two-level equations can be solved to yield familiar results. However, the adjoint equation also permits the use of direct stochastic simulation as a means of solution, and simulations are carried out for a range of parameters. A comparison with the decorrelation approximation is made.  相似文献   
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