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Two problems of half-wave hole and high ripples in the transmittance region for a harmonic beam splitter had been pointed out and analyzed. Based on the application of a half-wavelength control and a new admittance matching methods, a harmonic beam splitter was designed and fabricated. The former method eliminated the half-wave hole fundamentally, and the latter smoothed high ripples in the transmittance region effectively. The matching stack consisted of a symmetrically periodic structure and provided a complete matching at the desired wavelength, i.e., both conditions for the equivalent admittance and phase thickness were fulfilled. Furthermore, both the theoretical and the tested curves had been given, and a good agreement between them was obtained. 相似文献
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Structure and Photoluminescence of Nano-ZnO Films Grown on a Si (100) Substrate by Oxygen- and Argon-Plasma-Assisted Thermal Evaporation of Metallic Zn 下载免费PDF全文
Nano-ZnO thin films were prepared by oxygen- and argon-plasma-assisted thermal evaporation of metallic Zn at low temperature, followed by low-temperature annealing at 300℃ to 500℃ in oxygen ambient. X-ray diffraction patterns indicate that the nano-ZnO films have a polycrystalline hexagonal wurtzite structure. Raman scattering spectra demonstrate the existence of interface layers between Zn and ZnO. Upon annealing at 400℃ for i h, the interface mode disappears, and photoluminescence spectra show a very strong ultraviolet emission peak around 381 nm. The temperature-dependent PL spectra indicate that the UV band is due to free-exciton emission. 相似文献
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A series of Mo/Si multilayers with the same periodic length and different periodic number were prepared by magnetron sputtering, whose top layers were respectively Mo layer and Si layer. Periodic length and interface roughness of Mo/Si multilayers were determined by small angle X-ray diffraction (SAXRD). Surface roughness change curve of Mo/Si multilayer with increasing layer number was studied by atomic force microscope (AFM). Soft X-ray reflectivity of Mo/Si multilayers was measured in National Synchrotron Radiation Laboratory (NSRL). Theoretical and experimental results show that the soft X-ray reflectivity of Mo/Si multilayer is mainly determined by periodic number and interface roughness, surface roughness has little effect on reflectivity. 相似文献
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利用微分方程的级数求解方法,分析了两端简支的有限长功能梯度圆筒的轴对称稳态热弹性问题,推导出了稳态温度场与应力场的解析解。分析中采用指数函数模型来描述FGM圆筒中材料性能在厚度方向的连续变化,同时忽略温度对材料性能的影响。另外,论文以金属钼和多铝红柱石制成的功能梯度圆筒为例,给出了稳态温度场和应力场的数值结果。 相似文献
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Effect of Alumina and Chromium Interlayers on Microstructures and Optical Properties of Thin Ag Films on Glass Substrates 下载免费PDF全文
Effects of alumina and chromium interlayers on the microstructure and optical properties of thin Ag films are investigated by using spectrophotometry, x-ray diffraction and AFM. The characteristics of Ag films in Ag/glass, Ag/l2O3/glass and Ag/Cr/glass stacks are analysed. The results indicate that the insertion of an Al2O3 or Cr layer decreases the grains and influences the reflectance of Ag films. The reflectance of the Ag film can be increased by controlling the thickness of alumina interlayer. The stability of Ag films is improved and the adhesion of Ag films on glass substrates is enhanced by alumina as an interlayer. 相似文献
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利用掺钛的蓝宝石飞秒激光系统输出的单脉冲和多脉冲飞秒激光(中心波长800 nm,脉宽50 fs,靶面聚焦直径Ф 40 μm),分别对BK7玻璃基底上厚约500 nm的单层HfO2和单层ZrO2薄膜进行辐照,得到了这两种薄膜在1-on-1和1 000-on-1测试方法下的激光损伤阈值。实验发现,两种方法下HfO2单层膜的阈值均比ZrO2单层膜的阈值高。从简化的Keldysh多光子离化理论出发,认为HfO2薄膜材料的带比ZrO2的宽是导致上述结果的主要原因。同时,同一种薄膜的多脉冲下的阈值比单脉冲下的低,原因是多脉冲下,飞秒激光对光学薄膜的损伤存在累积效应。 相似文献