The Büttiker-Landauer model generalized

Büttiker and Landauer studied scattering off an oscillating rectangular barrier in order to shed light on the time aspects of tunneling. The expression for the traversal time resulting from this study is controversial. In addition, doubts have recently been expressed on technical aspects of their work. In an attempt to clarify these issues, we investigate a generalization of their model to arbitrary oscillating barriers,V(x, t)=V ₀(x)+V ₁(x)cos t. In the process, we confirm that Büttiker and Landauer's work is technically sound. However, we show, by several examples, that no direct general relation exists between the characteristic frequency of an oscillating barrier and the duration of the tunneling process. For a wide range of realistic parameters this characteristic frequency does not even exist.This paper is dedicated to E. G. D. Cohen.     

Breit-Wigner formulas for the scattering phase and the total scattering cross-section in the semi-classical limit

In this paper we prove results in resonance scattering for the Schrödinger operatorP _v=–h ²+V, V being a smooth, short range potential onR ⁿ . More precisely, for energy near a trapping energy level ₀ for the classical system defined by the Hamiltonianp(x,)= ²+V(x), we prove that the scattering phase and the scattering cross sections associated to (P _v, P₀) have the Breit-Wigner form (Lorentzian line shape) in the limith0.     

Frequency stability of an optically pumped cesium beam frequency standard

Results obtained in an experimental optically pumped cesium beam frequency standard in which a single semiconductor laser is used for the state selection and the atom detection are reported. The separation between the two interaction regions is equal to 21 cm. This gives a 500 Hz linewidth which is observed with a signal to noise ratio equal to 10,000 in a 1 Hz noise bandwidth. A quartz crystal oscillator is frequency controlled by the atomic transition. The measured short term frequency stability is given by _y()=2×10^–12–1/2 for 1 s<500 s. Prospects for improvement of this frequency stability are discussed.     

XPS investigations of ink‐jet printed paper

Different ink‐jet printed paper materials were investigated using X‐ray photoelectron spectroscopy (XPS) yielding the elemental composition of the near‐surface region of the papers. We found significant differences with respect to the detected elements and their atomic concentrations in the different inks studied here. Two different groups of inks could be identified by means of a lower ratio of the O and C atomic concentrations and lower concentrations in specific trace elements like Mg, Na and Si. High‐resolution spectra of C 1s and O 1s core levels allowed a detailed determination of the chemical state of the respective elements. On the basis of a detailed deconvolution of these XPS signals, significant differences between all the investigated ink‐jet printed papers were found, thereby allowing their discrimination. The applicability of the measurements and, more generally, the XPS technique for forensic investigations of paper are discussed. Copyright © 2007 John Wiley & Sons, Ltd.