Optical properties of nickel(II)-azo complexes thin films for potential application as high-density recordable optical recording media

Smooth thin films of three kinds of nickel(II)-azo complexes were prepared by the spin-coating method. Absorption spectra of the thin films on K9 glass substrate in the 300-600 nm wavelength region were measured. Optical constants (complex refractive index ) and thickness of the thin films prepared on single-crystal silicon substrate in the 300-600 nm wavelength region were investigated on rotating analyzer-polarizer type of scanning ellipsometer, and dielectric constants , absorption coefficients α as well as reflectance R of thin films were then calculated at 405 nm. In addition, in order to examine the possible use of nickel(II)-azo complex thin film as an optical recording medium, one of the nickel(II)-azo complex thin film prepared on K9 glass substrate with an Ag reflective layer was also studied by atomic force microscopy and static optical recording. The results show that the nickel(II)-azo complex thin film is smooth and has a root mean square surface roughness of 2.25 nm, and the recording marks on the nickel(II)-azo complex thin film are very clear and circular, and their size can reach 200 nm or less.     

激光致晶态Ag11In12Te26Sb51相变介质光学常数的研究

研究了结晶度对Ag11In12 Te2 6Sb51相变薄膜光学常数的影响。用初始化仪使相变薄膜晶化 ,改变晶化参量得到不同的结晶度 ,当转速固定时 ,随激光功率的增加 ,折射率基本随之减小 ,消光系数先是增大 ,而后减小 ;当激光功率固定时 ,随转速的增大 ,折射率也随之增大 ,消光系数也是先增大后减小。非晶态与晶态间的变换、薄膜微结构的变化 (包括晶型的转变和原子间键合状态的变化 )以及薄膜内残余应力是影响Ag11In12 Te2 6Sb51相变薄膜复数折射率的主要原因。测量了单层膜的透过率和CD RW相变光盘中Ag11In12 Te2 6Sb51薄膜非晶态和晶态的反射率     

Studies on the Element Characteristics of Nephrite Minerals from Different Deposits by GD‐MS

Element characteristics of nephrite minerals were determined by glow discharge mass spectrometry (GD‐MS) through surface adherence method. To solve the conductivity problem of non‐conductive nephrite samples, high purity indium pin (>99.9999%) was used as discharge host. During the preparation procedure, a small piece of nephrite sample was ground into powder (about 200 meshes), and then the sample powder was coated on the surface of indium pin to form a rod sample. Typical elements of nephrite minerals were analyzed by GD‐MS, and the relative standard deviations showed that the stability and reproducibility of this method were good. Meanwhile, four nephrite samples from two different deposits were further studied by this method. The GD‐MS results of major elements and trace elements revealed that typical elements of the nephrite minerals from same deposit were similar, and those from different deposits exhibited significant difference. In addition, results of external‐beam proton induced X‐ray emission (PIXE) were consistent with the result of GD‐MS determination. The present approach had been proven to be simple, efficient to perform the rapid screening and multi‐element semi‐quantitative analysis of nephrite samples.     

Limit theorems for the position of a tagged particle in the stirring-exclusion process

Stirring-exclusion processes are exclusion processes with particles being stirred. We investigate a tagged particle among a Bernoulli product environment measure on the lattice ?d.We show the strong law of large numbers and the central limit theorem for the tagged particle. The proof of the central limit theorem is based on the method of martingale decomposition with a sector condition.     

Effect of PbO on precipitation of laser-induced gold nanoparticles inside silicate glasses

We report on three-dimensional precipitation of Au nanoparticles in gold ions-doped silicate glasses by a femtosecond laser irradiation and further annealing. Experimental results show that PbO addition plays the double roles of inhibiting hole-trapped centers generation and promoting formation and growth of gold nanoparticles. Additionally, glass containing PbO shows an increased non-linear absorption after femtosecond laser irradiation and annealing. The observed phenomena are significant for applications such as fabrications of three-dimensional multi-colored images inside transparent materials and three-dimensional optical memory, and integrated micro-optical switches.     

酞菁铜薄膜的折射率及吸收特性

通过真空镀膜法在单晶硅制备了酞菁铜薄膜，在波长扫描和入射角可变全自动椭圆偏振光谱仪上研究了ＣｕＰｃ薄膜的椭偏光谱并分析了其电子结构。     

溅射工艺参数对AgInSbTe相变薄膜光学性质的影响

采用射频磁控溅射工艺,在K9玻璃片上用Ag-In-Sb-Te合金靶制备了相变薄膜,对沉积态薄膜在300℃下进行了热处理,测量了薄膜的光学性质。通过改变本底气压,溅射气压及溅射功率,研究了工艺参数对薄膜光学性质的影响,实验表明,本底气压,溅射气压及射功率综合决定了AgInSbTe薄膜的光学性质,对AgInSbTe薄膜的制备,选择较高的本底真空度,适当的溅射气压及溅射功率是非常重要的。     

偶氮金属螯合物薄膜的光学常数和吸收光谱

偶氮金属螯合物薄膜是一类新型光信息存储和光学非线性材料。通过旋涂法在单晶硅上制备了三种新型偶氮染料：2-（4-甲革-2-噻唑基偶氮）-5-二乙基胺苯酚（MTADP）掺杂聚合物,MTADP的镍螯合物（Ni-MTADP）和锌螯合物（Zn-MTADP）薄膜。利用宽谱扫描全自动椭圆偏振光谱仪测定了上述薄膜的椭偏光谱,获得了三种薄膜在400—700nm波段的复折射率、复介电常量和吸收系数。两种金属螯合物薄膜的共振波长比非螯合物薄膜红移了60—70nm;光学常数和吸收系数在峰值的数值也发生了明显的变化。由于这两种螯合物具有不同的立体结构,Ni-MTADP薄膜的共振波长比Zn-MTADP有10nm的红移。