What type of force does the cochlear amplifier produce?

Recent experimental measurements suggest that the mechanical displacement of the basilar membrane (BM) near threshold in a viable mammalian cochlea is greater than 10(-8) cm, for a stimulus sound-pressure level at the eardrum of 20 microPa. The associated response peak is very sensitive to the physiological condition of the cochlea. In the formulation of all recent cochlear models, it has been explicitly assumed that this peak is produced by the cochlear amplifier injecting a large amount of energy into the cochlea, thereby altering the real component of the BM impedance. In this paper, a new cochlear model is described which produces a realistic response by assuming that the cochlear amplifier force acts at a phase such that the main effect is to reduce the imaginary component of the BM impedance. In this new model, the magnitude of the cochlear amplifier force required to produce a realistic response is much smaller than in the previous models. It is suggested that future experimental investigations should attempt to determine both the magnitude and the phase of the forces associated with the cochlear amplifier.     

Alternative proof and interpretations for a recent state-dependent importance sampling scheme

Recently, a state-dependent change of measure for simulating overflows in the two-node tandem queue was proposed by Dupuis et al. (Ann. Appl. Probab. 17(4):1306–1346, 2007), together with a proof of its asymptotic optimality. In the present paper, we present an alternative, shorter and simpler proof. As a side result, we obtain interpretations for several of the quantities involved in the change of measure in terms of likelihood ratios. Part of this research has been funded by the Dutch BSIK/BRICKS project; part of this research was done while the first author was visiting INRIA/IRISA, Rennes, France.     

Direct bandgap optical transitions in Si nanocrystals

JETP Letters - The effect of quantum confinement on the direct bandgap of spherical Si nanocrystals has been modelled theoretically. We conclude that the energy of the direct bandgap at the...     

The profile of layered materials reflected by glancing-incidence X-ray analysis

Specular reflectivity, diffuse scattering at glancing incidence and angle-dependent total-reflection X-ray fluorescence are complementary techniques for the investigation of layered materials. The principles of these glancing-incidence X-ray methods are briefly discussed. Examples show the strength of the combination of these techniques.