不同载体负载的磷化钨催化剂加氢脱硫和降烯烃性能研究

为了减少汽车尾气中有害物的排放,世界各国对汽油中硫和烯烃含量提出了越来越严格的限制。……     

Four-quadrant demodulation fiber sensor for wavelength monitoring of a wavelength phase-shifting interferometer

Real-time monitoring of wavelength is important for high-speed wavelength phase-shifting interferometry. In this paper, a wavelength sensor based on a polarization-maintaining fiber interferometer with four-quadrant demodulation was proposed. We built the wavelength sensing system with resolution better than 0.005 pm and 0.1 ms sampling interval and measured the response time of the tuned wavelength at 35 ms in the phase-shifting process of a commercial wavelength phase-shifting free-space inter...     

钙对焦炭非均相还原NO的微观作用机理:DFT研究

基于密度泛函理论、结合电子结构分析和Mayer键级变化研究了钙对焦炭非均相还原NO的微观作用机理。对焦炭模型进行电子定域化函数和静电势极值点分析发现,焦炭边缘未饱和的碳原子周边表现出高的电子定域性,体系静电势最小值为-101.1 k J/mol,边缘碳活性位存在孤对电子。钙的添加可促进第一个NO分子在焦炭边缘的吸附,但对第二个NO分子的吸附影响不大。钙的添加不改变NO在焦炭边缘的非均相还原反应路径,但可将决速步的活化能由124.4 k J/mol降至91.9 k J/mol。动力学分析发现添加钙后,非均相还原反应的指前因子增大,焦炭边缘的活化位点增多,有利于加快NO非均相还原反应的进行。     

基于共轭梯度法的圆管内部流体温度识别

本文在建立圆管二维瞬态传热模型的基础上,将反问题转化成正问题和最优化问题。采用有限元方法求解导热正问题,利用外壁面温度分布,从目标函数的泛函变分出发,根据共轭梯度法,实现了圆管内部的流体温度识别。通过典型算例的数值计算,验证了方法的准确性和抗噪性。     

Wallichanol类天然产物ABC环系合成研究

Wallichanol是一类具有独特桥环结构的二萜天然产物.以2-甲基-1,3-环己二酮作为起始原料,通过高立体选择性的Diels-Alder反应和金催化的炔烃碳环化反应构建Wallichanol的ABC三环核心骨架,共七步路线,总收率为42%.该合成工作为Wallichanol类天然产物全合成奠定了研究基础.     

O-对甲氧基苯基-N,N-二苄基酪氨酸乙酯的合成

N,N-二苄基酪氨酸乙酯(2)与对溴苯甲醚(3)经偶联反应合成了O-对甲氧基苯基-N,N-二苄基酪氨酸乙酯,其结构经NMR,IR和MS表征。最佳反应条件为:210mmol,n(2)∶n(3)∶n(K3PO4)∶n(CuSO4.5H2O∶n(N,N-二甲基甘氨酸盐酸盐)=1.0∶1.3∶1.3∶0.2∶0.35,在DMF(50mL)中于100℃反应8h,产率54.7%,93.8%ee。     

磁性Fe_2O_3/Au/Ag复合纳米粒子的制备及其富集作用研究

利用种子生长法制备了磁性Fe2O3/Au/Ag复合纳米粒子,采用UV-vis和SEM对其光学性质以及表面结构的变化进行了表征.通过调节硝酸银的用量,制备了一系列具有不同Ag壳层厚度和表面结构的双金属外壳纳米粒子.以苯硫酚(TP)为探针分子,研究了不同Ag壳厚度的磁性纳米粒子的表面增强拉曼散射(SERS)活性.结果表明其SERS活性与表面结构的改变有关,在同时出现Ag和Au光学性质的Fe2O3/Au/Ag复合纳米粒子表面可观察到最强的SERS效应,这与表面的针孔效应以及Ag和Au之间的耦合增强作用有关.考察了Fe2O3/Au/Ag复合纳米粒子的磁富集作用,并利用SERS原位监测磁富集溶液中低浓度TP的能力,研究结果表明通过磁富集可提高SERS检测限,并且Fe2O3/Au/Ag的磁富集能力较Fe2O3/Au弱,但前者SERS信号较强.     

A Thin Liquid Film and Its Effects in an Atomic Force Microscopy Measurement

Recently, it has been observed that a liquid film spreading on a sample surface will significantly distort atomic force microscopy （AFM） measurements. In order to elaborate on the effect, we establish an equation governing the deformation of liquid film under its interaction with the AFM tip and substrate. A key issue is the critical liquid bump height yoc, at which the liquid film jumps to contact the AFM tip. It is found that there are three distinct regimes in the variation of yoc with film thickness H, depending on Hamaker constants of tip, sample and liquid. Noticeably, there is a characteristic thickness H^＊ physically defining what a thin film is; namely, once the film thickness H is the same order as H^＊, the effect of film thickness should be taken into account. The value of H^＊ is dependent on Hamaker constants and liquid surface tension as well as tip radius.