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101.
Effect of supply voltage and body-biasing on single-event transient pulse quenching in bulk fin field-effect-transistor process 下载免费PDF全文
Charge sharing is becoming an important topic as the feature size scales down in fin field-effect-transistor(Fin FET)technology. However, the studies of charge sharing induced single-event transient(SET) pulse quenching with bulk Fin FET are reported seldomly. Using three-dimensional technology computer aided design(3DTCAD) mixed-mode simulations,the effects of supply voltage and body-biasing on SET pulse quenching are investigated for the first time in bulk Fin FET process. Research results indicate that due to an enhanced charge sharing effect, the propagating SET pulse width decreases with reducing supply voltage. Moreover, compared with reverse body-biasing(RBB), the circuit with forward body-biasing(FBB) is vulnerable to charge sharing and can effectively mitigate the propagating SET pulse width up to 53% at least.This can provide guidance for radiation-hardened bulk Fin FET technology especially in low power and high performance applications. 相似文献
102.
Long-range surface plasmon polaritons with subwavelength mode expansion in an asymmetrical system 下载免费PDF全文
Long-range surface plasmon polariton (LRSPP) modes in an
asymmetrical system, in which the thin metal film is sandwiched
between a semi-infinite substrate and a high permittivity polymer
film with a finite thickness, are theoretically calculated and
analyzed. Due to the high permittivity of the polymer film, at
proper polymer film thicknesses, the index-matching condition of the
dielectrics at both sides of the metal can be satisfied for
supporting LRSPP modes, and the electromagnetic field above the
metal can be localized well. It is found that these LRSPP modes have
both long propagation lengths and subwavelength mode expansion above
the metal at the optimal polymer film thicknesses. Furthermore, the
requirements on the refractive index and the thickness of the
polymer film to support LRSPP modes at the optimal thicknesses are
found to be not critical. 相似文献
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104.
随着传统实验教学模式固有弊端的凸显,因材施教、分层教学的开放性实验教学模式已成为实验教学的发展方向.然而由于开放性实验教学改革所面临的困难短期内无法克服,更多地停留在口号层面上,而无实质性进展.本文在开放性实验教学思想的指导下,采用开放式实验教学与传统实验教学相结合的方法探索了一条更符合认知规律且与实际相适应的有限开放性实验教学方式,给出了部分供同行参考的设计性、研究性实验题目.首次提出了“开放度”的概念,并建议将实验教学的开放度作为重要指标列入高校教学水平评估和实验室评估的评估体系. 相似文献
105.
基于光纤光栅的高灵敏度流速传感器 总被引:7,自引:0,他引:7
利用光纤光栅压强传感机构和汾丘里管设计了一种基于光纤光栅的流速传感器,并推导了光纤光栅中心波长漂移量与流速的关系式。实验表明,该传感器具有较高的灵敏度,稳定性较好,光纤光栅的中心波长随流速的增加而不断向短波方向漂移,而带宽几乎没有变化,实验和理论符合得较好。该流速传感器的动态感测范围为51.0~148.2 mm/s,在该范围内,至少可感测到0.3 mm/s的流速变化,这是目前所报道的最优值。优化光纤光栅压强传感机构及汾丘里管的参量,可测量其它速度段的流速,并可进一步提高传感灵敏度。 相似文献
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107.
Using three-dimensional technology computer-aided design (TCAD) simulation, parasitic bipolar amplification in single event transient (SET) current of single transistor and its temperature dependence are studied. We quantify the contributions of different current components in SET current pulse, and it is found that the proportion of parasitic bipolar amplification in total collected charge is about 30% in both 130-nm and 90-nm technologies. The temperature dependence of parasitic bipolar amplification and the mechanism of SET pulse are also investigated and quantified. The results show that the proportion of charge induced by parasitic bipolar increases with rising temperature, which illustrates that the parasitic bipolar amplification plays an important role in the charge collection of single transistor. 相似文献
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110.
Morphological and structural damage investigation of nanostructured molybdenum fuzzy surface after pulsed plasma bombardment 下载免费PDF全文
Yu-Chuan Luo 《中国物理 B》2022,31(4):45203-045203
Steady high-flux helium (He) plasma with energy ranging from 50 eV to 90 eV is used to fabricate a fiber-form nanostructure called fuzz on a polycrystalline molybdenum (Mo) surface. Enhanced hydrogen (H) pulsed plasma in a wide power density range of 12 MW/m2-35 MW/m2 is subsequently used to bombard the fuzzy Mo, thereby simulating the damage of edge localized mode (ELM) to fuzz. The comparisons of surface morphologies, crystalline structures, and optical reflectivity between the original Mo and the Mo treated with various He+ energy and transient power densities are performed. With the increase of He ion energy, the Mo nano-fuzz evolved density is enlarged due to the decrease of filament diameter and optical reflectivity. The fuzz-enhanced He release should be the consequence of crystalline growth and the lattice shrinkage inside the Mo-irradiated layers (~200 nm). The fuzz induced by lower energy experiences more severe melting damage and dust release under the condition of the identical transient H plasma-bombardment. The H and He are less likely to be trapped due to aggravated melting evidenced by the enhanced crystalline size and distinct lattice shrinkage. As the transient power density rises, the thermal effect is enhanced, thereby causing the fuzz melting loss to aggravate and finally to completely disappear when the power density exceeds 21 MW/m2. Irreversible grain expansion results in huge tensile stress, leading to the observable brittle cracking. The effects of transient thermal load and He ion energy play a crucial role in etching Mo fuzz during ELM transient events. 相似文献