基于CCD采集的Mach-Zehnder干涉条纹图的处理算法

Mach-Zehnder干涉仪适用于研究气体密度迅速变化的状态。由于气体折射率的变化与其密度的变化成正比,而折射率的变化将使通过气体的光线有不同的光程,因此可通过干涉臂变化对干涉条纹图像效果的影响得到气体密度。实测中,采用图像采集卡和CCD来接收Mach-Zehnder干涉仪产生的条纹图像,再通过计算机对条纹图像的条纹间距进行处理,从而得到气体密度的变化状态。从光干涉理论出发,对Mach-Zehnder干涉条纹图像特征进行了分析,建立了Mach-Zehnder干涉条纹的数学模型,并根据此模型设计了处理Mach-Zehnder干涉条纹图像的算法。算法包括图像的预处理(即图像的噪声提取)、图像的二值化及图像的细化。     

新试剂二溴氟基偶氮氟胂分光光度法快速测定热镀锌合金中微量铈

报道了新试剂DBF-FAsA的合成及其应用于测定锌合金中添加微量元素铈量的方法。在强酸性体系中铈与二溴氟基偶氮氟砷(DBF-FAsA)形成蓝紫色配合物,其最大吸收波长为624nm,表观摩尔吸光系数ε为1.20×105L·mol-1·cm-1,线性范围为0～1.0μg/mL。该法可用于锌合金或中间锌合金材料中微量铈的测定。     

一个改进的Hardy-Hilbert不等式

通过建立权系数的不等式,得到一个改进的Hardy-Hilbert不等式.     

在可交换四元数空间中的双曲方程的特征边值问题

讨论了一阶和二阶双曲复方程的特征边值问题.对其中两种线性方程,分别在不同的情况下获得通解和可解条件.而对于拟线性的二阶双曲复方程,证明了解的存在性和唯一性.     

Investigation of Scale Exponents of Complete and Incomplete Aggregation-Annihilation Processes

The complete and incomplete aggregation-annihilation processes are investigated with the method of generating function, and the scale exponents are obtained exactly. We find that the scale exponents of incomplete aggregation-annihilation process are different from the previous exponents obtained by different methods. The time dependence of the total number of clusters and the total mass of clusters are analytically obtained.     

Interfacial structure and electrical properties of LaAlO3 gate dielectric films on Si by metalorganic chemical vapor deposition

LaAlO₃ (LAO) gate dielectric films were deposited on Si substrates by low-pressure metalorganic chemical vapor deposition. The interfacial structure and composition distribution were investigated by high-resolution transmission electron microscopy (HRTEM), X-ray photoelectron spectroscopy (XPS), secondary-ion mass spectroscopy (SIMS), and Auger-electron spectroscopy (AES). HRTEM confirms that there exists an interfacial layer between LAO and Si in most samples. AES, SIMS, and XPS analyses indicate that the interfacial layer is compositionally graded La–Al silicate and the Al element is severely deficient close to the Si surface. Electrical properties of LAO films were evaluated. No evident difference in electrical properties between samples with and without native SiO₂ layers was observed. The electrical properties are discussed in terms of LAO growth mechanisms, in relation to the interfacial structure. PACS 73.40.Qv; 81.15.Gh; 77.55.+f; 68.35.-p     

一个推广的Hardy-Hilbert型不等式及其逆式

本文引入单参数λ及应用Beta函数,给一个Hardy-Hilbert型不等式以具有最佳常数因子的推广,作为应用,给出了它的逆向形式．     

基于正弦灰度变换的X光图像增强

介绍了灰度变换法的几种形式 ,提出了一种正弦非线性变换法 ,对三幅数字X光医学图像进行了处理 ,获得了令人满意的对比度增强效果 ,证明该方法有效而实用     

Effects of Substrate Temperature on Helium Content and Microstructure of Nanocrystalline Titanium Films

Helium-charged nanocrystalline titanium films have been deposited by HeAr magnetron co-sputtering. The effects of substrate temperature on the helium content and microstructure of the nanocrystalline titanium films have been studied. The results indicate that helium atoms with a high concentration are evenly incorporated in the deposited titanium films. When the substrate temperature increases from 60℃ to 350℃ while the other deposition＇parameters are fixed, the helium content decreases gradually from 38.6 at.% to 9.2at.%, which proves that nanocrystalline Ti films have a great helium storage capacity. The 20 angle of the Bragg peak of （002） crystal planes of the He-charged Ti film shifts to a lower angle and that of （100） crystal plane is unchanged as compared with that of the pure Ti film, which indicates that the lattice parameter c increases and a keeps at the primitive value. The grain refining and helium damage result in the diffraction peak broadening.     

中物院远红外自由电子激光实验研究

中国工程物理研究院基于射频直线加速器技术的远红外自由电子激光(FIR-FEL)实验取得阶段性进展,于2005年3月24晚8时30分首次出光, 并多次重复. 中心波长115μm, 谱宽1%.介绍了实验系统的主要组成部分和主要实验结果.