Polarization dynamics of intracavity frequency-doubled Nd:YAG laser

Experimental study of low-frequency dynamics of an intracavity frequency-doubled Nd:YAG laser demonstrates the influence of the interaction of orthogonally polarized modes, participating in frequency doubling (type II phase matching), on the stability of the laser output. At a sufficiently low pump rate and low conversion efficiency, the laser shows stable operation with a low noise level at the frequencies of relaxation oscillations. At a high pump power and/or a high conversion efficiency, the laser emission becomes unstable as a result of Hopf bifurcation at the frequencies of relaxation oscillations that are responsible for the anti-phase polarization dynamics of the laser.     

Pyren und Pyrenderivate

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Die Bestimmung des Harzes in Seifen und Fetten

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Two-photon interference spectra at the sum-frequency generation of a bichromatic field interacting with a three-level atom

We have calculated the spectral functions for a number of induced excitations near the sum-frequency generation of a bichromatic field interacting with a three-level atom in the cascade configuration. Although the two-photon spontaneous emission is electric dipole forbidden, there are induced peaks whose subnatural line widths and spectral heights depend on the intensities of the bichromatic field. At low intensities of both laser fields, the maximum heights of the induced peaks take positive, zero, and negative values, indicating that the physical processes of absorption (attenuation), dark resonance (nonabsorbing state), and stimulated emission (amplification) are likely to occur at the sum-frequency generation of the two laser fields, respectively. The derived results are graphically presented and discussed. PACS 32.80.-t; 42.50.Hz     

A fast method to measure the thickness of removed layer from etching of SSNTD based on EDXRF

Solid state nuclear track detectors are commonly used for measurements of concentrations of radon gas and/or radon progeny. All these measurements depend critically on the thickness of the removed layer during etching. However, the thickness of removed layer calculated using the etching period does not necessarily provide a sufficiently accurate measure of the thickness. For example, the bulk etch rate depends on the strength of stirring during etching for the LR 115 detector. We propose here to measure the thickness of the removed layer by using energy-dispersive X-ray fluorescence spectrometry. In the present work, a reference silver nitrate pellet is placed beneath the LR 115 detector, and the fluorescence X-ray intensity for silver is then measured. We have found a linear relationship between the X-ray intensity and the thickness of the removed layer for LR 115 detector. This provides a fast method to measure the thickness of removed layer from etching of LR 115 detector. However, this method was found to be inapplicable for the CR-39 detector. Therefore, alternative methods have yet to be explored for the CR-39 detector.     

Volumetric and infrared measurements on amorphous ice structure

We have simultaneously used adsorption isotherm volumetry and Fourier transform infrared spectroscopy in order to take the investigations on amorphous ice structure a step further, especially concerning porosity and annealing-induced modifications. We have studied surface reorganization during annealing and found that the number of surface sites decreases before crystallization, their relative ratios being different for amorphous and crystalline ice. We also present results confirming that ice can have a large specific surface area and nevertheless be non-microporous.     

Ueber die Anwendung des Spectrum-Mikroskops in der Technik

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Die Vertheilung verschiedener Gifte im Organismus vergifteter Menschen

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