基于ARM架构的图形水幕系统

传统的以水为装饰的方法形式比较单一,缺乏创新性的现状,因此提出了一种基于ARM架构,结合了人体传感、无线传输等功能的数字图形水幕系统,能够精确控制电磁水阀开/闭合,实现了以水为媒介的图形、文字的展示;同时,在系统中开发了一种自由落体图像补偿算法,创建了图像补偿表,通过对原始图像的补偿可在系统人眼感兴趣的区域很好展示所需的图形及文字;在实验中可看出系统在1.26 m×1.26 m的显示区域内对64×64像素的图形进行补偿时达到了较好的效果;该系统综合考虑了性能、成本等因素,具有很强的创新性和实用价值。     

Improving Cu2ZnSnS4 (CZTS) solar cell performance by an ultrathin ZnO intermediate layer between CZTS absorber and Mo back contact

The effects of an ultrathin ZnO intermediate layer deposited at the CZTS/Mo interface on CZTS solar cell performance have been investigated in this work. The ZnO layer inhibits the generation of MoS₂ layer and the formation of voids in the CZTS absorber. Consequently, the incorporation of this layer reduces the series resistance and increases the shunt resistance, which boosts photovoltaic conversion efficiency from 1.13% to 4.3%. (© 2014 WILEY‐VCH Verlag GmbH &Co. KGaA, Weinheim)     

On the observation of electron–hole liquid luminescence under low excitation in Al2O3‐passivated c‐Si wafers

We report on low‐temperature photoluminescence (PL) from aluminum oxide (Al₂O₃)‐passivated c‐Si wafers, which surprisingly exhibits clear signature of the formation of the so‐called electron–hole liquid (EHL), despite the use of excitation powers for which the condensed phase is not usually observed in bulk Si. The elevated incident photon densities achieved with our micro‐PL setup together with the relatively long exciton lifetimes associated with a good quality, indirect band‐gap semiconductor such as our float‐zone c‐Si, are considered the key aspects promoting photogenerated carrier densities above threshold. Interestingly, we observe a good correlation between the intensity of the EHL feature in PL spectra and the passivation performance of the Al₂O₃ layer annealed at different temperatures. The change in the extension of the sub‐surface space‐charge region that results from the balance between the induced fixed charge in the Al₂O₃ and the defect states at the alumina/Si interface is at the origin of the observed correlation. (© 2014 WILEY‐VCH Verlag GmbH &Co. KGaA, Weinheim)     

High mobility In2O3:H transparent conductive oxides prepared by atomic layer deposition and solid phase crystallization

The preparation of high‐quality In₂O₃:H, as transparent conductive oxide (TCO), is demonstrated at low temperatures. Amorphous In₂O₃:H films were deposited by atomic layer deposition at 100 °C, after which they underwent solid phase crystallization by a short anneal at 200 °C. TEM analysis has shown that this approach can yield films with a lateral grain size of a few hundred nm, resulting in electron mobility values as high as 138 cm²/V s at a device‐relevant carrier density of 1.8 × 10²⁰ cm^–3. Due to the extremely high electron mobility, the crystallized films simultaneously exhibit a very low resistivity (0.27 mΩ cm) and a negligible free carrier absorption. In conjunction with the low temperature processing, this renders these films ideal candidates for front TCO layers in for example silicon heterojunction solar cells and other sensitive optoelectronic applications. (© 2014 WILEY‐VCH Verlag GmbH &Co. KGaA, Weinheim)     

X‐ray photoelectron spectroscopy process optimization for characterization of trace contamination elements for extreme ultraviolet resist outgassing study

X‐ray photoelectron spectroscopy (XPS) is used for elemental identification and quantification in a number of fields, and the optimization of XPS performance can help in making better use of the limited XPS tool availability. In the field of extreme ultraviolet (EUV) lithography, one of the requirements is having a clean vacuum environment to minimize contamination of the EUV optics. EUV resist outgassing is viewed as one of the main issues that could affect the vacuum environment. There is a program underway to measure the relative contamination rates from different resists following the ASML (provider of lithography systems) approved protocols for witness plate testing. One of the key steps is the XPS measurement of residue on the optics after cleaning. The role of XPS in quantification of species that adhere to the ruthenium‐coated silicon witness plate sample is discussed. The various XPS tool parameters like the pass energy and source setting were optimized for our application of witness plate analysis. The statistics of our XPS tool were studied, and combined with the fundamental XPS equations, a simple mathematical model was developed to optimize the number of scans for the various elements of interest in our witness plate study. Using the optimized number of scans, the acquisition time to measure the contaminant elements to a precision better than 0.1 at.% was minimized. The model devised in the paper can be adapted to other XPS measurements requiring different levels of precision. Copyright © 2013 John Wiley & Sons, Ltd.     

Irradiated rare‐earth‐doped powellite single crystal probed by confocal Raman mapping and transmission electron microscopy

The irradiation‐induced damages and structure modifications of rare earths doped powellite single crystal have been precisely studied using optical and electron microscopy techniques, including optical interferometry, confocal micro‐Raman spectroscopy and transmission electron microscopy. The surface of powellite crystal pops out anisotropically after exposing under Ar ion beam, with a saturation swelling value of 2.0% along a‐axis and 1.3% along the c‐axis of powellite at high dose. Raman mapping on focused ion‐beam sections (5 × 3 µm²) perpendicular to the irradiated surface reveals that irradiation damage induces orientation‐dependent compressive stresses in powellite. However, no significant anisotropic effect has been found on the irradiation‐induced structural disorder in powellite. At low dose (0.012 dpa), the main irradiation‐induced defects created in powellite crystal are small defect clusters. By comparison, the dominant kinds of defects in high‐dose (5.0 dpa) sample are dislocations loops and networks. Copyright © 2014 John Wiley & Sons, Ltd.     

K_2S-activated carbons developed from coal and their methane adsorption behaviors

The main purpose of this work is to prepare various activated carbons by K2S activation of coal with size fractions of 60-80 meshes, and investigate the microporosity development and corresponding methane storage capacities. Raw coal is mixed with K2S powder, and then heated at 750 ℃-900 ℃ for 30 min-150 min in N2 atmosphere to produce the adsorbents. The texture and surface morphology are characterized by a N2 adsorption/desorption isotherm at 77 K and scanning electron microscopy （SEM）. The chemical properties of carbons are confirmed by ultimate analysis. The crystal structure and degree of graphitization are tested by X-ray diffraction and Raman spectra. The relationship between sulfur content and the specific surface area of the adsorbents is also determined. K2S activation is helps to bring about better development of pore texture. These adsorbents are microporous materials with textural parameters increasing in a range of specific surface area 72.27 m2/g-657.7 m2/g and micropore volume 0.035 cm3/g-0.334 cm3/g. The ability of activated carbons to adsorb methane is measured at 298 K and at pressures up to 5.0 MPa by a volumetric method. The Langmuir model fits the experimental data well. It is concluded that the high specific surface area and micropore volume of activated carbons do determine methane adsorption capacity. The adsorbents obtained at 800 ℃ for 90 min with K2S/raw coal mass ratios of 1.0 and 1.2 show the highest methane adsorption capacities amounting to 106.98 mg/g and 106.17 mg/g, respectively.     

太赫兹波在雾中的多重散射特性

太赫兹(THz)波作为微波和毫米波的延伸,它所提供的通信带宽和容量远大于毫米波。在随机介质中传播时,不但会发生时域和空域的形变,介质中的粒子还会对入射波发生散射,这些都会使得脉冲信号发生衰减。根据Mie理论与随机离散分布粒子的波传播与散射理论,计算了THz波信号入射下雾滴粒子的消光系数。结合雾滴粒子谱分布,得到了雾媒质的平均体系散射特性,采用蒙特卡罗法得到了平流雾对THz信号的多重散射特性,计算了THz波段信号对平流雾的透过率与反射率,分析了THz波段信号的前向、后向散射特性随散射角的分布。结果表明,低能见度大气环境中,雾对THz波产生的吸收和衰减不容忽视。相关研究结果对THz在大气传输、通信等方面的应用具有重要意义。     

Multichannel sampling theorem for bandpass signals in the linear canonical transform domain

The linear canonical transform (LCT) describes the effect of first-order quadratic phase optical system on a wave field. The classical multichannel sampling theorem for common bandlimited signals has been extended differently to bandlimited signals associated with LCT. However, a practical issue associated with the reconstruction of the original bandpass signal from multichannel samples in LCT domain still remains unresolved. The purpose of this paper is to introduce a practical multichannel sampling theorem for bandpass signals in LCT domain. The sampling expansion which is constructed by the ordinary convolution in the time domain can reduce the effect of spectral leakage and is easy to implement. The classical multichannel sampling theorem and the well-known sampling theorems for the LCT are shown to be special cases of it. Some potential applications of the multichannel sampling are also presented to show the advantage of the theory.     

红外双波段双层谐衍射光学系统设计

将谐衍射透镜应用在传统红外单波段佩茨瓦尔(Petzval)物镜上,设计得到工作波段处于3.4~4.2μm和8~11μm的红外双波段单层谐衍射光学系统。但单层谐衍射元件的衍射效率只在设计波长处衍射效率最高,随着波长相对设计中心波长向两侧偏离,主衍射级次的衍射效率逐渐下降。为提高含单层谐衍射元件光学系统的衍射效率,基于双层衍射元件衍射效率表达式研究了双层谐衍射元件的结构优化,给出了优化方法。设计出佩茨瓦尔型红外双波段双层谐衍射光学系统,其在3.4~4.2μm和8~11μm两个工作波段的衍射效率均达到90%以上,相比含有单层谐衍射面的光学系统衍射效率有了很大提升,提高了像面衬比度,完善了系统成像质量。