Force localization in contracting cell layers

Epithelial cell layers on soft elastic substrates or pillar arrays are commonly used as model systems for investigating the role of force in tissue growth, maintenance, and repair. Here we show analytically that the experimentally observed localization of traction forces to the periphery of the cell layers does not necessarily imply increased local cell activity, but follows naturally from the elastic problem of a finite-sized contractile layer coupled to an elastic foundation. For homogeneous contractility, the force localization is determined by one dimensionless parameter interpolating between linear and exponential force profiles for the extreme cases of very soft and very stiff substrates, respectively. If contractility is sufficiently increased at the periphery, outward directed displacements can occur at intermediate positions. We also show that anisotropic extracellular stiffness can lead to force localization in the stiffer direction, as observed experimentally.     

微穿孔吸声体随机入射吸声性能

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表面效应对γ-Fe2O3微粉饱和磁化强度的影响

我们制备了直径为80—700A的γ-Fe₂O₃微粉,测量了它的比饱和磁化强度σ_s和比表面积S_a,得出经验公式:σ_s(s=σ_s(∞)(1—aS_a)。假定微粉由两部分组成:第一部分是表面层,在磁场的作用下,它的磁矩只能转到与磁场成某个角度;第二部分是内部,它的磁矩可以转到磁场的方向。从这个简单的模型出发,上述的经验公式可以得到较好的解释。 关键词：     

Spectroscopic in situ diagnostics of boron nitride film growth in plasma-enhanced deposition

The development of in situ diagnostics of the most important species and reactions in the plasma and/or on the surface during thin-film growth is one of the current topics in plasma-enhanced vapor deposition. In situ thin film diagnostic methods which could be used in plasma processing are restricted due to the presence of electrons and ions. The advantages and disadvantages of different applicable methods will be discussed. The spectroscopic in situ control of boron nitride film growth is presented as an example of surface modification in low-temperature, low-pressure plasma processing. The growth of cubic and hexagonal boron nitride is observed by polarized infrared reflection spectroscopy in absorption and ellipsometric configurations as well as by single-wavelength ellipsometry in the visible spectral range. Modeling of the experimental results gives detailed information on growth conditions and internal stress of the films. Received: 8 August 2000 / Accepted: 12 December 2000 / Published online: 3 April 2001     

A Note on Symplectic Algorithm

We present the symplectic algorithm in the Lagrangian formalism for the Hamiltonian systems by virtue of the noncommutative differential calculus with respect to the discrete time and the Euler-Lagrange cohomological concepts. We also show that the trapezoidal integrator is symplectic in certain sense.``     

Coleman自同构群的投射极限

在这篇注记中,利用群的投射极限性质给出了有限可解群的Coleman自同构群的一个具体构造.作为应用,证明了二面体群的Coleman外自同构群或者是1或者是一个初等阿贝尔2-群.     

Reduktionsverfahren für Differenzengleichungen bei Randwertaufgaben II

Summary In a recent paper [11], two of the authors investigated a fast reduction method for solving difference equations which approximate certain boundary value problems for Poisson's equation. In this second paper, we prove the numerical stability of the reduction method, and also report on further developments of the method. For the general case, the provided bounds for the numerical errors behave roughly like the condition numberO(n ²) of the linear system; for more realistic model problems estimates of order less thanO(n) are obtained (n ^–1=h=mesh width). The number of operations required for the reduction method isO(n ² ), for the usual five-point difference formula, as well as for the common nine-point formula with discretization error of orderh ⁴.     

Über Untergruppen Endlicher Algebraischer Gruppen

Let k be a commutative ring, GG finite affine algebraic k-groups, and HH the dual Hopfalgebras of the affine algebras of G resp. G. The main results of this paper are: (I) If k is semilocal (e.g. k a field) there is an H-linear, HH-colinear, unitary, augmented isomorphism HHH H, where HH is the coalgebra belonging to G/G. (II) If the k-submodule of the fixelements of (HH)^* is isomorphic to k (e.g. k principal or semilocal), then HH is a Frobeniusextension of the second kind.     

Über die Multiplikatorensysteme zur Gruppe der ganzen Modulsubstitutionenn-ten Grades

Ohne Zusammenfassung