Investigation of organic impurities adsorbed on and incorporated into electroplated copper layers

At room temperature electroplated copper layers exhibit changes in resistivity, residual stress, and microstructure. This process, known as self-annealing, is intimately linked to the release of organic impurities, which stem from the incorporation of organic additives into the Cu layer in the course of the electroplating process. The behavior of these impurities during self-annealing, represented by the carbon content, could be detected by analytical radio frequency glow discharge optical emission spectrometry (GD-OES) and carrier gas hot extraction (CGHE). The precondition of a quantitative determination is a surface cleaning procedure to remove adsorbed organics from the copper surface. It was observed that at first almost all impurities have to leave the Cu metallization before an accelerated abnormal grain growth can start. The small amount of remaining organic species after self-annealing could be quantified by both examination techniques, GD-OES and CGHE.     

Ein Verfahren zur Trennung des Zinks von allen Metallen seiner Gruppe

Ohne Zusammenfassung     

Eine neue Reaction des Phenacetins

Ohne Zusammenfassung     

Die Kolloidchemie des Tabakmosaikvirus

Ohne Zusammenfassung übersetzt von H. Kauffmann (Leipzig).     

多媒体在二维动量实验中的应用

利用VisualBasic的多媒体功能和CCD摄像头以及气垫桌等组成的实验系统，演示了二维碰撞中的动量守恒．     

Flavour-changing Z decays

We compute neutral Higgs and Z⁰-boson couplings to quarks in a model with three quark-lepton families and one mirror family. Mixing between ordinary and mirrorquarks leads to flavour-changing couplings which are negligible for the known quarks. However, t-quark couplings are sizeable and the branching ratio for the decay can be as large as 10⁻⁴.     

Bulk and microprobe analysis for trace elements with synchrotron radiation

Blood serum samples were irradiated by monochromatic synchrotron radiation (15 keV) and by 2.4-MeV protons to compare their performance for the detection of trace elements by x-ray fluorescence (XRF) spectrometry. Absolute concentration assignment was based on the addition of an internal standard and on a method which uses the incoherent and coherent radiation as a flux monitor of the incoming beam. Preliminary experiments with a synchrotron XRF microprobe are reported.