退火处理对SnO2薄膜光致发光性质的影响

实验研究表明,SnO2薄膜经过退火处理后其光致发光谱有明显的变化。在氧和氮两种不同气氛中进行热处理,其变化也有差异。这种变化主要是由于SnO2膜中氧空位和自由载流于浓度变化所致。     

锥体棱镜的加工

本文简单地叙述了锥体棱镜两种加工工艺。重点介绍直接成型法加工中对角度误差~1″的控制。并提出了角度超差零件返修时的光胶方法。     

Direct ion beam deposition of polymeric styrene films and in situ characterization by electron spectroscopy

Polymeric styrene films with thicknesses ranging from about one nm up to a few m have been deposited by means of a direct ion beam deposition (IBD) technique. The deposition energy, which can be chosen independently of the parameters which govern the plasma conditions, has been varied between few eV and 1000 eV. The correlation between the deposition parameters and the resulting film properties in terms of the electronic structure is discussed. The in situ characterization by electron spectroscopy has proved to be a very useful characterization method and ultraviolet photoelectron spectroscopy in particular revealed an extremely high sensitivity to structural differences in the deposited films. The polymeric films have also been characterized by scanning electron microscopy and optical spectroscopy. These techniques have also served to compare films prepared by the direct IBD technique with films obtained by standard rf plasma polymerization (RFPP) in a tubular reactor. Significant differences have been found which are dependent on the deposition parameters; these are discussed in detail.Department of Chemical Engineering, Beijing Institute of Technology, P.O. Box 327 Beijing, 100081 Beijing, P.R. China     

Kantorovich-type inequalities and the measures of inefficiency of the glse

In this paper we introduce some Kantorovich inequalities for the Euclidean norm of a matrix, that is, the upper bounds to (X'B ^–1 X) ^–1 X'B ^–1 AB ^–1 X(X'B ^–1X)^–1 X' BX(X'AX) ^–1 X'CX² are given, where A²=trace (A'A). In terms of these inequalities the upper bounds to the three measures of inefficiency of the generalized least squares estimator (GLSE) in general Gauss-Markov models are also established.Project supported partially by the Third World Academy of Sciences under contract TWASRG 87-46 and by the National Natural Science Foundation.     

Probabilistic approach to the Dirichlet problem of second order elliptic PDE

In this paper we provide a probabilistic approach to the following Dirichlet Problem{(∑x~4(α~(ij) x~j) ∑b~ix~i ξ)u=0, iD u=g, on D,without assuming that the eigenvalues of the operator∑x~i(α~(ij)x~j) ∑b~ix~i ξwith Dirichlet boundary conditions are all strictly negative. The results of this paper generalizedthose of Ma.     

Asymptotic expansions andL ∞-error estimates for mixed finite element methods for second order elliptic problems

Summary Asymptotic expansions for mixed finite element approximations of the second order elliptic problem are derived and Richardson extrapolation can be applied to increase the accuracy of the approximations. A new procedure, which is called the error corrected method, is presented as a further application of the asymptotic error expansion for the first order BDM approximation of the scalar field. The key point in deriving the asymptotic expansions for the error is an establishment ofL ¹-error estimates for mixed finite element approximations for the regularized Green's functions. As another application of theL ¹-error estimates for the regularized Green's functions, we shall present maximum norm error estimates for mixed finite element methods for second order elliptic problems.