Analysis of the electrolyte diode. Electro-diffusion and chemical reaction within a hydrogel reactor

A reaction–diffusion system describing the electrolyte diode is investigated. This consists of a chemically crosslinked polyvinylalcohol (PVA) hydrogel cylinder in which a pH gradient is provided by having an acid and a base maintained at constant concentrations in reservoirs at each end of the one-dimensional reactor. A potential difference of a given strength is also applied across the gel cylinder. Previous experimental studies of the current–voltage characteristics (CVC) have shown two distinct cases, depending on whether a positive or negative potential difference was applied. The slopes of the linear current–voltage response curve are substantially different in the two cases, that in the 'forward' case being typically several orders of magnitude greater than that in the 'backward' case. Thus the system behaves like a semiconductor diode. The stationary concentration distribution for the different ions is described by a system of reaction–diffusion equations involving migration caused by the electric field. An approximate solution of these equations, using a simplified model, is presented and compared with results obtained by solving the full system numerically. The concentration profiles obtained from the numerical solution confirm the validity of the simplified model.     

Characterization of silicon wafers through deposition of self-assembled monolayers

AFM imaging of the adsorption of self-assembled octadecylsiloxane (ODS) monolayers has been utilized for probing surface properties of silicon wafers. It has been found that both growth rate of the organic films and island size of sub-monolayer films are influenced by the doping level of the wafers as well as by the surface finishing step during wafer production. Generally, higher doping levels led to lower adsorption rates and smaller islands. Variation of the sample pretreatment used for surface finishing of similarly doped wafers led only to significant changes of the island size, but not of the surface coverage. The results presented open up a valuable perspective for characterizing the surface homogeneity of silicon wafers which is an important parameter for monitoring-wafers in semiconductor industry. Received: 26 June 2000 / Revised: 26 July 2000 / Accepted: 1 August 2000     

Brazilian <Emphasis Type="Italic">Dioscoreaceas</Emphasis> starches

Determination of the characteristics of native starches is crucial in order to select their best application in various industrial fields. Thus, two different types of non-traditional native starches from the Dioscoreaceas species (Dioscorea sp. and Dioscorea piperifolia Humb. var. Wild) were studied regarding their thermal, structural and rheological properties. The results were contrasted with traditional commercial starch sources (potato, cassava and corn). From the thermogravimetric results (TG/DTG), D. piperifolia starch obtained the highest thermal stability of the samples, except for potato starch. Furthermore, using differential scanning calorimetry and viscoamylograph profiles (RVA), it was found that the Dioscoreaceas starches presented a higher onset (T _o) temperature and susceptibility to retrogradation. They also showed lower values in relation to relative crystallinity, which was calculated from their X-ray patterns and tendency to white (L*) colour. The shapes of the Discoreaceas starch granules were determined using electron microscopy; it was found that as the potato starch the Dioscoreaceas starches showed a wide range of particle size.     

Tandem mass spectrometry of aminated fullerene derivatives

The products of the reaction between fullerenes (C₆₀/C₇₀) and dimethylamine were investigated by fast atom bombardment (FAB) mass spectrometry and tandem mass spectrometry (MS/MS). The FAB mass spectrum shows peaks corresponding to the addition of up to eight dimethylamine species, exclusively to C₇₀. MS/MS reveals an unusual fragmentation pattern. The mass spectrum of the reaction products, together with a number of tandem mass spectra, are shown.     

Direct electron transfer from modified glassy carbon electrodes carrying covalently immobilised mediators to a dissolved viologen accepting pyridine nucleotide oxidoreductase and dihydrolipoamide dehydrogenase

N,N′-Diaminopropyl-4,4′-bipyridinium dication (DAPV) and cobalt diaminosarcophagine (Co—diamsar) were covalently bound on functionalised glassy carbon electrodes. The electron transfer from the modified electrodes to dissolved dihydrolipoamide dehydrogenase (Lip-DH) or viologen accepting pyridine nucleotide oxidoreductase (VAPOR) was tested by NADH formation in potentiostatically controlled electrochemical cells. The NADH formed was used to reduce pyruvate to -lactate catalysed by -lactate dehydrogenase ( -LDH). The reaction kinetics between the modified electrodes and the dissolved enzymes have been examined.     

Quantitative depth profiling in glow discharge spectroscopies – A new deconvolution technique to separate effects of an uneven erosion crater shape

An algorithm is presented as a concept for the quantification in direct current and radiofrequency glow discharge (GD) modes for GD optical emission spectroscopy. The algorithm is divided into excitation and sputtering part and thus it is possible to distinguish between the different excitation processes and to consider equivalent sputtering crater formations in both modes. Intensity-time profiles are affected corresponding to the method by several effects. One important effect is that sputtering occurs at a single time in different depths because of curved crater bottoms, this is usually called crater effect. The main purpose is to introduce an iterative deconvolution technique which for the quantification numerically takes into account the curved sputtering crater bottom. Input data for the deconvolution technique are the calibrated mass-time profile, the partial densities of the sample constituents and the measured final shape of the sputtering crater. Using a relatively simple model for ion sputtering the deconvolution technique improves iteratively the calculated layer structure by means of information on crater formation. The mathematical handling is illustrated for the quantification of a depth profile of a multilayer sample of ten 100 nm layers. The resulting concentration-depth profile reflects excellently the real elemental distribution of the multilayer system.