Depth profile analysis of polyimide film treated by potassium hydroxide

The structural change in the depth direction of a polyimide (UPILEX‐S) film treated in alkaline solution, which was a representative surface treatment used to form a seed layer for plating and to improve the adhesive strength, was analyzed by means of micro Fourier transform infrared attenuated total reflection (FTIR‐ATR) line analysis with gradient shaving preparation. The polyimide film was treated with KOH. The imide ring opened through the alkaline treatment, and the amide structure and carboxylic acid salt were formed. The attainment depth of this structural change was almost proportional to the treatment time, and it reached about 8 μm after a 30‐min treatment. The degree of structural change through the alkaline treatment was almost constant after it reached a considerably degraded stage, and the chemically changed region penetrated into the inner part of the film from the surface. An intermediate layer before the final degraded stage appeared in the treated layer, and its thickness increased with the treatment time. The region that was changed chemically by the alkaline treatment progressed to the inner part simultaneously and continuously as the treatment time increased. The combined use of gradient shaving preparation and micro FTIR‐ATR line analysis was found to be extremely effective for the depth profiling of organic materials. © 2003 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 41: 2071–2078, 2003     

Theory of Linear Dissipative Scattering Systems with Discrete Time and with Space States of the Class π k

An arbitrary operator-valued function from the generalized Shur class is realized as the transfer function of a minimal optimal and minimal *-optimal dissipative scattering system with the Pontryagin state space. These results generalize Arov's results for the case of the Hilbert state space. Bibliography: 11 titles.     

Degradation of ZnS:Cu,Al,Au phosphor powder in different gas mixtures

The ZnS:Cu,Al,Au (P22G) phosphor powder was bombarded by an electron beam in an O₂ ambient, Ar ambient and other mixture of gases. These gases consisted of mixtures of O₂ and CO_x, and O₂, CO_x and Ar gas. Auger electron spectroscopy (AES) was used to monitor changes in the surface composition of the P22G phosphor during electron bombardment. When the P22G phosphor powder was exposed to the electron beam in a water-rich O₂ ambient, a chemically limited ZnO layer was formed on the surface. The electron beam degradation of the P22G phosphor powder was also performed in a dry O₂ ambient and a layer of ZnSO₄ was formed on the surface. The ZnSO₄ formation decayed exponentially with time and it is postulated that this was due to the diffusion of the charge reactants through the ZnSO₄ film to the reaction interfaces. The P22G phosphor exposed to the electron beam in an Ar ambient and to the other gas mixtures degraded at a lower rate than in the case of the O₂ ambient. This suggests that Ar and CO_x may suppress the degradation of the P22G phosphor powder.     

Cycloaddition of Thiourea to Tri(1-propenyl)amine

Russian Journal of General Chemistry -     

Reliability Estimation of Classification Algorithms. I. Introduction to the Problem. Point Frequency Estimates

The study deals with estimating the reliability of classification algorithms. The present article (the first of three) examines the statistical methods used for point estimation of the reliability of classifiers in the frequency approach. The estimation results are applicable to the small-sample case, which is of considerable importance in practice.     

An Integral Formula for the Complex Intersection Number of Real Cycles in a Real Algebraic Variety with Topologically Rational Singularities

A formula of type indicated in the title is presented and discussed. Bibliography: 7 titles.