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By the use ofVa?i?ek's polarimetric method for a single layer differences from the theoretical curves have been observed, which can not be theoretically explained. These differences can be increased experimentically by the deposition of double films. The author suggests four rules, by which the inhomogenity of the films can be calculated from the measured curves. It is possible to determine the thickness and refractive index quantitatively and the index gradient approximately. For the same salt all the four possible types of inhomogenity can be produced. With the rules the differences in the results can be eliminated. The fifth rule limits the applicability of the four other rules.  相似文献   
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The author has modifiedVa?i?ek's polarimetric theory to a graphic method for determination of optical constants of thick homogeneous films on glass carriers. The method is verified for single layers deposited by heating salts. The kind of salt determines the gradient of the refractive index. This gradient and the state of the surface of the glass are responsible for deviations from the theoretical curves. A suitable method has been found for determining the refractive index and the thickness of the deposited film. In a modified form the method can also be used for inhomogeneous films. Sometimes it is possible to determine even a change in thickness less than 10 Å during the deposition of the film. The thickness can be calculated accurately only by measuring at three different light-frequencies, because the curves are periodical. The values for the different light-frequencies agree well with each other differing only by about 5%. The agreement is much better for films thicker than 10000 Å. The thickness of the films as obtained by applying this method is almost identical with the one given by an interference microscope.  相似文献   
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Va?i?ek's universal method for determining the optical constants of nonabsorbing, homogeneous layers of any thickness on glass has been limited to the special case of ligth incidence under the polarizing angle of the glass carrier. This enables one to base the measurements on a reference glass carrier of well known refractive index, and simplifies the relationship of the variables. After calculating all parameters and computing some normalizing curves for this particular reference carrier, it is possible, to evaluate graphically all polarimetric measurements for any kind of glass carrier or wavelength and for all data of the layers as thickness or refractive index. The feasibility of the normalizing process has been proved.  相似文献   
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